Free space segment tester (FSST)

1. An apparatus for antenna testing, comprising:

a frame having a platform to support a thin film transistor (TFT) segment of a flat panel antenna while microwave energy is transmitted at and through the TFT segment during testing;

an analyzer to measure a characteristic of the TFT segment associated with the microwave energy transmitted through the TFT segment or transmitted at the TFT segment; and

a computer coupled to the controller and analyzer to calibrate the TFT segment based on the characteristic measured by the analyzer.

2. The apparatus of claim 1 , wherein the analyzer is to measure a characteristic including a microwave frequency response for the TFT segment at a first or second horn antenna.

3. The apparatus of claim 2 , wherein the analyzer is to measure a microwave frequency response at the first horn antenna or the second horn antenna as a function of a command signal stimuli or without a command signal stimuli from the controller.

4. The apparatus of claim 3 , wherein the analyzer is to measure a transmission response at the second horn antenna and a reflection response at the first horn antenna for the TFT segment.

5. The apparatus of claim 4 , further comprising a controller, coupled to the TFT segment, to provide at least one stimulus or condition to the TFT segment; and wherein the computer is operable to calibrate at least one of the microwave frequency response, transmission response, or reflection response for the TFT segment based on one or more stimuli.

6. The apparatus of claim 5 , wherein the computer is to characterize the microwave frequency response, transmission response, or reflection response characteristics for the TFT segment.

7. The apparatus of claim 1 , wherein the condition includes an environmental condition.

8. The apparatus of claim 1 , wherein the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable.

9. A method for antenna testing, comprising:

applying microwave energy to a thin film transistor (TFT) segment of a flat panel antenna;

measuring a characteristic of the TFT segment associated with the microwave energy transmitted through the TFT segment or transmitted at the TFT segment; and

calibrating the TFT segment based on the measured characteristic.

10. The method of claim 9 , further comprising measuring transmission or reflection coefficients for the TFT segment.

11. The method of claim 10 , wherein the transmission or reflection coefficients are measured as a function of microwave energy frequency or a command signal to the TFT segment.

12. The method of claim 11 , further comprising calibrating the transmission or reflection coefficients.

13. The method of claim 11 , further comprising varying the command signal to the TFT segment and measuring the transmitted or reflected microwave energy after varying the command signal.

14. The method of claim 10 , wherein the coefficients include phase and amplitude values.

15. The method of claim 9 , further comprising measuring the microwave energy frequency response of the TFT segment using the transmitted or reflected microwave energy.

16. The method of claim 15 , further comprising detecting if the TFT segment is acceptable based on the measured microwave energy response of the TFT segment.

17. The method of claim 16 , using the TFT segment if determined to be acceptable for assembly into a flat panel antennal.

18. The method of claim 15 , further comprising calibrating the measured microwave energy frequency response.