Additive manufacturing based multi-layer fabrication/repair
A method of additively manufacturing includes generating a thermal model driven scan map that identifies an equiaxed cap region, a single crystal (SX) region, and a columnar to equiaxed transition (CET) region; and forming an active melt pool with respect to the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of the equiaxed transition (CET) region.
1. A method of additively manufacturing, comprising:
generating a thermal model driven scan map;
maintaining an active melt pool of an active melt pool scan pattern with respect to the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of a columnar to equiaxed transition (CET) region;
restricting a scan rotation to zero and unidirectional movement of the active melt pool scan pattern to assure columnar single crystal (SX) growth;
utilizing the thermal model driven scan map to model residual stress to simulate and prevent residual stress and a propensity of hot cracking; and
utilizing the thermal model driven scan map to define a morphology, wherein the morphology includes a directionally solidified (DS) microstructure; wherein the thermal model driven scan map identifies the columnar to equiaxed transition (CET) region.
2. The method as recited in claim 1 , further comprising initiating formation of the active melt pool in a cast single crystal (SX) baseplate.
3. The method as recited in claim 1 , further comprising maintaining the active melt pool of the active melt pool scan pattern with a lesser power than a conventional melt pool of a conventional scan pattern.
4. The method as recited in claim 3 , further comprising arranging the active melt pool scan pattern with a closer line spacing and higher velocity than the conventional scan pattern.
5. A method of additively manufacturing, comprising:
locating a cast single crystal (SX) baseplate in an additively manufacturing machine;
initiating formation of an active melt pool in the cast single crystal (SX) baseplate via an active melt pool scan pattern;
generating a thermal model driven scan map that identifies an equiaxed cap region, a single crystal (SX) region, and a columnar to equiaxed transition (CET) region;
maintaining the active melt pool with the active melt pool scan pattern in accords with the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of a columnar to equiaxed transition (CET) region;
restricting a scan rotation to zero and unidirectional movement of the active melt pool scan pattern to assure columnar single crystal (SX) growth;
utilizing the thermal model driven scan map to model residual stress to simulate and prevent residual stress and a propensity of hot cracking; and
utilizing the thermal model driven scan map to define a morphology, wherein the morphology includes a directionally solidified (DS) microstructure.
6. The method as recited in claim 5 , further comprising maintaining the active melt pool of the active melt pool scan pattern with a lesser power than a conventional melt pool of a conventional scan pattern.
7. The method as recited in claim 6 , further comprising arranging the active melt pool scan pattern with a closer line spacing and higher velocity than the conventional scan pattern.