Method of processing calibration data in 3D laser scanner systems

1. A method, comprising:

determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial reference scan optic actuation corrections, stored in a memory, associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern;

determining, with a processor, a set of scan optic actuation rates based on the set of initial reference scan optic actuation corrections; and

updating the set of initial reference scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections, stored in the memory, that is associated with a reduction of at least a portion of the set of pattern position errors;

wherein the scan optic includes a plurality of galvanometer scan mirrors and the scan optic actuation corrections correspond to respective mirror-rotation angles that direct a laser processing beam to respective X coordinate and Y coordinate in the laser processing field of the laser system.

2. The method of claim 1 , wherein the set of scan optic actuation rates corresponds to a derivative of a surface function that describes the set of initial reference scan optic actuation corrections, and the updating of the set of initial reference scan optic actuation corrections includes evaluating the surface function derivative at a plurality of positions in the laser processing field and multiplying the respective surface function derivative values by the respective pattern position errors to define respective products and modifying the respective initial reference scan optic actuation corrections with the respective products.

3. The method of claim 1 , further comprising curve fitting the set of pattern position errors to a first function that characterizes a scan response of the laser system that includes mechanical tolerances and manufacturing errors at a resolution of the set of measured pattern positions.

4. The method of claim 1 , further comprising producing the calibration pattern based on the initial reference scan optic actuation corrections.

5. The method of claim 1 , further comprising measuring the calibration pattern so as to determine the set of measured pattern positions.

6. The method of claim 1 , wherein the set of initial reference scan optic actuation corrections corresponds to an analytical system model that includes laser scanning system dynamics of the scan optic.

7. The method of claim 1 , wherein the set of initial reference scan optic actuation corrections corresponds to a set of scan optic corrections obtained based on a previous calibration that determined a prior set of pattern position errors and a prior set of scan optic actuation rates.

8. The method of claim 1 , wherein the scan optic actuation corrections correspond to a z-axis optic translation position.

9. The method of claim 3 , further comprising curve fitting the set of initial reference scan optic actuation corrections to a differentiable second function.

10. The method of claim 5 , wherein the measuring is performed with a coordinate measuring machine.

11. The method of claim 9 , wherein the first function is a polynomial function of order two or greater and the second function is a polynomial function of order two or greater.

12. The method of claim 11 , wherein the first function is of order six or greater and the second function is of order four or greater.

13. An apparatus, comprising:

a processor; and

a memory having stored computer executable instructions which, when executed by the processor, cause the apparatus to:

determine a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial reference scan optic actuation corrections associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern;

determine a set of scan optic actuation rates based on the set of initial reference scan optic actuation corrections; and

update the set of initial reference scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections that is associated with a reduction of at least a portion of the set of pattern position errors;

wherein the scan optic includes a plurality of galvanometer scan mirrors and the scan optic actuation corrections correspond to respective mirror-rotation angles that direct a laser processing beam to respective X coordinate and Y coordinate in the laser processing field of the laser system.

14. The apparatus of claim 13 , wherein the set of scan optic actuation rates corresponds to a derivative of a surface function that describes the set of initial reference scan optic actuation corrections, and the updating of the set of initial reference scan optic actuation corrections includes evaluating the surface function derivative at a plurality of positions in the laser processing field and multiplying the respective surface function derivative values by the respective pattern position errors to define respective products and modifying the respective initial reference scan optic actuation corrections with the respective products.

15. The apparatus of claim 13 , wherein the memory has stored computer executable instructions that cause the apparatus to curve fit the set of pattern position errors to a first function that characterizes a scan response of the laser system that includes mechanical tolerances and manufacturing errors at a resolution of the set of measured pattern positions.

16. The apparatus of claim 13 , further comprising the laser system.

17. The apparatus of claim 15 , wherein the memory has stored computer executable instructions that cause the apparatus to curve fit the set of initial reference scan optic actuation corrections to a differentiable second function.

18. The apparatus of claim 17 , wherein the first function is a polynomial function of order two or greater and the second function is a polynomial function of order two or greater.

19. The apparatus of claim 18 , wherein the first function is of order six or greater and the second function is of order four or greater.

20. A method, comprising:

determining a set of pattern position errors between (i) a set of expected pattern positions of a calibration pattern on a laser target situated in a laser processing field of a laser system and produced based on a set of initial reference scan optic actuation corrections, stored in a memory, associated with a scan optic of the laser system and (ii) a set of measured pattern positions of the calibration pattern;

curve fitting the set of pattern position errors to a first function that characterizes a scan response of the laser system that includes mechanical tolerances and manufacturing errors at a resolution of the set of measured pattern positions and curve fitting the set of initial reference scan optic actuation corrections to a differentiable second function, wherein the first function is a polynomial function of order two or greater and the second function is a polynomial function of order two or greater;

determining, with a processor, a set of scan optic actuation rates based on the set of initial reference scan optic actuation corrections; and

updating the set of initial reference scan optic actuation corrections based on the set of scan optic actuation rates and the set of pattern position errors so as to form a set of updated scan optic actuation corrections, stored in the memory, that is associated with a reduction of at least a portion of the set of pattern position errors.