Pixel and imaging array with reduced dark current adapted to low light imaging

1. An apparatus comprising a pixel sensor comprising:

a photodiode;

a floating diffusion node;

a transfer gate connecting said photodiode to said floating diffusion node in response to a transfer signal;

a reset circuit adapted to apply either a first potential or a second potential to said floating diffusion node, said second potential being less than said first potential; and

a controller configured to cause said reset circuit to apply said first potential to said floating diffusion node while said transfer gate is conducting prior to a start of an accumulation phase, said accumulation phase being characterized by an end of said accumulation phase, and then to apply said second potential to said floating diffusion node after said transfer gate is rendered non-conducting, said floating diffusion node being maintained at a potential less than or equal to said second potential until said end of said accumulation phase wherein said reset circuit comprises a reset gate connecting said floating diffusion node to a reset conductor and a switching circuit that applies either said first potential or said second potential to said reset conductor.

2. The apparatus of claim 1 wherein said second potential is applied to said floating diffusion node at said start of said accumulation phase.

3. The apparatus of claim 1 wherein said accumulation phase is characterized by a duration equal to a difference in time between said start and said end of said accumulation phase and wherein said second potential is applied to said floating diffusion node at a time between said beginning of said accumulation phase and 20 percent of said duration.

4. An imaging array comprising a plurality of rows and columns of pixel sensors, each row of pixels sensors comprises a row reset line, and each column of pixel sensors comprising a bit line that is shared by each pixel sensor in that column;

a plurality of row reset voltage circuits, each row reset voltage circuit being connected to a corresponding one of said row reset lines, said row reset voltage circuit applying either a first potential or a second potential to said row reset line;

a controller that controls said row reset voltage circuits,

wherein at least one of said pixel sensors comprises:

a photodiode;

a floating diffusion node;

a transfer gate connecting said photodiode to said floating diffusion node in response to a transfer signal;

a reset circuit adapted to apply either said first potential or said second potential to said floating diffusion node, said second potential being less than said first potential; and

a reset gate connecting said reset line to said floating diffusion node,

and wherein

said controller is configured to cause said reset circuit to apply said first potential to said floating diffusion node while said transfer gate is conducting prior to a start of an accumulation phase, said accumulation phase being characterized by an end of said accumulation phase, and then to apply said second potential to said floating diffusion node after said transfer gate is rendered non-conducting, said floating diffusion node being maintained at a potential less than or equal to said second potential until said end of said accumulation phase, and said reset circuit comprises a reset gate connecting said floating diffusion node to a reset conductor and a switching circuit that applies either said first potential or said second potential to said reset conductor.

5. The imaging array of claim 4 wherein said second potential is applied to said floating diffusion node at said start of said accumulation phase.

6. The imaging array of claim 4 wherein said accumulation phase is characterized by a duration equal to a difference in time between said start and said end of said accumulation phase, and wherein said second potential is applied to said floating diffusion node at a time between said start of said accumulation phase and 20 percent of said duration.

7. A method for operating an imaging array comprising a plurality of pixel sensors, at least of one of said pixel sensors comprising:

a photodiode;

a floating diffusion node;

a reset gate connecting said floating diffusion node to a reset conductor and a switching circuit that applies either a first potential or a second potential to said reset conductor, said first potential being greater than said second potential; and

a transfer gate connecting said photodiode to said floating diffusion node in response to a transfer signal, said method comprising:

applying said first potential to said floating diffusion node prior to a start of an accumulation phase, said accumulation phase being characterized by an end of said accumulation phase, by placing said reset gate in a conducting state and causing said switching circuit to apply said first potential to said reset conductor and then applying said second potential to said floating diffusion node after said start of said accumulation phase by placing said reset gate in a conducting state and causing said switching circuit to apply said second potential to said reset conductor and maintaining said diffusion node at a potential less than or equal to said second potential until said end of said accumulation phase.

8. The method of claim 7 wherein said second potential is applied to said floating diffusion node at said start of said accumulation phase.