IP Library Granted Patent US 11,515,291
Granted Patent B2
US 11,515,291 · App. 16/397,202 · Granted Nov 29, 2022

Integrated voltage regulator and passive components

Inventors: Javier A. Delacruz (San Jose, CA); Don Draper (San Jose, CA); Belgacem Haba (Saratoga, CA); Ilyas Mohammed (Santa Clara, CA)
Assignee: Adeia Semiconductor Inc.
H01L25/0657H01L23/552H01L24/08H01L23/5227H01L2224/08145H01L2224/32145H01L2225/06524H01L2225/06537H01L2225/06586H01L2924/1427H01L2924/1432H01L2924/3025
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Quick Facts
Patent No.
US 11,515,291
App. No.
16/397,202
Granted
Nov 29, 2022
Kind
B2
Abstract

It is highly desirable in electronic systems to conserve space on printed circuit boards (PCB). This disclosure describes voltage regulation in electronic systems, and more specifically to integrating voltage regulators and associated passive components into semiconductor packages with at least a portion of the circuits whose voltage(s) they are regulating.

Claims (74)

1. A semiconductor package, comprising:

(A) a package substrate comprising:

(i) a first side, and

(ii) a second side opposite the first side;

(B) a first semiconductor die comprising:

(i) a first side coupled to the second side of the package substrate, and

(ii) a second side opposite the first side and comprising a first bonding layer;

(C) a second semiconductor die comprising:

(i) a first side comprising a second bonding layer coupled to the second side of the first semiconductor die, and

(ii) a second side opposite the first side;

(D) a voltage regulator circuit comprising at least one active component; and

(E) a first passive component electrically coupled to the voltage regulator circuit, the first passive component selected from a group consisting of: a capacitor, an inductor, a resistor, a fuse, and an antifuse, the first passive component comprising:

(i) a first portion integrated into the first semiconductor die, and

(ii) a second portion integrated into the second semiconductor die, wherein:

the first portion and the second portion are coupled together to complete the first passive component when the second side of the first semiconductor die is coupled to the first side of the second semiconductor die.

2. The semiconductor package of claim 1 , wherein a hybrid direct bonding technology is used to couple the second side of the first semiconductor die to the first side of the second semiconductor die.

3. The semiconductor package of claim 2 , wherein the voltage regulator circuit and the first passive component comprise a switching power supply.

4. The semiconductor package of claim 2 , wherein the first passive component comprises a capacitor, the capacitor further comprising:

(i) a first conductive plate adjacent to the first bonding layer,

(ii) a second conductive plate adjacent to the second bonding layer, and

(iii) an insulator layer coupled between the first conductive plate and the second conductive plate, wherein:

the insulator layer comprises the first bonding layer and the second bonding layer.

5. The semiconductor package of claim 4 , wherein:

(i) a thickness of the first bonding layer is in the range from 0.1 micrometers to 5.0 micrometers, and

(ii) a thickness of the second bonding layer is in the range from 0.1 micrometers to 5.0 micrometers.

6. The semiconductor package of claim 5 , wherein the thickness of the first layer of bonding insulator is in the range from 0.3 micrometers to 2.0 micrometers.

7. The semiconductor package of claim 5 , wherein the thickness of the second layer of bonding insulator is in the range from 0.3 micrometers to 2.0 micrometers.

8. The semiconductor package of claim 4 , further comprising a second passive component located between the first passive component and the first side of the first semiconductor die, wherein a component type of the second passive component is selected from a group comprising: a capacitor, an inductor, and a resistor.

9. The semiconductor package of claim 4 , further comprising a second passive component located between the first passive component and the second side of the second semiconductor die, wherein a component type of the second passive component is selected from a group comprising: a capacitor, an inductor, and a resistor.

10. The semiconductor package of claim 4 , wherein:

(i) a thickness of the first bonding layer is in the range from 0.3 micrometers to 2.0 micrometers, and

(ii) a thickness of the second bonding layer is in the range from 0.3 micrometers to 2.0 micrometers.

11. The semiconductor package of claim 2 , wherein:

(i) the voltage regulator circuit and the first passive component comprise a switching power supply, and

(ii) the first passive component comprises an inductor.

12. The semiconductor package of claim 11 , further comprising:

(F) a data processing circuit; and

(G) a conductive plate located between the inductor and the data processing circuit and configured to function as an electromagnetic shield between the data processing circuit and the inductor.

13. The semiconductor package of claim 11 , further comprising a second passive component located between the first passive component and the first side of the first semiconductor die, wherein a component type of the second passive component is selected from a group comprising: a capacitor, an inductor, and a resistor.

14. The semiconductor package of claim 11 , further comprising a second passive component located between the first passive component and the second side of the second semiconductor die, wherein a component type of the second passive component is selected from a group comprising: a capacitor, an inductor, and a resistor.

15. The semiconductor package of claim 1 , further comprising a die seal coupled to the package substrate.

16. The semiconductor package of claim 15 , wherein the die seal comprises an underfill die seal layer coupled between the second side of package substrate and the first side of the first semiconductor die.

17. A semiconductor package, comprising:

(A) a package substrate comprising:

(i) a first side, and

(ii) a second side opposite the first side;

(B) a first semiconductor die comprising:

(i) a first side coupled to the second side of the package substrate, and

(ii) a second side opposite the first side and comprising a first bonding layer;

(C) a second semiconductor die comprising:

(i) a first side comprising a second bonding layer coupled to the second side of the first semiconductor die, and

(ii) a second side opposite the first side;

(D) a voltage regulator circuit comprising at least one active component;

(E) a first passive component electrically coupled to the voltage regulator circuit, the first passive component comprising:

(i) a first portion integrated into the first semiconductor die, and

(ii) a second portion integrated into the second semiconductor die, wherein:

the first portion and the second portion are coupled together to complete the first passive component when the second side of the first semiconductor die is coupled to the first side of the second semiconductor die; and

(F) a second passive component located between the first passive component and the first side of the first semiconductor die, wherein a component type of the second passive component is selected from a group consisting of: a capacitor, an inductor, and a resistor.

18. A semiconductor package, comprising:

(A) a package substrate comprising:

(i) a first side, and

(ii) a second side opposite the first side;

(B) a first semiconductor die comprising:

(i) a first side coupled to the second side of the package substrate, and

(ii) a second side opposite the first side and comprising a first bonding layer;

(C) a second semiconductor die comprising:

(i) a first side comprising a second bonding layer coupled to the second side of the first semiconductor die, and

(ii) a second side opposite the first side;

(D) a voltage regulator circuit comprising at least one active component;

(E) a first passive component electrically coupled to the voltage regulator circuit, the first passive component comprising:

(i) a first portion integrated into the first semiconductor die, and

(ii) a second portion integrated into the second semiconductor die, wherein:

the first portion and the second portion are coupled together to complete the first passive component when the second side of the first semiconductor die is coupled to the first side of the second semiconductor die; and

(F) a second passive component located between the first passive component and the second side of the second semiconductor die, wherein a component type of the second passive component is selected from a group consisting of: a capacitor, an inductor, and a resistor.

Assignments (2)
CHANGE OF NAME Recorded Sep 2, 2022
From: XCELSIS CORPORATION
To: ADEIA SEMICONDUCTOR INC.
Reel/Frame 061375/0309 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2019
From: DELACRUZ, JAVIER A.; DRAPER, DON; HABA, BELGACEM; MOHAMMED, ILYAS
To: XCELSIS CORPORATION
Reel/Frame 049021/0133 →