IP Library Granted Patent US 10,951,176
Granted Patent B2
US 10,951,176 · App. 16/400,483 · Granted Mar 16, 2021

Highly linear low noise transconductor

Inventors: Anand Mohan Pappu (Bengaluru, IN); Ranjit Kumar Guntreddi (Bengaluru, IN); Madhusudan Govindarajan (Bengaluru, IN); Pranjal Pandey (Bengaluru, IN)
H03F1/342H03F1/223H03F1/3205H03F3/45179H03F2200/135H03F2200/294H03F2203/45288H03F2203/45336
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Quick Facts
Patent No.
US 10,951,176
App. No.
16/400,483
Granted
Mar 16, 2021
Kind
B2
Abstract

A transconductance circuit comprises a first transistor, a second transistor, a first source-degeneration device, a second source-degeneration device, a first feedback device, and a second feedback device. The gate node of the first transistor is coupled to a source node of the second transistor via the first feedback device. The gate node of the second transistor is coupled to a source node of the second transistor via the second feedback device. The source node of the first transistor is coupled to a reference voltage via the first source-degeneration device. The source node of the second transistor is coupled to the reference voltage via the second source-degeneration device.

Claims (45)

1. A system comprising:

a transconductance circuit configured to convert an input voltage to an output current, the transconductance circuit comprising a first transistor, a second transistor, a first source-degeneration device, a second source-degeneration device, a first feedback device, and a second feedback device, wherein:

a gate node of the first transistor is coupled to a source node of the second transistor via the first feedback device;

a gate node of the second transistor is coupled to a source node of the second transistor via the second feedback device;

the source node of the first transistor is coupled to a reference voltage via the first source-degeneration device; and

the source node of the second transistor is coupled to the reference voltage via the second source-degeneration device.

2. The system of claim 1 , comprising a first bleeder device and a second bleeder device.

3. The system of claim 2 , wherein:

the first bleeder device is coupled in parallel with the first source-degeneration device; and

the second bleeder device is coupled in parallel with the second source-degeneration device.

4. The system of claim 2 , wherein the first bleeder device comprises a third transistor and the second bleeder device comprises a fourth transistor.

5. The system of claim 1 , wherein:

an impedance of the first feedback device is equal, to within 5%, of an output impedance of a circuit that provides the input voltage; and

an impedance of the second feedback device is equal, to within 5%, of an output impedance of a circuit that provides the input voltage.

6. The system of claim 1 , wherein:

the input voltage is a differential signal; and

the transconductance circuit is configured to receive the input voltage across gate nodes of the first transistor and the second transistor.

7. The system of claim 1 , wherein:

the output current is a differential signal; and

the transconductance circuit is configured to provide the output current at drain nodes of the first transistor and the second transistor.

8. The system of claim 1 , wherein the first transistor and the second transistor are metal-oxide-semiconductor (MOS) devices.

9. A system comprising:

a transconductance circuit comprising a first transistor, a second transistor, a first source-degeneration device, a second source-degeneration device, a first feedback device, and a second feedback device, wherein:

a gate node of the first transistor is coupled to a source node of the second transistor via the first feedback device;

a gate node of the second transistor is coupled to a source node of the second transistor via the second feedback device;

the source node of the first transistor is coupled to a reference voltage via the first source-degeneration device; and

the source node of the second transistor is coupled to the reference voltage via the second source-degeneration device.

10. The system of claim 9 , comprising a first bleeder device and a second bleeder device.

11. The system of claim 10 , wherein:

the first bleeder device is coupled in parallel with the first source-degeneration device; and

the second bleeder device is coupled in parallel with the second source-degeneration device.

12. The system of claim 10 , wherein the first bleeder device comprises a third transistor and the second bleeder device comprises a fourth transistor.

13. The system of claim 9 , wherein:

an impedance of the first feedback device is equal, to within 5%, of an output impedance of a circuit that provides an input voltage or current to the transconductance circuit; and

an impedance of the second feedback device is equal, to within 5%, of an output impedance of a circuit that provides an input voltage or current to the transconductance circuit.

14. The system of claim 9 , wherein the transconductance circuit is configured to convert an input voltage to an output current.

15. The system of claim 14 , wherein:

the input voltage is a differential signal; and

the transconductance circuit is configured to receive the input voltage across gate nodes of the first transistor and the second transistor.

16. The system of claim 14 , wherein:

the output current is a differential signal; and

the transconductance circuit is configured to provide the output current at drain nodes of the first transistor and the second transistor.

17. The system of claim 9 , wherein the first transistor and the second transistor comprise one or more of a metal-oxide-semiconductor field-effect transistor(MOSFET), fin field-effect transistor (FINFET), bipolar junction transistor (BJT), and junction field-effect transistor.

18. The system of claim 9 , wherein the first feedback device is a first resistor and the second feedback device is a second resistor.

19. The system of claim 9 , wherein the first source-degeneration device is a first resistor and the second source-degeneration device is a second resistor.

Assignments (4)
SECURITY AGREEMENT Recorded Jul 9, 2021
From: MAXLINEAR, INC.; MAXLINEAR COMMUNICATIONS, LLC; EXAR CORPORATION
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 056816/0089 →
RELEASE OF SECURITY INTEREST Recorded Jun 23, 2021
From: MUFG UNION BANK, N.A.
To: MAXLINEAR, INC.; EXAR CORPORATION; MAXLINEAR COMMUNICATIONS LLC
Reel/Frame 056656/0204 →
SUCCESSION OF AGENCY (REEL 052777 / FRAME 0216) Recorded Jul 1, 2020
From: JPMORGAN CHASE BANK, N.A.
To: MUFG UNION BANK, N.A.
Reel/Frame 053116/0418 →
SECURITY AGREEMENT Recorded May 28, 2020
From: MAXLINEAR, INC.; ENTROPIC COMMUNICATIONS, LLC; EXAR CORPORATION
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 052777/0216 →
Priority Claims (1)
IN 201811016617 · May 2, 2018 · national
Continuity (2)
Provisional Application 62686698 · Jun 19, 2018
Related Publication 20190341892A1 · Nov 7, 2019