Sampling device including mechanical force feedback mechanism
The present disclosure includes a sampling device for collecting a sample from a target surface, the sample device including a handle, a body extending from the handle, a sampling head coupled to the body opposite said handle, wherein the sampling head is configured such that, when a mechanical force is applied to the handle, the body rotates to enable a collection of the sample from the target surface by the sampling head, and a mechanical force feedback mechanism. The mechanical force feedback mechanism includes a rotational junction connecting the body to the handle and a pin rotatably coupling the body with the handle, and is configured to prevent a further rotation of the body when a threshold amount of force is applied to the handle.
1. A sampling device for collecting a sample from a target surface, the sampling device comprising:
a handle;
a body extending from said handle;
a sampling head coupled to the body opposite said handle, wherein the sampling head is configured such that, when a mechanical force is applied to the handle, the body rotates to thereby enable a collection of the sample from the target surface by the sampling head; and
a mechanical force feedback mechanism configured to prevent a further rotation of the body when a threshold amount of force is applied to the handle, wherein the mechanical force feedback mechanism is defined by a rotational junction connecting the body to the handle and comprises a pin rotatably coupling the body with the handle.
2. The sampling device according to claim 1 , wherein said sample trap is detachable from said trap holder.
3. The sampling device according claim 1 , further comprising a force indicator configured to provide a sound upon application of the threshold amount of force on the target surface by said sampling device.
4. The sampling device according to claim 1 , wherein said sampling device transitions into a threshold configuration when the threshold amount of force is applied.
5. The sampling device according to claim 1 , further comprising a force indicator configured to visually indicate when the threshold amount of force is applied to the target surface by said sampling device.
6. The sampling device according to claim 5 , wherein the sampling device includes an over-force indicator that indicates when a predetermined amount of force that is greater than the threshold amount of force has been applied.
7. The sampling device according to claim 6 , wherein the predetermined amount of force is within a range of about three to about five pounds of force.
8. The sampling device according to claim 1 , further configured to provide tactile feedback to indicate that the threshold amount of force is applied to the target surface by said sampling device.
9. The sampling device according to claim 1 , wherein the mechanical force feedback mechanism further comprises at least one biasing member for causing rotation of the body about the pin when a force is applied by the sampling device against the target surface.
10. The sampling device according to claim 9 , wherein the at least one biasing member is at least one torsion spring positioned around the pin and configured to cause the rotation of the body about the pin when the force is applied by the sampling device against the target surface.
11. The sampling device according to claim 10 , wherein the at least one torsion spring is configured to cause an external wall of the handle to contact a wall of the body such that, when the threshold amount of force is applied by the sampling device against the target surface, further rotation of the body is prevented.
12. A method of using a mechanical force feedback sampling device, said method comprising:
grasping a handle of a sampling device, wherein the handle is coupled to a body;
applying a force against a target surface using a sampling head of the sampling device, wherein the sampling head is coupled to the body and configured such that, when a mechanical force is applied to the handle, the body rotates to thereby enable a collection of a sample from the target surface by the sampling head;
increasing the applied force to a threshold amount of force causing a mechanical force feedback mechanism of the sampling device to prevent any further rotation of the body, wherein the mechanical force feedback mechanism is defined by a rotational junction connecting the body to the handle and comprises a pin rotatably coupling the body with the handle; and
collecting a sample.
13. The method according to claim 12 , wherein collecting a sample comprises collecting a sample using a sample trap of the sampling head, said method further comprising: inserting the sample trap into an analysis device for analysis of the sample.
14. The method according to claim 12 , wherein increasing the applied force to a threshold amount of force comprises increasing the applied force to at least about a half pound of force.
15. The method according to claim 12 , wherein the mechanical force feedback mechanism comprises at least one biasing member configured to cause rotation of the body about the pin rotatably coupling the body with the handle when the force is applied by the sampling device against the target surface.
16. The method according to claim 15 , wherein the at least one biasing member comprises at least one torsion spring positioned around the pin and configured to cause a rotation of the body about the pin when the force is applied by the sampling device against the target surface.
17. The method according to claim 16 , wherein causing the mechanical force feedback mechanism of the sampling device to prevent the rotation of the body comprises applying the threshold amount of force by the sampling device against the target surface such that the torsion spring causes an external wall of the handle to contact a wall of the body and thereby prevent further rotation of the body.