POLARIZED LIGHT MATERIAL INSPECTION TOOL
The invention relates to a portable material inspection device, with a light source, a polarizer, and an analyzer. The light source emits light through the polarizer to a material and the light reaches the analyzer. The angle or position of the incident emitted light, either polarized or unpolarized is freely adjustable. The inspection device may have an waterproof and dust resistant external shell and be relatively small, less than 7 inches by 5 inches by 2 inches.
1 . A portable material inspection device, comprising:
a light source;
a polarizer, and
an analyzer, wherein the light source emits light through the polarizer to a material and the light reaches the analyzer; and
the angle or position of the incident emitted light, either polarized or unpolarized is freely adjustable.
2 . The portable material inspection device of claim 1 , further comprising an external shell.
3 . The portable material inspection device of claim 2 , wherein the external shell is waterproof and/or dust resistant.
4 . The portable material inspection device of claim 2 , wherein the dimensions of the portable material inspection device are less than 7 inches by 5 inches by 2 inches.
5 . The portable material inspection device of claim 4 , wherein the portable material inspection device is affixed to an arm, gantry rig, frame, or other support structure.
6 . A material inspection tool comprising:
a light source;
a polarizer, and
an analyzer, wherein the light source emits light through the polarizer to a material and the light reaches the analyzer; and
the light source rotates the direction of light emitted.
7 . The material inspection tool of claim 6 , wherein the light source comprises multiple lights.
8 . The material inspection tool of claim 7 , wherein the multiple lights are arranged in radial arrays.
9 . The material inspection tool of claim 6 , wherein the light source and polarizer are movable to multiple angles in relation to the material to be inspected.
10 . The material inspection tool of claim 6 , wherein the polarizer rotates while the light source emits light.
11 . The portable material inspection device of claim 5 , wherein the support structure moves across a surface while the portable material inspection device operates.
12 . A device for characterizing material attributes based on the selective response of a material to specific wavelengths of polarized light of a plurality of wavelengths at one or more angles of incidence, comprising:
a light source;
a polarizer;
at least one rotator;
an objective,
and an analyzer.
13 . The device of claim 12 , wherein the analyzer further comprises a camera or other data capture device.
14 . The device of claim 12 , wherein the rotator is integrated with the polarizer.
15 . The device of claim 12 , wherein the rotator is liquid crystal.
16 . The device of claim 12 , wherein the rotator is integrated with the analyzer.
17 . The device of claim 16 , further comprising a second rotator integrated with the polarizer.
18 . The portable material inspection device of claim 1 , wherein the portable inspection device is configured to inspect metals, alloys, composites, wood, biological material, and/or isotropic materials.
19 . The portable material inspection device of claim 2 , wherein the external shell encapsulates only a portion of the portable material inspection device.
20 . The portable material inspection device of claim 2 , wherein the external shell is transparent.