Detector architecture using photodetector substrates and semiconductor devices
Some embodiments include a method, comprising: providing a semiconductor substrate including photodetectors on a first side of the substrate; attaching at least one semiconductor device to the first side of the semiconductor substrate; attaching a back support plate to the semiconductor substrate over the at least one semiconductor device; and thinning the semiconductor substrate.
1 . A method, comprising:
providing a semiconductor substrate including photodetectors on a first side of the semiconductor substrate;
attaching a plurality of semiconductor chips to the first side of the semiconductor substrate;
attaching a back support plate to the semiconductor substrate over the plurality of semiconductor chips, the back support plate comprising a central protrusion and peripheral recesses extending around at least a portion of the central protrusion; and
thinning the semiconductor substrate.
2 . The method of claim 1 , wherein thinning the semiconductor substrate comprises thinning the semiconductor substrate after attaching the back support plate.
3 . The method of claim 1 , wherein:
thinning the semiconductor substrate comprises:
attaching the semiconductor substrate to a carrier substrate; and
thinning the semiconductor substrate on the carrier substrate; and
attaching the back support plate comprises attaching the back support plate after thinning the semiconductor substrate.
4 . The method of claim 1 , further comprising:
attaching a carrier substrate to the back support plate before thinning the semiconductor substrate; and
removing the carrier substrate after thinning the semiconductor substrate.
5 . The method of claim 1 , further comprising attaching an interposer to the semiconductor substrate before attaching the back support plate.
6 . The method of claim 1 , further comprising attaching an electrical connection structure to the semiconductor substrate before attaching the back support plate.
7 . The method of claim 1 , further comprising attaching at least one of a scintillator or an optical substrate to a thinned side of the semiconductor substrate.
8 . A computer readable medium having instructions stored thereon adapted to perform the method of claim 1 .
9 . A method, comprising:
providing a plurality of semiconductor substrates including photodetectors on a first side of each of the semiconductor substrates;
attaching a second side of each of the semiconductor substrates to a first carrier substrate;
attaching at least one semiconductor device to the first side of each of the semiconductor substrates;
attaching a back support plate to the semiconductor substrates over the at least one semiconductor device; and
thinning the semiconductor substrates.
10 . The method of claim 9 , wherein thinning the semiconductor substrates comprises thinning the semiconductor substrates after attaching the back support plate.
11 . The method of claim 9 , wherein attaching the at least one semiconductor device to the first side of each of the semiconductor substrates comprises attaching the at least one semiconductor device to the first side of each of the semiconductor substrates before attaching the second side of each of the semiconductor substrates to the first carrier substrate.
12 . The method of claim 9 , further comprising electrically connecting at least one of the semiconductor substrates to another of the semiconductor substrates.
13 . The method of claim 9 , further comprising attaching an interposer or an electrical connection structure to multiple of the semiconductor substrates.
14 . The method of claim 9 , further comprising removing the first carrier substrate before thinning the semiconductor substrates.
15 . The method of claim 9 , further comprising attaching an optical substrate or a scintillator to a thinned side of the semiconductor substrates.
16 . A method, comprising:
providing a semiconductor substrate comprising a plurality of photodetectors for detecting incident radiation;
attaching a plurality of semiconductor chips for processing the detected incident radiation to the semiconductor substrate;
attaching a back support plate for structurally supporting the semiconductor substrate to the semiconductor substrate, the back support plate comprising a central protrusion and peripheral recesses extending around at least a portion of the central protrusion; and
thinning the semiconductor substrate;
wherein the plurality of semiconductor chips are attached to the semiconductor substrate between the semiconductor substrate and the back support plate.
17 . The method of claim 11 , further comprising:
attaching an electrical connection structure for electrically connecting to the plurality of semiconductor chips to the semiconductor substrate.
18 . The system of claim 16 , further comprising:
attaching a scintillator for converting the detected incident radiation into light photons to the thinned semiconductor substrate; wherein
the plurality of photodetectors detect the light photons.