Systems, devices and methods for the quality assessment of OLED stack films
This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.
1. A computer-implemented method for monitoring quality of a film deposited on a substrate, the computer-implemented method comprising:
capturing a digital image of a structure of the film;
processing the digital image to form image data of the digital image;
processing the image data to identify any gradients that satisfy a first gradient threshold;
identifying a quality defect if any gradients which satisfy the first threshold also satisfy a second gradient threshold; and
identifying that the film is not defective with respect to the structure if no gradients satisfy the second gradient threshold.
2. The computer-implemented method of claim 1 , wherein the structure is a portion of the surface of the film.
3. The computer-implemented method of claim 1 , wherein the structure is inside the film.
4. The computer-implemented method of claim 1 , wherein the first gradient threshold is a non-zero threshold.
5. The computer-implemented method of claim 4 , wherein processing the image data comprises applying a filter to the image data to form filtered image data, and applying an operator to the filtered image data to emphasize intensity variation represented in the image data.
6. The computer-implemented method of claim 5 , wherein processing the image data further comprises obtaining the gradients using the operator and comparing an absolute value of a magnitude of each gradient to the first threshold.
7. The computer-implemented method of claim 6 , wherein the operator is a Sobel operator.
8. The computer-implemented method of claim 6 , wherein the substrate is a display substrate, and the structure is a pixel of the display substrate.
9. The computer-implemented method of claim 5 , wherein the filter comprises a boundary detection function.
10. The computer-implemented method of claim 9 , wherein applying the filter comprises using the boundary detection function to form a mask, and using the mask to isolate image data corresponding to the structure.
11. A computer-implemented method for monitoring quality of a film deposited on a substrate, the computer-implemented method comprising:
capturing a digital image of an electro-optical structure of the film;
processing the digital image to form image data of the digital image;
processing the image data to identify any gradients that satisfy a first gradient threshold;
identifying a quality defect if any gradients which satisfy the first threshold also satisfy a second gradient threshold; and
identifying that the film is not defective with respect to the structure if no gradients satisfy the second gradient threshold.
12. The computer-implemented method of claim 11 , wherein the structure is located at the surface of the film.
13. The computer-implemented method of claim 11 , wherein the structure is located inside the film.
14. The computer-implemented method of claim 11 , wherein processing the image data comprises applying a filter to the image data to form filtered image data, applying an operator to the filtered image data to emphasize intensity variation represented in the image data, obtaining the gradients using the operator, and comparing an absolute value of a magnitude of each gradient to the first gradient threshold.
15. The computer-implemented method of claim 14 , wherein the operator is a Sobel operator.
16. The computer-implemented method of claim 14 , wherein the substrate is a display substrate, and the structure is a pixel of the display substrate.
17. The computer-implemented method of claim 14 , wherein the filter comprises a boundary detection function, and applying the filter comprises using the boundary detection function to form a mask, and using the mask to isolate image data corresponding to the structure.
18. The computer-implemented method of claim 11 , wherein processing the image data comprises applying a filter to the image data to form filtered image data, applying an operator to the filtered image data to emphasize intensity variation represented in the image data, obtaining the gradients using the operator, summing the gradients, and comparing the sum to the first gradient threshold or the second gradient threshold.
19. A computer-implemented method for monitoring quality of a film deposited on a display substrate, the computer-implemented method comprising:
capturing a digital image of an portion of the film corresponding to a pixel of the display substrate;
processing the digital image to form image data of the digital image;
processing the image data to identify any gradients that satisfy a first gradient threshold;
identifying a quality defect if any gradients which satisfy the first threshold also satisfy a second gradient threshold; and
identifying that the film is not defective with respect to the structure if no gradients satisfy the second gradient threshold.
20. The computer-implemented method of claim 19 , wherein processing the image data comprises applying a filter to the image data to form filtered image data, applying an operator to the filtered image data to emphasize intensity variation represented in the image data, and obtaining the gradients using the operator.