Scintillator array, method of manufacturing scintillator array, radiation detector, and radiation inspection device
A scintillator array includes a first scintillator element, a second scintillator element, and a reflector provided between the first and second scintillator elements and having a width of 80 μm or less therebetween. Each scintillator element includes a polycrystal containing a rare earth oxysulfide phosphor, the polycrystal having a radiation incident surface of 1 mm or less×1 mm or less in area. An average crystal grain diameter of the polycrystal is not less than 5 μm nor more than 30 μm, the average crystal grain diameter being defined by an average intercept length of crystal grains in an observation image of the polycrystal with a scanning electron microscope. A maximum length or a maximum diameter of defects on the polycrystal is 40 μm or less.
1. A scintillator array comprising:
a first scintillator element;
a second scintillator element; and
a reflector provided between the first and second scintillator elements and having a width of 80 μm or less therebetween,
wherein each scintillator element includes a polycrystal containing a rare earth oxysulfide phosphor, the polycrystal having a radiation incident surface of 1 mm or less×1 mm or less in area,
wherein an average crystal grain diameter of the polycrystal is not less than 5 μm nor more than 30 μm, the average crystal grain diameter being defined by an average intercept length of crystal grains in an observation image of the polycrystal with a scanning electron microscope,
wherein a maximum length or a maximum diameter of defects on the polycrystal is 40 μm or less, and
wherein a ratio of a total area of defects on a scanning surface to an area thereof is 10% or less, the ratio being, defined by inspecting an inside of the polycrystal under a measurement condition including a frequency of 200 MHz, a focal length of 2.9 mm, a scanning pitch of 2.5 μm, a scanning surface size of 1 mm×1 mm, a sample thickness of 1 mm, and a detection limit defect length of 3 μm using ultrasonic flaw detection.
2. The scintillator array according to claim 1 , wherein the defect includes at least one selected from the group consisting of a hole, a flaw, a foreign material including a component different from a component of the rare earth oxysulfide phosphor, a hetero-phase having the same components as components of, and a crystal structure different from a crystal structure of, the rare earth oxysulfide phosphor, and a hetero-phase including a component different from a component of the rare earth oxysulfide phosphor.
3. The scintillator array according to claim 1 , wherein the rare earth oxysulfide phosphor is expressed by a formula of A 2 O 2 S:Pr, wherein A is at least one element selected from the group consisting of Y, Gd, La and Lu,
or wherein the rare earth oxysulfide phosphor is expressed by a formula of (Gd 1-x A′ x ) 2 O 2 S:Pr, wherein A′ is at least one element selected from the group consisting of Y, La and Lu, and x is a number satisfying 0≤x≤0.1.
4. The scintillator array according to claim 3 , wherein the rare earth oxysulfide phosphor contains at least one element selected from the group consisting of cerium, zirconium, and phosphorus.
5. A radiation detector comprising:
the scintillator array according to claim 1 ; and
a photoelectric converter to convert light from the scintillator array into electricity.
6. A radiation inspection device comprising:
a radiation source to irradiate an inspection object with radiation rays; and
the radiation detector according to claim 5 , the radiation detector being configured to detect radiation rays through the inspection object.