IP Library Granted Patent US 11,352,252
Granted Patent B2
US 11,352,252 · App. 16/448,901 · Granted Jun 7, 2022

Semiconductor device and method of manufacturing semiconductor device

Inventors: Ki Yeul Yang (Incheon, KR); Kyung Han Ryu (Incheon, KR); Seok Hun Yun (Incheon, KR); Bora Baloglu (Oporto, PT); Hyun Cho (Incheon, KR); Ramakanth Alapati (Dublin, CA)
Assignee: Amkor Technology Singapore Holding Pte. Ltd.
B81C1/00182B81B7/007B81C1/00158B81C1/00301H01L23/481B81B2201/02
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Quick Facts
Patent No.
US 11,352,252
App. No.
16/448,901
Granted
Jun 7, 2022
Kind
B2
Abstract

In one example, an electronic device includes a semiconductor sensor device having a cavity extending partially inward from one surface to provide a diaphragm adjacent an opposite surface. A barrier is disposed adjacent to the one surface and extends across the cavity, the barrier has membrane with a barrier body and first barrier strands bounded by the barrier body to define first through-holes. The electronic device further comprises one or more of a protrusion pattern disposed adjacent to the barrier structure, which can include a plurality of protrusion portions separated by a plurality of recess portions; one or more conformal membrane layers disposed over the first barrier strands; or second barrier strands disposed on and at least partially overlapping the first barrier strands. The second barrier strands define second through-holes laterally offset from the first through-holes. Other examples and related methods are also disclosed herein.

Claims (55)

1. A method of forming an electronic device, comprising:

providing a first electronic device comprising a first surface and a second surface opposite to the first surface, and a cavity extending partially inward from the second surface to provide a diaphragm adjacent to the first surface; and

providing a barrier coupled to the second surface of the first electronic device, the barrier comprising:

a membrane including:

a first barrier body; and

first barrier strands defining first through-holes;

a second barrier body over the first barrier body;

second barrier strands on the first barrier strands that define second through-holes laterally offset with respect to the first through-holes, wherein the second barrier strands partially cover the first through-holes; and

a stiffener over the second barrier body.

2. The method of claim 1 , wherein providing the barrier comprises:

providing the first electronic device among a plurality of electronic devices as part of semiconductor wafer, the first electronic device including the cavity extending partially inward from the second surface;

providing a first layer of material adjacent to the second surface to close-off the cavity;

forming the first through-holes within the first layer of material to establish the first barrier body and the first barrier strands;

attaching the semiconductor wafer to a carrier substrate; and

singulating the semiconductor wafer to provide the first electronic device, wherein the step of singulating includes singulating through the first layer of material.

3. The method of claim 1 , wherein:

providing the first electronic device comprises providing a Micro-Electro-Mechanical System (MEMS) sensor; and

providing the barrier comprises providing one or more dielectric materials.

4. A method of forming an electronic device, comprising:

providing a first electronic device comprising a first surface and a second surface opposite to the first surface, and a cavity extending partially inward from the second surface to provide a diaphragm adjacent to the first surface; and

providing a barrier connected to the second surface of the first electronic device, the barrier comprising:

a membrane including:

a first barrier body; and

first barrier strands defining first through-holes; and

second barrier strands attached to the first barrier strands that define second through-holes that are laterally offset with respect to the first through-holes, wherein outer edges of the second barrier strands are projected partially over the first through-holes;

wherein:

providing the barrier further comprises:

providing a second barrier body over the first barrier body; and

providing a stiffener over the second barrier body.

5. The method of claim 4 , wherein:

providing the barrier comprises:

providing the membrane over a base;

providing a first dielectric structure over the membrane; and

patterning the first dielectric structure to provide the second barrier strands that define the second through-holes.

6. The method of claim 5 , wherein:

providing the barrier further comprises:

providing a second dielectric structure covering the second barrier strands and the membrane; and

patterning the second dielectric structure to provide a stiffener.

7. The method of claim 6 , further comprising:

attaching a mounting film to the stiffener; and

removing the base;

wherein:

the step of connecting the barrier to the second surface of the first electronic device occurs after removing the base.

8. The method of claim 7 , wherein:

the step of connecting the barrier comprises:

using a pick-and-place apparatus to remove the barrier from the mounting film; and

attaching the barrier to the second surface of the first electronic device.

9. The method of claim 6 , wherein:

providing the second dielectric comprises providing an inorganic dielectric.

10. The method of claim 6 , wherein:

providing the second dielectric comprises providing an organic dielectric.

11. The method of claim 4 , wherein:

providing the barrier comprises providing the membrane comprising an inorganic dielectric.

12. The method of claim 4 , wherein:

providing the barrier comprises providing the membrane comprising an organic dielectric.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2020
From: AMKOR TECHNOLOGY, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE. LTD.
Reel/Frame 052761/0768 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2020
From: AMKOR TECHNOLOGY KOREA, INC.
To: AMKOR TECHNOLOGY SINGAPORE HOLDING PTE. LTD.
Reel/Frame 052766/0486 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2019
From: YANG, KI YEUL; RYU, KYUNG HAN; YUN, SEOK HUN; CHO, HYUN
To: AMKOR TECHNOLOGY KOREA, INC.
Reel/Frame 049554/0118 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2019
From: BALOGLU, BORA; ALAPATI, RAMAKANTH
To: AMKOR TECHNOLOGY, INC.
Reel/Frame 049554/0176 →
Continuity (1)
Related Publication 20200399119A1 · Dec 24, 2020