Control circuit and control method for infrared detector, and imaging device
A control method of an infrared detector, for obtaining a wider dynamic range and preventing an over-range, is disclosed. The method includes: monitoring a value acquired in response to an electric current flowing in each of a plurality of infrared detection elements configuring the infrared detector, and lowering, when the value acquired in response to the electric current flowing in the infrared detection element reaches a threshold value within a detection time, sensitivity of the infrared detection element within the detection time.
1. A control circuit for an infrared detector comprising:
a plurality of driving circuits configured to be respectively coupled to a plurality of infrared detection elements of the infrared detector,
each of the plurality of driving circuits is configured to drive a corresponding at least one of the plurality of infrared detection elements,
wherein each of the plurality of driving circuits includes a sensitivity adjustment circuit configured to lower sensitivity of the corresponding at least one infrared detection element within a detection time, in a case where a value acquired in response to an electric current flowing in the corresponding at least one infrared detection element reaches a threshold value within the detection time.
2. The control circuit for the infrared detector according to claim 1 ,
wherein each of the plurality of driving circuits includes an integral capacitor and the detection time is an integral time of the integral capacitor, and
when a voltage value of the integral capacitor reaches the threshold value within the integral time, the sensitivity adjustment circuit lowers the sensitivity of the corresponding at least one infrared detection element within the integral time.
3. The control circuit for the infrared detector according to claim 1 ,
wherein the sensitivity adjustment circuit lowers the sensitivity of the corresponding at least one infrared detection element in the detection time when an output value of the driving circuit reaches the threshold value within the detection time.
4. The control circuit for the infrared detector according to claim 1 ,
wherein the sensitivity adjustment circuit is a driving voltage adjustment circuit configured to lower a driving voltage of the corresponding at least one infrared detection element, in order to lower the sensitivity of the corresponding at least one infrared detection element.
5. The control circuit for the infrared detector according to claim 1 ,
wherein the sensitivity adjustment circuit is an area adjustment circuit configured to decrease an area of the corresponding at least one infrared detection element, in order to lower the sensitivity of the corresponding at least one infrared detection element.
6. The control circuit for the infrared detector according to claim 5 ,
wherein the infrared detection element includes a first region and a second region, and
the area adjustment circuit is a first driving control circuit configured to drive only one of the first region and the second region, in order to decrease the area of the corresponding at least one infrared detection element.
7. The control circuit for the infrared detector according to claim 1 ,
wherein the sensitivity adjustment circuit is a second driving control circuit configured to stop driving of the corresponding at least one infrared detection element after a certain period of time elapses since detection of the value acquired reaching the threshold value, in order to lower the sensitivity of the corresponding at least one infrared detection element.
8. An imaging device comprising:
an infrared detector including a plurality of infrared detection elements; and
a control circuit configured to control the infrared detector,
wherein the control circuit is coupled to each of a plurality of infrared detection elements, and includes a plurality of driving circuits configured to respectively drive a corresponding at least one of the plurality of infrared detection elements, and
each of the plurality of driving circuits includes a sensitivity adjustment circuit configured to lower sensitivity of the corresponding at least one infrared detection element within a detection time, in a case where a value acquired in response to an electric current flowing in the corresponding at least one infrared detection element reaches a threshold value within the detection time.
9. The imaging device according to claim 8 ,
wherein each of the plurality of driving circuits includes an integral capacitor and the detection time is an integral time of the integral capacitor, and
when a voltage value of the integral capacitor reaches the threshold value within the integral time, the sensitivity adjustment circuit lowers the sensitivity of the corresponding at least one infrared detection element within the integral time.
10. The imaging device according to claim 8 ,
wherein the sensitivity adjustment circuit lowers the sensitivity of the corresponding at least one infrared detection element in the detection time when an output value of the driving circuit reaches the threshold value within the detection time.
11. The imaging device according to claim 8 ,
wherein the sensitivity adjustment circuit is a driving voltage adjustment circuit configured to lower a driving voltage of the corresponding at least one infrared detection element, in order to lower the sensitivity of the corresponding at least one infrared detection element.
12. The imaging device according to claim 8 ,
wherein the sensitivity adjustment circuit is an area adjustment circuit configured to decrease an area of the corresponding at least one infrared detection element, in order to lower the sensitivity of the corresponding at least one infrared detection element.
13. The imaging device according to claim 12 ,
wherein the infrared detection element includes a first region and a second region, and
the area adjustment circuit is a first driving control circuit configured to drive only one of the first region and the second region, in order to decrease the area of the corresponding at least one infrared detection element.
14. The imaging device according to claim 8 ,
wherein the sensitivity adjustment circuit is a second driving control circuit configured to stop driving of the corresponding at least one infrared detection element after a certain period of time elapses since detection of the value acquired reaching the threshold value, in order to lower the sensitivity of the corresponding at least one infrared detection element.
15. A control method of an infrared detector, the method comprising:
monitoring a value acquired in response to an electric current flowing in each of a plurality of infrared detection elements of the infrared detector, and
lowering, when the value acquired in response to the electric current flowing in an infrared detection element reaches a threshold value within a detection time, sensitivity of the infrared detection element within the detection time.