Superconducting element, particle detection device, and particle detection method

1. A superconducting element comprising at least one superconducting strip,

the at least one superconducting strip comprising a meandering structure,

the meandering structure comprising:

a first portion extending in a first direction and made of a superconducting material, the first portion comprising a first surface that is to be irradiated with a particle, and a second surface that is opposite to the first surface;

a second portion connected to the second surface of the first portion, extending in a second direction perpendicular to the first direction, and being conductive; and

a third portion connected to the second portion, extending in a direction opposite to the first direction, and made of a superconducting material.

2. The superconducting element of claim 1 , wherein the at least one superconducting strip is a plurality of superconducting strips.

3. The superconducting element of claim 2 , wherein:

the superconducting strips are arranged in a third direction perpendicular to the first direction and the second direction without contacting each other; and

adjacent two superconducting strips of the superconducting strips do not overlap with respect to the second direction.

4. The superconducting element of claim 2 , wherein:

the superconducting strips are arranged in a third direction perpendicular to the first direction and the second direction without contacting each other; and

adjacent two superconducting strips of the superconducting strips overlap with respect to the second direction.

5. The superconducting element of claim 1 ,

further comprising:

a fourth portion connected to the third portion, extending in the second direction, and being conductive; and

a fifth portion connected to the fourth portion and extending in the first direction.

6. The superconducting element of claim 5 , wherein the first portion, the second portion, the third portion, the fourth portion, and the fifth portion constitute the meandering structure.

7. The superconducting element of claim 6 , wherein the first portion, the third portion, and the fifth portion overlap with respect to the second direction.

8. The superconducting element of claim 7 , wherein:

dimensions in the second direction of the first portion, the third portion, and the fifth portion are less than or equal to 200 nm;

dimensions in the third direction of the first portion, the third portion, and the fifth portion are less than or equal to 200 nm.

9. The superconducting element of claim 8 , wherein dimensions in the first direction of the first portion, the third portion, and the fifth portion are greater than dimensions in the second direction of the second potion and the fourth portion.

10. The superconducting element of claim 1 , wherein the particle includes any one of an X-ray photon, an extreme ultraviolet photon, an ultraviolet photon, an infrared photon, a visible light photon, an electron, a neutron, and an ion.

11. A particle detection device comprising:

a superconducting element used as a pixel for detecting a particle and comprising at least one superconducting strip;

a current source which supplies a bias current to the at least one superconducting strip, and

an amplifier connected to the at least one superconducting strip;

the at least one superconducting strip comprising a meandering structure, the meandering structure comprising:

a first portion extending in a first direction and made of a superconducting material, the first portion comprising a first surface that is to be irradiated with a particle, and a second surface that is opposite to the first surface;

a second portion connected to the second surface of the first portion, extending in a second direction perpendicular to the first direction, and being conductive; and

a third portion connected to the second portion, extending in a direction opposite to the first direction, and made of a superconducting material,

wherein a superconducting region of any one of the first portion and the third portion is configured to be divided, and the particle is detected based on the divided state by using a measuring instrument that is provided in the particle detection device or out of the particle detection device.

12. The particle detection device of claim 11 , wherein the at least one superconducting strip is a plurality of superconducting strips.

13. The particle detection device of claim 11 , wherein the bias current is smaller than a critical current of a superconducting material of the at least one superconducting strip.

14. The particle detection device of claim 11 , further comprising a measuring instrument which detects the particle based on a state in which the superconducting region is divided, and wherein the state arises in the at least one superconducting strip.

15. The particle detection device of claim 11 , further comprising a refrigerator which cools the at least one superconducting strip and maintains a superconducting state of the at least one superconducting strip.

16. A particle detection method employing a superconducting element used as a pixel for detecting a particle, the superconducting element comprising at least one superconducting strip, a current source which supplies a bias current to the at least one superconducting strip, an amplifier connected to the at least one superconducting strip, each of the at least one superconducting strip comprising a meandering structure, the meandering structure comprising: a first portion extending in a first direction and comprising a superconducting material, the first portion comprising a first surface that is to be irradiated with a particle, and a second surface that is opposite to the first surface; a second portion connected to the second surface of the first portion, extending in a second direction perpendicular to the first direction, and being conductive; and a third portion connected to the second portion, extending in a direction opposite to the first direction, and comprising a superconducting material,

the particle detection method comprising:

cooling the at least one superconducting strip to set the at least one superconducting strip into a superconducting state;

supplying a bias current to the at least one superconducting strip;

irradiating the at least one superconducting strip with a particle to set a superconducting region of the at least one superconducting strip into a divided state; and

detecting the particle based on the divided state by using a measuring instrument.

17. The particle detection method of claim 16 , wherein before irradiating the at least one superconducting strip with the particle, the particle penetrates a sample.

18. The particle detection method of claim 16 , wherein the at least one superconducting strip is a plurality of superconducting strips.

19. The particle detection method of claim 16 , wherein the bias current is smaller than a critical current of a superconducting material of the at least one superconducting strip.

20. The particle detection method of claim 16 , wherein the particle includes any one of an X-ray photon, an extreme ultraviolet photon, an ultraviolet photon, an infrared photon, a visible light photon, an electron, a neutron, and an ion.