Apparatus state estimation device, apparatus state estimation method and program
A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.
1. An apparatus state estimation device comprising:
a state quantity acquisition unit that is configured to acquire a temperature of a target apparatus;
a load specification unit that is configured to specify a stress width for each cycle of stress fluctuation of the target apparatus, based on a change width of the temperature; and
a remaining life calculation unit that is configured to calculate a parameter related to a crack occurrence for a remaining life of the target apparatus from the stress width specified by the load specification unit, based on a relationship between the stress width and a number of life cycles related to crack occurrence in the target apparatus, and calculate a parameter related to a crack growth for the remaining life of the target apparatus from the stress width, based on a relationship between a crack length to be formed per unit cycle,
wherein the remaining life calculation unit calculates the parameter related to the crack growth in a case where the parameter related to the crack occurrence indicates an occurrence of a crack in the target apparatus.
2. The apparatus state estimation device according to claim 1 ,
wherein the remaining life calculation unit calculates, as the parameter related to the crack occurrence, an accumulated life consumption rate obtained by accumulating a life consumption rate of each cycle calculated based on the number of life cycles and the stress width specified by the load specification unit.
3. The apparatus state estimation device according to claim 2 ,
wherein the remaining life calculation unit calculates a crack length of the target apparatus as the parameter related to the crack growth, based on the stress width specified by the load specification unit, in a case where the accumulated life consumption rate is one or more.
4. The apparatus state estimation device according to claim 1 , further comprising:
an operating condition calculation unit that is configured to calculate an operating condition for operating the target apparatus, based on the parameter related to the crack occurrence and the parameter related to the crack growth.
5. The apparatus state estimation device according to claim 4 ,
wherein the operating condition calculation unit calculates an operating condition for continuing the operation of the target apparatus, during a time in which an operation of the target apparatus needs to be continued, based on the parameter related to the crack occurrence and the parameter related to the crack growth.
6. The apparatus state estimation device according to claim 5 , further comprising:
an operation allowability determination unit that is configured to determine whether or not the operation is capable of being continued until a predetermined inspection time, in a case where the target apparatus operates in a predetermined operating condition,
wherein the time in which the operation of the target apparatus needs to be continued is a time until the predetermined inspection time, and
wherein in a case where the operation allowability determination unit determines that the operation is not capable of being continued, the operating condition calculation unit calculates an operating condition for continuing the operation of the target apparatus, during the time specified by the time specification unit.
7. The apparatus state estimation device according to claim 4 , further comprising:
a load input unit that is configured to receive an input of a load for operating the target apparatus,
wherein the operating condition calculation unit calculates an operating condition when operating the target apparatus with the input load, based on the parameter related to the crack occurrence and the parameter related to the crack growth.
8. The apparatus state estimation device according to claim 4 , further comprising:
a maintenance information storage unit that is configured to store maintenance information generated in a maintenance work of the target apparatus,
wherein the operating condition calculation unit calculates the operating condition, based on the maintenance information stored in the maintenance information storage unit.
9. The apparatus state estimation device according to claim 1 ,
wherein the remaining life calculation unit determines whether or not a low cycle fatigue (LCF) life consumption rate being the parameter related to the crack occurrence is 1 or more, and
the remaining life calculation unit calculates the parameter related to the crack growth in a case where the LCF life consumption rate indicates an occurrence of a crack in the target apparatus.
10. An apparatus state estimation method comprising:
a step of acquiring a temperature of a target apparatus;
a step of specifying a stress width for each cycle of stress fluctuation of the target apparatus, based on a change width of the temperature; and
a step of calculating a parameter related to a crack occurrence for a remaining life of the target apparatus from the stress width specified, based on a relationship between the stress width and a number of life cycles related to crack occurrence in the target apparatus, and calculating a parameter related to a crack growth for the remaining life of the target apparatus from the stress width specified, based on a relationship between a crack length to be formed per unit cycle,
wherein the step of calculating comprises calculating the parameter related to the crack growth in a case where the parameter related to the crack occurrence indicates an occurrence of a crack in the target apparatus.
11. A non-transitory computer-readable computer medium storing a program causing a computer to function as:
a state quantity acquisition unit that is configured to acquire a temperature of a target apparatus;
a load specification unit that is configured to specify a stress width for each cycle of stress fluctuation of the target apparatus, based on a change width of the temperature; and
a remaining life calculation unit that is configured to calculate a parameter related to a crack occurrence for a remaining life of the target apparatus from the stress width specified, based on a relationship between the stress width and a number of life cycles related to crack occurrence in the target apparatus, and calculate a parameter related to a crack growth for the remaining life of the target apparatus from the stress width specified, based on a relationship between a crack length to be formed per unit cycle,
wherein the remaining life calculation unit calculates the parameter related to the crack growth in a case where the parameter related to the crack occurrence indicates an occurrence of a crack in the target apparatus.