Method of forming nitride film
A method of forming a nitride film wherein (a) a silane-based gas is supplied to a processing chamber through a gas supply port; (b) a nitrogen radical gas from a radical generator is supplied to the processing chamber through a radical gas pass-through port; and (c) the silane-based gas supplied in (a) is reacted with the nitrogen radical gas supplied in (b), without causing a plasma phenomenon in the processing chamber, to form a nitride film on a wafer.
1. A method of forming a nitride film on a substrate disposed in a processing chamber, the method comprising:
(a) supplying a silane-based gas to said processing chamber;
(b) supplying a nitrogen radical gas to said processing chamber; and
(c) reacting the silane-based gas supplied in (a) with the nitrogen radical gas supplied in (b), without causing a plasma phenomenon in said processing chamber, to form a nitride film on said substrate, wherein
in said reacting (c), heating treatment of heating a surface of said substrate to a temperature equal to or higher than a temperature at which the silane-based gas decomposes is further performed, and
said supplying (b) includes generating a nitrogen radical gas from a nitrogen gas in a radical generator disposed separately from said processing chamber and supplying the nitrogen radical gas to said processing chamber.
2. The method of claim 1 , further comprising:
(d) supplying hydrogen to said processing chamber.
3. The method of claim 1 , wherein
the nitrogen radical gas is generated in a state of 400° C. or lower by heating said radical generator.
4. The method of claim 3 , wherein
said radical generator obtains the nitrogen radical gas by forming a discharge space between a pair of electrodes facing each other via a dielectric, applying an AC voltage to between said pair of electrodes to generate a dielectric barrier discharge in said discharge space, and allowing the nitrogen gas to pass through said discharge space.