IP Library Granted Patent US 11,224,879
Granted Patent B2
US 11,224,879 · App. 16/482,293 · Granted Jan 18, 2022

Inspection chip and inspection system

Inventors: Takatoshi Kaya (Inagi, JP); Tomonori Kaneko (Hachioji, JP)
Assignee: Konica Minolta, Inc.
B01L3/508G01N21/01G01N21/6428G01N21/658B01L2200/025B01L2200/06B01L2200/14B01L2300/06B01L2300/0627B01L2300/0832B01L2300/0851B01L2300/0858B01L2300/12B01L2300/16B01L2300/168G01N2201/023G01N2201/0638
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Quick Facts
Patent No.
US 11,224,879
App. No.
16/482,293
Granted
Jan 18, 2022
Kind
B2
Abstract

An inspection chip according to the present invention is an inspection chip for stirring liquid by a circular movement of a bottom surface end, including a well main body for accommodating the liquid and a side wall member arranged on a side surface of the well main body. The bottom surface end has a bottom surface structure in contact with a rotating member for allowing the bottom surface end to perform the circular movement in a position leaning from a center line of the well main body toward the side wall member.

Claims (37)

1. An inspection chip accommodating liquid therein for stirring the liquid by circular movement of a bottom surface at an end of a well main body, the inspection chip comprising:

the well main body for accommodating the liquid; and

a side wall member arranged on a side surface of the well main body,

wherein the bottom surface end includes a curved bottom surface structure in which a tip of the bottom surface is in contact with a rotating member, and wherein said bottom surface is configured to perform the circular movement about a longitudinal axis offset from a center line of the well main body in a direction toward the side wall member.

2. The inspection chip according to claim 1 , wherein the bottom surface structure is formed such that a position in contact with the rotating member is present on an axis on which a center of gravity of an entire inspection chip is present, the axis parallel with the center line.

3. The inspection chip according to claim 1 , wherein a shape of the bottom surface structure is a curved surface.

4. The inspection chip according to claim 1 , wherein the well main body has a vertically long shape.

5. The inspection chip according to claim 4 , wherein the well main body has a tubular shape in which the bottom surface end is closed by the bottom surface structure.

6. The inspection chip according to claim 5 , wherein the well main body is a cylinder.

7. The inspection chip according to claim 1 , wherein the side wall member includes an optical element.

8. The inspection chip according to claim 7 , wherein the side wall member includes a prism.

9. The inspection chip according to claim 8 ,

wherein the well main body has a through hole on a side surface,

a metal film is formed on one surface of the prism, and

the metal film is exposed inside the well main body in the through hole.

10. The inspection chip according to claim 9 , wherein a ligand molecule for capturing a substance to be detected is immobilized on the metal film exposed to the inside of the well main body.

11. An inspection system using the inspection chip according to claim 1 , the system comprising:

a light source that emits light to the inspection chip;

a detector that measures light to be measured emitted from the inspection chip; and

a stirring device that includes the rotating member.

12. The inspection system according to claim 11 , further comprising:

a conveyer that conveys the inspection chip,

wherein the conveyer conveys the inspection chip and arranges the inspection chip in a predetermined position according to progress of the inspection.

13. The inspection chip according to claim 2 , wherein a shape of the bottom surface structure is a curved surface.

14. The inspection chip according to claim 2 , wherein the well main body has a vertically long shape.

15. The inspection chip according to claim 2 , wherein the side wall member includes an optical element.

16. An inspection system using the inspection chip according to claim 2 , the system comprising:

a light source that emits light to the inspection chip;

a detector that measures light to be measured emitted from the inspection chip; and

a stirring device that includes the rotating member.

17. The inspection chip according to claim 3 , wherein the well main body has a vertically long shape.

18. The inspection chip according to claim 3 , wherein the side wall member includes an optical element.

19. An inspection system using the inspection chip according to claim 3 , the system comprising:

a light source that emits light to the inspection chip;

a detector that measures light to be measured emitted from the inspection chip; and

a stirring device that includes the rotating member.

20. The inspection chip according to claim 4 , wherein the side wall member includes an optical element.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 21, 2022
From: KONICA MINOLTA, INC.
To: OTSUKA PHARMACEUTICAL CO., LTD.
Reel/Frame 059747/0589 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2019
From: KAYA, TAKATOSHI; KANEKO, TOMONORI
To: KONICA MINOLTA, INC.
Reel/Frame 049911/0085 →
Priority Claims (1)
JP JP2017-025823 · Feb 15, 2017 · national
Continuity (1)
Related Publication 20190344261A1 · Nov 14, 2019