System and methods for extracting correlation curves for an organic light emitting device

1. A method for compensating of aging effects in a display system comprising a plurality of organic light emitting diode (OLED) based pixels configured to display images, the method comprising:

storing, in a computer-readable non-transitory memory device, characterization data for a first stress condition, said characterization data obtained using a reference device and characterizing the first stress condition;

determining a stress condition on a pixel of the OLED based pixels resulting from operation of the display system;

determining a compensation factor based on the determined stress condition and the characterization data for the first stress condition; and

adjusting a programming of the pixel based on the compensation factor.

2. The method of claim 1 comprising obtaining the characterization data during normal operation of the display system.

3. The method of claim 1 wherein obtaining the characterization data comprises a use of the reference device that is not part of the plurality of OLED based pixels configured to display images.

4. The method of claim 1 comprising:

determining a baseline optical characteristic and/or a baseline electrical characteristic for the reference device for the first stress condition,

repeatedly measuring at least one of: an output voltage to determine an electrical characteristic of the reference device, and the luminance of the reference device to determine an optical characteristic of the reference device;

determining the characterization data characterizing the first stress condition based on the baseline optical characteristic and/or the baseline optical characteristic and the determined electrical and/or optical characteristics of the reference device; and

storing the characterization data characterizing the first stress condition.

5. The method of claim 1 comprising:

performing periodic measurements on the reference device under the first stress condition to determine at least one of electrical and optical characteristics of the reference device, and

determining the characterization data based on the determined at least one of the electrical and optical characteristics of the reference device and at least one of baseline electrical and baseline optical characteristics for the first stress condition.

6. The method of claim 5 wherein the reference device comprises a reference pixel comprising an OLED and a drive transistor, wherein the baseline electrical characteristic is determined from measuring a property of the drive transistor and the OLED of the reference pixel.

7. The method of claim 6 further comprising:

applying the first stress condition to the reference pixel;

repeatedly measuring an output voltage based on a reference current to determine an electrical characteristic of the reference pixel;

repeatedly measuring the luminance of the reference pixel to determine an optical characteristic of the reference pixel; and

determining the characterization data with use of the electrical and optical characteristic of the reference pixel.

8. The method of claim 6 comprising using the reference pixel that is not part of the plurality of OLED based pixels for displaying an image.

9. The method of claim 5 wherein the baseline optical characteristic and/or the baseline electrical characteristic for the reference device are determined from measurements of a base device.

10. The method of claim 5 , wherein the baseline optical characteristic and/or the baseline electrical characteristic for the reference device are determined from measurements of the reference device soon after fabrication of the reference device while the reference device does not exhibit aging effects.

11. The method of claim 4 , wherein the luminance characteristic is measured by a photo sensor disposed in proximity to the reference device.

12. A display system configured for compensating of aging effects, comprising:

a plurality of pixels configured to display images, each said pixel comprising an organic light emitting diode (OLED);

a memory configured to store characterization data for a pixel stress condition; and

a controller coupled to the plurality of pixels, the controller configured to determine a stress condition on a pixel of the plurality of pixels, and to determine a compensation factor for a programming based on the characterization data.

13. The display system of claim 12 further comprising a reference device configured for determining the characterization data.

14. The display system of claim 13 wherein the reference device is not part of the plurality of pixels configured to display images.

15. The display system of claim 14 wherein the reference device comprises a reference pixel comprising an OLED and a drive transistor.

16. The display system of claim 15 including a photo sensor optically coupled to the OLED of the reference pixel and configured to measure the luminance of the reference pixel.

17. A method for compensating of aging effects in a display system comprising a plurality of organic light emitting diode (OLED) based pixels configured to display images, the method comprising:

performing measurements on a reference device under a reference stress condition to obtain characterization data, wherein the reference device is not part of the plurality of OLED based pixels configured to display images;

determining a stress condition on a pixel of the OLED pixels resulting from displaying images during operation of the display system,

determining a compensation factor to apply to a programming of the pixel based on the characterization data, and

adjusting the programming of the pixel based on the compensation factor.