Method of estimating a condition parameter of a laser diode with an associated photodiode, apparatus for monitoring the operation of such laser diode and particular sensor apparatus
The present invention provides a method for estimating a condition parameter of a laser diode having an associated photodiode, to an apparatus for monitoring the operation of such a laser diode, and to a particle sensor apparatus. The photodiode (PD) is operable together with the laser diode (LD), wherein it detects the light (LS) of the laser diode (LD) and converts it into an electrical current, and is thermally coupled to the laser diode (LD). The at least one condition parameter is estimated during the operation of the laser diode (LD) and the estimation is based on current measurements and/or voltage measurements at the laser diode (LD) and/or at the photodiode (PD).
1. A method for estimating at least one condition parameter of at least one laser diode, wherein at least one photodiode is associated with the laser diode
which is operable together with the laser diode,
which detects the light of the laser diode and converts it into an electrical current IPD, and
which is thermally coupled to the laser diode,
wherein the at least one condition parameter includes a total cumulative operating time t of the laser diode and is estimated during the operation of the laser diode, wherein the estimation is based on current measurements and/or voltage measurements at the laser diode and/or at the photodiode.
2. The method as claimed in claim 1 , wherein the laser diode having the associated photodiode is a laser diode having an integrated photodiode in particular a VCSEL (vertical-cavity surface-emitting laser) having an integrated photodiode.
3. The method as claimed in claim 1 , wherein a laser diode temperature TLD of the laser diode is estimated as an additional one of the at least one condition parameter of the laser diode by way of
determining the slope PDSlope of the photodiode characteristic at the laser diode temperature TLD to be determined for at least two different values of the laser diode current ILD using measurements of the photodiode current IPD, and
by basing the estimation of the laser diode temperature TLD on a previously determined relationship between the slope PDSlope of the photodiode characteristic and the laser diode temperature TLD.
4. The method as claimed in claim 1 , wherein a laser diode temperature TLD of the laser diode is estimated as an additional one of the least one condition parameter of the laser diode by way of
capturing the laser diode voltage ULD for at least one specified laser diode current ILDV at the laser diode temperature TLD that is to be estimated, and
basing the estimation of the laser diode temperature TLD on a previously determined relationship between the predetermined laser diode current ILDV, the laser diode voltage ULD, and the laser diode temperature TLD.
5. The method as claimed in claim 4 , wherein the laser diode temperature TLD is estimated as
TLD= a +( b −ULD(ILDV))* d
wherein a, b and d are previously determined constants.
6. The method as claimed in claim 4 , wherein the total cumulative operating time t of the laser diode is known, and the laser diode temperature TLD is estimated as
TLD= a +( b −ULD(ILDV))*(1 −c *exp(− t/t 0))* d
wherein a, b, c and d are previously determined constants, and t0 is a previously determined operating duration that is characteristic of the aging of the laser diode.
7. The method as claimed in claim 1 , wherein the total cumulative operating time t is estimated as the condition parameter of the laser diode by way of
capturing the laser diode voltage ULD for at least one specified laser diode current ILDV at a known laser diode temperature TLD, and
basing the estimation of the total cumulative operating time t of the laser diode on a previously determined relationship between the laser diode current ILD, the laser diode voltage ULD, the laser diode temperature TLD, and the total cumulative operating time t of the laser diode.
8. The method as claimed in claim 7 , wherein the degradation of the laser diode is assessed on the basis of the estimated total cumulative operating time t.
9. The method as claimed in claim 1 , wherein the a total cumulative operating time t is estimated as the condition parameter of the laser diode by way of
determining a respective instantaneous photodiode characteristic by way of measurements of the photodiode current IPD in dependence on the laser diode current ILD,
ascertaining the instantaneous threshold current Ith of the laser diode from the respective instantaneous photodiode characteristic and
estimating the total cumulative operating time t of the laser diode on the basis of the respective instantaneous threshold current Ith.
10. The method as claimed in claim 9 , wherein the instantaneous threshold current Ith is ascertained
by capturing first photodiode current values IPD 1 , IPD 2 for at least two laser diode current values ILD 1 , ILD 2 at which the laser diode is not yet in laser operation,
by capturing second photodiode current values IPD 3 , IPD 4 for at least two laser diode current values ILD 3 , ILD 4 at which the laser diode is in laser operation,
by in each case linearly extrapolating the first photodiode current values IPD 1 , IPD 2 and the second photodiode current values IPD 3 , IPD 4 , and
by determining the intersection of the two resulting straight lines g and h as the instantaneous threshold current Ith.
11. The method as claimed in claim 9 , wherein the instantaneous threshold currents Ith1, Ith2 for at least two laser diodes are ascertained, and wherein the total cumulative operating times t1, t2 of the two individual laser diodes are correlated with one another by comparing the instantaneous threshold currents Ith1, Ith2 that were ascertained for the two individual laser diodes.