IP Library Granted Patent US 10,964,630
Granted Patent B2
US 10,964,630 · App. 16/527,448 · Granted Mar 30, 2021

Semiconductor device having a conductor plate and semiconductor elements

Inventors: Takanori Kawashima (Anjo, JP); Makoto Imai (Toyota, JP); Masaki Aoshima (Toyota, JP)
Assignee: DENSO CORPORATION
H01L23/49575H01L23/492H01L23/49531H01L23/49562H01L24/48H01L29/1608H01L29/7393H01L29/78H01L29/861H01L2224/48153
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,964,630
App. No.
16/527,448
Granted
Mar 30, 2021
Kind
B2
Abstract

A semiconductor device may include a first conductor plate on which a first semiconductor element, a second semiconductor element and a first circuit board are disposed, and a plurality of first signal terminals. A size of the second semiconductor is smaller than a size of the first semiconductor element. In a plan view along a direction perpendicular to the first conductor plate, the plurality of first signal terminals is located in a first direction with respect to the first semiconductor element. The second semiconductor element and the first circuit board are located between the plurality of first signal terminals and the first semiconductor element and are arranged along a second direction that is perpendicular to the first direction. A signal pad of the first semiconductor element is connected to a corresponding one of the plurality of first signal terminals via a signal transmission path of the first circuit board.

Claims (44)

1. A semiconductor device comprising:

a first conductor plate;

a first semiconductor element disposed on the first conductor plate;

a second semiconductor element disposed on the first conductor plate, a size of the second semiconductor element being smaller than a size of the first semiconductor element;

a first circuit board disposed on the first conductor plate and including a signal transmission path which is electrically isolated from the first conductor plate; and

a plurality of first signal terminals,

wherein the first semiconductor element and the second semiconductor element each comprise a main electrode electrically connected to the first conductor plate and a signal pad electrically connected to a corresponding one of the plurality of first signal terminals,

in a plan view, the plurality of first signal terminals is spaced from the first semiconductor element in a first direction and is arranged along a second direction that is perpendicular to the first direction,

in the plan view, the second semiconductor element and the first circuit board are located between the plurality of first signal terminals and the first semiconductor element and are arranged along the second direction, and

the signal pad of the first semiconductor element is connected to the corresponding one of the plurality of first signal terminals via the signal transmission path of the first circuit board.

2. The semiconductor device according to claim 1 , further comprising a second conductor plate opposed to the first conductor plate, wherein the first semiconductor element and the second semiconductor element each comprise another main electrode which is electrically connected to the second conductor plate.

3. The semiconductor device according to claim 2 , further comprising:

a third conductor plate located in the second direction with respect to the first conductor plate,

a third semiconductor element disposed on the third conductor plate;

a fourth semiconductor element disposed on the third conductor plate, a size of the fourth semiconductor element being smaller than a size of the third semiconductor element;

a second circuit board disposed on the third conductor plate and including a signal transmission path which is electrically isolated from the third conductor plate; and

a plurality of second signal terminals,

wherein the third semiconductor element and the fourth semiconductor element each comprise a main electrode electrically connected to the third conductor plate and a signal pad electrically connected to a corresponding one of the plurality of second signal terminals,

in the plan view, the plurality of second signal terminals is spaced from the third semiconductor element in the first direction and is arranged along the second direction,

in the plan view, the fourth semiconductor element and the second circuit board are located between the plurality of second signal terminals and the third semiconductor element and are arranged along the second direction, and

the signal pad of the third semiconductor element is connected to the corresponding one of the plurality of second signal terminals via the signal transmission path of the second circuit board.

4. The semiconductor device according to claim 3 , further comprising a fourth conductor plate opposed to the third conductor plate, wherein the third semiconductor element and the fourth semiconductor element each comprise another main electrode which is electrically connected to the fourth conductor plate.

5. The semiconductor device according to claim 3 , wherein

the third conductor plate is connected to the second conductor plate via a first connector portion, and

in the plan view, the first connector portion is located between the second semiconductor element and the fourth semiconductor element.

6. The semiconductor device according to claim 3 , wherein a layout of the first semiconductor element, the second semiconductor element and the first circuit board on the first conductor plate is bisymmetric with a layout of the third semiconductor element, the fourth semiconductor element and the second circuit board on the third conductor plate.

7. The semiconductor device according to claim 6 , wherein

the first semiconductor element and the third semiconductor element are first-kind semiconductor elements including a same configuration as each other,

the first-kind semiconductor elements each comprise a plurality of signal pads that is arranged along the second direction,

the plurality of signal pads comprises a pair of the signal pads having a same function, and

the pair of the signal pads is located bisymmetrically in an arrangement of the plurality of signal pads.

8. The semiconductor device according to claim 3 , wherein a layout of the first semiconductor element, the second semiconductor element and the first circuit board on the first conductor plate is identical with a layout of the third semiconductor element, the fourth semiconductor element and the second circuit board on the third conductor plate.

9. The semiconductor device according to claim 1 , wherein a bandgap of a semiconductor substrate of the second semiconductor element is wider than a bandgap of a semiconductor substrate of the first semiconductor element.

10. The semiconductor device according to claim 9 , wherein

the semiconductor substrate of the first semiconductor element is a silicon substrate, and

the semiconductor substrate of the second semiconductor element is a silicon carbide substrate.

11. The semiconductor device according to claim 1 , further comprising:

a first bonding wire connecting between one of the plurality of first signal terminals and the signal transmission path of the first circuit board; and

a second bonding wire connecting between another one of the plurality of first signal terminals and the signal pad of the second semiconductor element,

wherein the first bonding wire extends so as to be away from the second bonding wire as the first bonding wire approaches the first circuit board.

12. The semiconductor device according to claim 1 , wherein a dimension of the second semiconductor element in the first direction is equal to a dimension of the first circuit board in the first direction.

13. The semiconductor device according to claim 1 , wherein a dimension of the second semiconductor element in the second direction is equal to a dimension of the first circuit board in the second direction.

14. The semiconductor device according to claim 1 , wherein an interval between the first semiconductor element and the second semiconductor element in the first direction is equal to an interval between the first semiconductor element and the first circuit board in the first direction.

15. The semiconductor device according to claim 1 , wherein the second semiconductor element and the first circuit board are located within a region defined by virtually expanding the first semiconductor element in the first direction.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: TOYOTA JIDOSHA KABUSHIKI KAISHA
To: DENSO CORPORATION
Reel/Frame 052285/0419 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2019
From: KAWASHIMA, TAKANORI; IMAI, MAKOTO; AOSHIMA, MASAKI
To: TOYOTA JIDOSHA KABUSHIKI KAISHA
Reel/Frame 049916/0450 →