IP Library Granted Patent US 10,872,830
Granted Patent B2
US 10,872,830 · App. 16/529,295 · Granted Dec 22, 2020

Power semiconductor module with short circuit failure mode

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Quick Facts
Patent No.
US 10,872,830
App. No.
16/529,295
Granted
Dec 22, 2020
Kind
B2
Abstract

A power semiconductor device includes a base plate; a Si chip including a Si substrate, the Si chip attached to the base plate; a first metal preform pressed with a first press pin against the Si chip; a wide bandgap material chip comprising a wide bandgap substrate and a semiconductor switch provided in the wide bandgap substrate, the wide bandgap material chip attached to the base plate; and a second metal preform pressed with a second press pin against the wide bandgap material chip; the Si chip and the wide bandgap material chip are connected in parallel via the base plate and via the first press pin and the second press pin; the first metal preform is adapted for forming a conducting path through the Si chip, when heated by an overcurrent; and the second metal preform is adapted for forming an temporary conducting path through the wide bandgap material chip or an open circuit, when heated by an overcurrent.

Claims (43)

1. A power semiconductor module, comprising:

a base plate;

a Si chip comprising a Si substrate, the Si chip attached to the base plate;

a first metal preform pressed with a first press pin against a side of the Si chip;

a wide bandgap material chip comprising a wide bandgap substrate and a semiconductor switch provided in the wide bandgap substrate, the wide bandgap material chip attached to the base plate;

a second metal preform pressed with a second press pin against a side of the wide bandgap material chip;

wherein the Si chip and the wide bandgap material chip are connected in parallel via the base plate and via the first press pin and the second press pin;

wherein the first metal preform is adapted for forming a conducting path through the Si chip by forming an alloy with the Si substrate, when heated by an overcurrent;

wherein the second metal preform, which is made of a material with a higher melting point as a material of the first metal preform, is adapted for forming an at least temporary conducting path through the wide bandgap material chip, when heated by an overcurrent.

2. The power semiconductor module of claim 1 ,

wherein the second metal preform is adapted for forming an at least temporary conducting path through the wide bandgap material chip by at least partially being melted by the overcurrent.

3. The power semiconductor module of claim 1 ,

wherein the first metal preform is made of Al, Cu, Ag, Mg or an alloy thereof.

4. The power semiconductor module of claim 1 ,

wherein the second metal preform is made of Mo, W or an alloy thereof.

5. The power semiconductor module of claim 1 ,

wherein the base plate is made of Mo.

6. The power semiconductor module of claim 1 ,

wherein the wide bandgap material of the wide bandgap material chip is SiC.

7. The power semiconductor module of claim 1 ,

wherein the Si chip comprises a semiconductor switch provided in the Si substrate.

8. The power semiconductor module of claim 7 ,

wherein a gate of the semiconductor switch of the Si chip is electrically connected in the semiconductor module with a gate of the semiconductor switch of the wide bandgap material chip.

9. The power semiconductor module of claim 7 ,

wherein a gate of the semiconductor switch of the Si chip is electrically connected to a first gate terminal of the semiconductor module and a gate of the semiconductor switch of the wide bandgap material chip is electrically connected to a second gate terminal of the semiconductor module, such that the semiconductor switch of the Si chip is switchable independently of the semiconductor switch of the wide bandgap material chip.

10. The power semiconductor module of claim 7 ,

wherein a gate of the semiconductor switch of the Si chip is not connected to a gate terminal provided by the semiconductor module.

11. The power semiconductor module of claim 1 ,

wherein the Si chip does not comprise an active switchable switch.

12. The power semiconductor module of claim 1 ,

wherein the Si chip is a passive Si layer.

13. The power semiconductor module of claim 1 ,

wherein the power semiconductor module comprises at least two wide bandgap material chips connected in parallel with the Si chip.

14. The power semiconductor module of claim 1 , further comprising:

an electrically conducting top plate connected to the first press pin and the second press pin.

15. The power semiconductor module of claim 1 ,

wherein at least one of the first press pin and the second press pin comprises a spring element.

16. The power semiconductor module of claim 2 , wherein the first metal preform is made of Al, Cu, Ag, Mg or an alloy thereof.

17. The power semiconductor module of claim 1 , wherein the second metal preform is made of Mo, W or an alloy thereof; and

wherein the base plate is made of Mo.

18. The power semiconductor module of claim 2 , wherein the wide bandgap material of the wide bandgap material chip is SiC.

19. The power semiconductor module of claim 2 , wherein the Si chip comprises a semiconductor switch provided in the Si substrate.

20. The power semiconductor module of claim 17 , wherein the wide bandgap material of the wide bandgap material chip is SiC.

Assignments (4)
MERGER Recorded Nov 13, 2023
From: HITACHI ENERGY SWITZERLAND AG
To: HITACHI ENERGY LTD
Reel/Frame 065548/0905 →
CHANGE OF NAME Recorded Dec 31, 2021
From: ABB POWER GRIDS SWITZERLAND AG
To: HITACHI ENERGY SWITZERLAND AG
Reel/Frame 058666/0540 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 15, 2021
From: ABB SCHWEIZ AG
To: ABB POWER GRIDS SWITZERLAND AG
Reel/Frame 055585/0670 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2020
From: RAHIMO, MUNAF; LIU, CHUNLEI; SCHUDERER, JÜRGEN; BREM, FRANZISKA; STEIMER, PETER KARL; DUGAL, FRANC
To: ABB SCHWEIZ AG
Reel/Frame 054255/0465 →