IP Library Granted Patent US 10,943,651
Granted Patent B2
US 10,943,651 · App. 16/529,644 · Granted Mar 9, 2021

Semiconductor memory device, memory system, and write method

Inventors: Noboru Shibata (Kanagawa, JP); Yasuyuki Matsuda (Kanagawa, JP)
Assignee: TOSHIBA MEMORY CORPORATION
G11C11/5628G11C11/4085G11C11/565G11C16/08G11C16/10
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Quick Facts
Patent No.
US 10,943,651
App. No.
16/529,644
Granted
Mar 9, 2021
Kind
B2
Abstract

According to one embodiment, a memory system includes a semiconductor memory device including a memory cell capable of holding at least 4-bit data and a controller configured to control a first write operation and a second write operation based on the 4-bit data. The controller includes a conversion circuit configured to convert 4-bit data into 2-bit data. The semiconductor memory device includes a recovery controller configured to recover the 4-bit data based on the converted 2-bit data and data written in the memory cell by the first write operation. The first write operation is executed based on the 4-bit data received from the controller, and the second write operation is executed based on the 4-bit data recovered by the recovery controller.

Claims (18)

1. A memory system comprising:

a semiconductor memory device having a memory cell array including a memory cell capable of holding at least 4-bit data; and

a controller configured to control a first write operation and a second write operation based on the 4-bit data in the semiconductor memory device,

wherein the controller includes a conversion circuit configured to convert the 4-bit data into 2-bit data,

the semiconductor memory device includes a recovery controller configured to recover the 4-bit data based on the converted 2-bit data and data written in the memory cell by the first write operation,

the first write operation is executed based on the 4-bit data received from the controller, and

the second write operation is executed based on the 4-bit data recovered by the recovery controller.

2. The system according to claim 1 , wherein

when the controller gives an instruction on execution of the second write operation, the semiconductor memory device sequentially executes read operation of the memory cell, recovery operation of the 4-bit data, and the second write operation.

3. The system according to claim 1 , wherein

a threshold voltage of the memory cell is included in any one of a plurality of threshold distributions corresponding to the 4-bit data, and

assignment of the 2-bit data to the plurality of threshold distributions is different by 1 bit between the threshold distributions adjacent to each other.

4. A writing method comprising:

executing a first write operation of writing 4-bit data in a memory cell,

converting the 4-bit data into 2-bit data;

reading data written by the first write operation from the memory cell;

recovering the 4-bit data based on the 2-bit data and the data read from the memory cell; and

executing a second write operation for the memory cell based on the recovered 4-bit data.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058905/0582 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 27, 2020
From: SHIBATA, NOBORU; MATSUDA, YASUYUKI
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 052244/0314 →