Digital circuit to detect presence and quality of an external timing device
A system for determine presence or quality of an external timing device is provided. The system may include a circuit (e.g., in a field-programmable gate array (FPGA)) having an input, an oscillator, an edge detector, a bit counter, and a calculator element. In some examples, the input may receive an input signal under test. The oscillator may advance a timer at a known rate to facilitate generation of clock samples for the input signal under test. The edge detector may measure edges of the input signal under test based on the clock samples. The circuit may include at least one bit counter to store a count associated with the measured edges for a shorter interval timer period and a longer interval timer period. The calculator element may determine presence or quality of an external timing device based on the count.
1. A circuit, comprising:
an input to receive an input signal under test;
an oscillator to advance a timer at a known rate to facilitate generation of clock samples for the input signal under test
an edge detector to measure edges of the input signal under test based on the clock samples;
a bit counter to store a count associated with the measured edges for a shorter interval timer period and a longer interval timer period, wherein the count comprises a maximum count and a minimum count for each of the shorter interval timer period and the longer interval timer period; and
a calculator element to determine presence or quality of an external timing device based on the count.
2. The circuit of claim 1 , wherein the input signal under test is undriven or driven by a clock waveform.
3. The circuit of claim 1 , wherein the calculator element is a subtractor to determine difference values between the maximum count and the minimum count for each of the shorter interval timer period and the longer interval timer period.
4. The circuit of claim 3 , wherein the subtractor determines a noise estimate of a mean period of the input signal under test by comparing the determined difference values against a predetermined threshold.
5. The circuit of claim 4 , wherein the noise estimate is based on a distribution of means in accordance with the following expression:
σ
M
=
σ
N
,
where σ represents noise in the input signal under test, σ M represents noise in an estimated mean, and N represents a number of clock samples.
6. The circuit of claim 4 , wherein the external timing device is present or of high quality in an event the determined difference values do not exceed the predetermined threshold, and wherein the external timing device is not present or of low quality in an event the determined difference values exceed the predetermined threshold.
7. A method for detecting an external timing device, comprising:
receiving, at an input, an input signal under test;
advancing, via an oscillator, a timer at a known rate to facilitate generation of clock samples for the input signal under test
measure, by an edge detector, edges of the input signal under test based on the clock samples;
storing, by a bit counter, a count associated with the measured edges for a shorter interval timer period and a longer interval timer period, wherein the count comprises a maximum count and a minimum count for each of the shorter interval timer period and the longer interval timer period; and
determining, by a calculator element, presence or quality of an external timing device based on the count.
8. The method of claim 7 , wherein the input signal under test is undriven or driven by a clock waveform.
9. The method of claim 7 , wherein the calculator element is a subtractor to determine difference values between the maximum count and the minimum count for each of the shorter interval timer period and the longer interval timer period.
10. The method of claim 9 , wherein the subtractor determines a noise estimate of a mean period of the input signal under test by comparing the determined difference values against a predetermined threshold.
11. The method of claim 10 , wherein the noise estimate is based on a distribution of means in accordance with the following expression:
σ
M
=
σ
N
,
where σ represents noise in the input signal under test, σ M represents noise in an estimated mean, and N represents a number of clock samples.
12. The method of claim 10 , wherein the external timing device is present or of high quality in an event the determined difference values do not exceed the predetermined threshold, and wherein the external timing device is not present or of low quality in an event the determined difference values exceed the predetermined threshold.
13. A non-transitory computer-readable storage medium having an executable stored thereon, which when executed instructs a processor to:
receive an input signal under test;
advance a timer at a known rate to facilitate generation of clock samples for the input signal under test
measure edges of the input signal under test based on the clock samples; store a count associated with the measured edges for a shorter interval timer period and a longer interval timer period, wherein the count comprises a maximum count and a minimum count for each of the shorter interval timer period and the longer interval timer period; and
determine presence or quality of an external timing device based on the count.
14. The non-transitory computer-readable storage medium of claim 13 , wherein determining presence or quality of an external timing device is based on calculating difference values between the maximum count and the minimum count for each of the shorter interval timer period and the longer interval timer period.
15. The non-transitory computer-readable storage medium of claim 14 , further comprising:
determining a noise estimate of a mean period of the input signal under test by comparing the calculated difference values against a predetermined threshold.
16. The non-transitory computer-readable storage medium of claim 15 , wherein the noise estimate is based on a distribution of means in accordance with the following expression:
σ
M
=
σ
N
,
where σ represents noise in the input signal under test, σ M represents noise in an estimated mean, and N represents a number of clock samples.
17. The non-transitory computer-readable storage medium of claim 15 , wherein the external timing device is present or of high quality in an event the calculated difference values do not exceed the predetermined threshold, and wherein the external timing device is not present or of low quality in an event the calculated difference values exceed the predetermined threshold.