Automatic test system and method thereof
View Patent ↗An automatic test system suitable for testing a server comprises a storage device, a computing device, and a sensing device. The storage device stores an automatic test script. The sensing device collects a plurality of test results of the server. The automatic test script comprises a parameter configuration module, a data processing module, and a core logic module. The parameter configuration module provides a plurality of configuration parameters associated with a server test procedure. The data processing module comprises a data recording sub-module and a data sorting sub-module, while the former receives an output data set from the server test procedure, and the latter generates a test report according to the output data set and the configuration parameters. The core logic module comprises a plurality of instruction sets for controlling the server test procedure through a data exchange interface.
1. An automatic test system adapted to test a server, comprising:
a storage device configured to store an automatic test script, wherein the automatic test script comprises:
a parameter configuration module is to provide a plurality of configuration parameters, the plurality of configuration parameters is associated with a server test procedure;
a data processing module comprising a data recording sub-module and a data sorting sub-module, wherein the data recording sub-module is to receive an output data set from the server test procedure, and the data sorting sub-module is to generate a test report according to the output data set and the plurality of configuration parameters; and
a core logic module comprising a plurality of instruction sets, wherein the plurality of instruction sets is to control the server test procedure through a data exchange interface;
a computing device communicatively connecting to the storage device, wherein the computing device is configured to execute the server test procedure on the server according to the automatic test script; and
a sensing device communicatively connecting to the storage device and the computing device, wherein the sensing device is configured to collect a plurality of test results of the server;
wherein the computing device operating the server test procedure is further configured to convert the plurality of test results into the output data set;
wherein the plurality of configuration parameters comprises an installation path, a time interval, an outputting path of a log file, a prefix file name of the log file, a starting percentage, an ending percentage, and a circular increase;
wherein one of the plurality of instruction sets is a stress test instruction set, and the core logic module further calculates a number of executions according to the starting percentage, the ending percentage, and the circular increase, and repeatedly executes the server test procedure according to the stress test instruction set and the number of executions.
2. The automatic test system of claim 1 , wherein the data processing module further receives an evaluation score generated by the server test procedure during an execution of the stress test instruction set.
3. The automatic test system of claim 1 , wherein the test report shows a fan working period, a server power consumption, a processor power consumption, a Dual In-line Memory Module (DIMM) power consumption, a fan rotating speed, an environment temperature, a DIMM temperature, and a processor temperature in a tabular form.
4. An automatic test method adapted to an automatic test system performing a test to a server, with the method comprising:
setting at least one of a plurality of configuration parameters by a parameter configuration module of the automatic test system, wherein said at least one of the plurality of configuration parameters is associated with a server test procedure;
selectively receiving and storing a customized code by a data processing module of the automatic test system;
executing at least one of a plurality of instruction sets by a core logic module of the automatic test system through a data exchange interface to control the server test procedure; and
after the server test procedure is finished, receiving an output data set from the data exchange interface by a data recording sub-module of the data processing module, generating a test report by a data sorting sub-module of the data processing module according to the output data set and the plurality of configuration parameters;
wherein the plurality of configuration parameters comprises an installation path, a time interval, an outputting path of a log file, a prefix file name of the log file, a starting percentage, an ending percentage, and a circular increase;
wherein one of the plurality of instruction sets is a stress test instruction set, and the core logic module further calculates a number of executions according to the starting percentage, the ending percentage, and the circular increase, and repeatedly executes the server test procedure according to the stress test instruction set and the number of executions.
5. The automatic test method of claim 4 , wherein the output data set further comprises an evaluation score received from the data exchange interface during an execution of the stress test instruction set.
6. The automatic test method of claim 4 , wherein the test report shows a fan working period, a server power consumption, a processor power consumption, a Dual In-line Memory Module (DIMM) power consumption, a fan rotating speed, an environment temperature, a DIMM temperature and a processor temperature in a tabular form.