IP Library Granted Patent US 10,935,483
Granted Patent B2
US 10,935,483 · App. 16/541,675 · Granted Mar 2, 2021

Optical particle sensor device and method for operating an optical particle sensor device

Inventors: Alexander Van Der Lee (Venlo, NL); Robert Weiss (Waldbronn, DE); Sören Sofke (Tübingen, DE); Hans Spruit (Waalre, NL); Jens-Alrik Adrian (Pfullingen, DE)
Assignees: Robert Bosch GmbH; TRUMPF PHOTONIC COMPONENTS GMBH
G01N15/1459G01N15/0211G01N15/1434G01N2015/03
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Quick Facts
Patent No.
US 10,935,483
App. No.
16/541,675
Granted
Mar 2, 2021
Kind
B2
Abstract

An optical particle sensor device comprises an optical emitter device for emitting a multitude of measurement laser beams; a detector device for detecting the measurement laser beams scattered on particles in the vicinity of the optical particle sensor device and for generating a single measuring signal assigned to this for each measurement laser beam; and an evaluation device for determining at least one estimated particle value for the number of particles per volume using at least one single measurement signal, wherein the evaluation device determines at least two estimated particle values for the number of particles per volume, which are based on at least partially different single measurement signals and/or a different number of single measurement signals, and on the basis of at least part of the estimated particle values, determines at least one output value for the particle load.

Claims (35)

1. An optical particle sensor device, comprising:

an optical emitter device, which is designed to emit a multitude of measurement laser beams into a vicinity of the optical particle sensor device;

a detector device, which is designed to detect the measurement laser beams scattered on particles in the vicinity of the optical particle sensor device and to generate a single measurement signal assigned to this for each measurement laser beam; and

an evaluation device, which designed to determine at least one estimated particle value for the number of particles per volume using at least one single measurement signal,

characterized in that the evaluation device is designed

a. to determine at least two estimated particle values for the number of particles per volume, which are based on at least partially different single measurement signals and/or a different number of single measurement signals and,

b. on the basis of at least part of the estimated particle values, to determine at least one output value for a particle load.

2. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to determine, on the basis of the at least two estimated particle values, a total number of particles per volume, which are used as a basis for determining the at least one output value for the particle load.

3. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to determine an estimated value for the particle load for at least part of the estimated particle values respectively and to take these estimated values for the particle load as a basis for determining the at least one output value for the particle load.

4. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to take into account status information when determining the estimated particle values, which reports the functional status of the emitter device and/or the detector device in relation to the single measurement signals, in particular a failure or an error.

5. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to determine estimated particle values

a. based on each individual single measurement signal, and/or,

b. based on each number n of different single measurement signals, wherein the number n is less than or identical to the multitude N (n≤N).

6. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to

a. compare the detected estimated particle values and/or the detected estimated values for the particle load and to weight them with regard to their deviation from a mean value of the detected estimated particle values or a mean value of the estimated values for the particle load, and

b. to take into account only those detected estimated particle values and/or detected estimated values for the particle load when determining the output value for the particle load, the deviation of which from the mean value does not exceed a specified measure.

7. The optical particle sensor device according to claim 1 , characterized in that the evaluation device is designed to take a mean value of the detected estimated particle values and/or the detected estimated values for the particle load as a basis for determining the output value for the particle load.

8. The optical particle sensor device according to claim 1 ,

a. wherein the optical emitter device comprises at least one laser diode, in particular a VCSEL, and/or the detector device comprises at least one photodiode, in particular at least one photodiode, which is integrated into the at least one laser diode,

b. wherein the evaluation device is designed to evaluate the photocurrent generated by the at least one photodiode as a single measurement signal in order to determine at least one parameter for the determination of estimated particle values, in particular a maximum amplitude of the photocurrent, a frequency, a signal-to-noise ratio and a point in time, at which the amplitude of the photocurrent exceeds a specified threshold.

9. A method for operating an optical particle sensor device

a. with an optical emitter device for emitting a multitude N of measurement laser beams into a vicinity of the optical particle sensor device,

b. with a detector device for detecting the measurement laser beams scattered on particles in the vicinity of the optical particle sensor device, wherein, for each measurement laser beam, a single measurement signal assigned to this is generated, and

c. with an evaluation device for determining at least one estimated particle value for the number of particles per volume using at least one single measurement signal,

characterized in that at least two estimated particle values are determined for the number of particles per volume, which are based on at least partially different single measurement signals and/or a different number of single measurement signals and in that, on the basis of at least part of the detected estimated particle values, at least one output value is determined for a particle load.

10. The method according to claim 9 , characterized in that, on the basis of the at least two estimated particle values, a total number of particles per volume is determined, and/or in that an estimated value for the particle load is determined for at least one part of the estimated particle values respectively, and in that the total number of particles per volume and/or these estimated values for the particle load are taken as a basis for determining the at least one output value for the particle load.

11. The method according to claim 9 , characterized in that status information is taken into account when determining the estimated particle values,

which reports the functional status of the emitter device and/or the detector device in relation to the single measurement signals, in particular a failure or an error.

12. The method according to claim 9 , characterized in that estimated particle values are determined

a. based on each individual single measurement signal, and/or

b. based on each number n of different single measurement signals, wherein the number n is less than or identical to the multitude N (n≤N).

13. The method according to claim 9 , characterized in that the detected estimated particle values are compared with each other and/or the detected estimated values for the particle load are compared with each other,

in that the detected estimated particle values are weighted with regard to their deviation from a mean value of the detected estimated particle values or a mean value of the estimated values for the particle load, and

in that the evaluation device takes into account only those detected estimated particle values and/or detected estimated values for the particle load when determining the output value for the particle load, the deviation of which from the mean value does not exceed a specified measure.

14. The method according to claim 9 , characterized in that the output value for the particle load is determined as a mean value of the detected estimated particle values and/or the detected estimated values for the particle load.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 6, 2026
From: TRUMPF PHOTONIC COMPONENTS GMBH
To: ROBERT BOSCH GMBH
Reel/Frame 073721/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2019
From: VAN DER LEE, ALEXANDER; WEISS, ROBERT; SOFKE, SÖREN; SPRUIT, HANS; ADRIAN, JENS-ALRIK
To: ROBERT BOSCH GMBH; TRUMPF PHOTONIC COMPONENTS GMBH
Reel/Frame 050946/0268 →