IP Library Granted Patent US 11,604,969
Granted Patent B2
US 11,604,969 · App. 16/553,465 · Granted Mar 14, 2023

Performance prediction from communication data

Inventors: Wei Cheng (Princeton Junction, NJ); LuAn Tang (Pennington, NJ); Dongjin Song (Princeton, NJ); Bo Zong (West Windsor, NJ); Haifeng Chen (West Windsor, NJ); Jingchao Ni (Princeton, NJ); Wenchao Yu (Plainsboro, NJ)
G06N3/049G06N3/08G06N5/02
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Quick Facts
Patent No.
US 11,604,969
App. No.
16/553,465
Granted
Mar 14, 2023
Kind
B2
Abstract

Systems and methods for predicting system device failure are provided. The method includes representing device failure related data associated with the devices from a predetermined domain by temporal graphs for each of the devices. The method also includes extracting vector representations based on temporal graph features from the temporal graphs that capture both temporal and structural correlation in the device failure related data. The method further includes predicting, based on the vector representations and device failure related metrics in the predetermined domain, one or more of the devices that is expected to fail within a predetermined time.

Claims (57)

1. A method for predicting system device failure, comprising:

representing device failure related data associated with a plurality of devices from a predetermined domain by at least one temporal graph for each of the plurality of devices;

extracting, by a processor device, vector representations based on temporal graph features from the at least one temporal graph that capture both temporal and structural correlation in the device failure related data;

predicting, based on the vector representations and at least one device failure related metric in the predetermined domain, at least one of the plurality of devices that is expected to fail within a predetermined time;

outputting the at least one of the plurality of devices with a predicted device failure metric; and

replacing the at least one of the plurality of devices prior to an impending failure, based on the failure metric,

wherein representing the device failure related data further comprises:

performing, by the processor device, temporal graph construction using training data for at least one entity in a training phase to determine at least one first temporal graph; and performing temporal graph feature extraction from the at least one first temporal graph in the training phase to derive at least one first feature vector.

2. The method as recited in claim 1 , further comprising:

training, by the processor device, a plurality of models for system failure prediction via graph learning (SFPGL) for device failure prediction based on the at least one temporal graph.

3. The method as recited in claim 2 , wherein training the plurality of models further comprises:

preparing training data;

learning prediction models from the plurality of models based on the training data; and

performing model selection to find a best model of the plurality of models.

4. The method as recited in claim 1 , further comprising:

performing, by the processor device, temporal graph construction in a testing phase to determine at least one second temporal graph;

performing temporal graph feature extraction from the at least one second temporal graph in the testing phase to derive at least one second feature vector; and

performing device failure prediction based on the at least one second feature vector and outputting at least one prediction result.

5. The method as recited in claim 4 , wherein the device failure related data includes communication data and device profile data and performing temporal graph construction iii the testing phase further comprises:

encoding the communication data and the device profile data.

6. The method as recited in claim 4 , wherein performing temporal graph construction further comprises:

generating at least one multi-scale temporal graph at multiple time granularities.

7. The method as recited in claim 4 , wherein performing temporal graph feature extraction from the at least one second temporal graph further comprises

profiling a time series based on at least one of a raw value, a statistic measurement and a temporal differential measurement.

8. The method as recited in claim 4 , wherein performing temporal graph feature extraction from the at least one second temporal graph further comprises:

deriving structure features from a one-hop metric.

9. The method as r d in claim 4 , wherein performing temporal graph feature extraction from the at least one second temporal graph further comprises:

deriving structure features from a multi-hop metric.

10. The method as recited in claim 1 , wherein each at least one temporal graph is represented as a stream or graphs<G 1 to G x >, where G i is a graph that records communication data and profile data for devices at time t i .

11. The method as recited in claim 1 , wherein nodes and edges of each at least one temporal graph are associated with attributes, where node attributes include all information only relevant to a node at time t i , and edge attributes include information relevant to a corresponding communication.

12. A computer system for predicting system device failure, comprising:

a processor device operatively coupled to a memory device, the processor device being configured to:

represent device failure related data associated with a plurality of devices from a predetermined domain by at least one temporal graph for each of the plurality of devices;

extract vector representations based on temporal graph features from the at least one temporal graph that capture both temporal and structural correlation in the device failure related data;

predict, based on the vector representations and at least one device failure related metric in the predetermined domain, at least one of the plurality of devices that is expected to fail within a predetermined time; and

replace the at least one of the plurality of devices prior to an impending failure, based on the failure metric,

wherein, when representing the device failure related data, the processor device is further configured to:

perform temporal graph construction using training data for at least one entity in a training phase to determine at least one first temporal graph; and

perform temporal graph feature extraction from the at least one first temporal graph in the training phase to derive at least one first feature vector.

13. The system as recited in claim 12 , wherein the processor device is further configured to:

train a plurality of models for system failure prediction via graph learning (SFPGL) for device failure prediction based on the at least one temporal graph.

14. The system as recited in claim 12 , wherein, when raining the plurality of models, the processor device is further configured to:

prepare training data;

learn prediction models from the plurality of models based on the training data; and

perform model selection to find a best model of the plurality of models.

15. The system as recited in claim 14 , wherein the processor device is further configured to:

perform device failure prediction by feeding the vector representations into the best model.

16. The system as recited in claim 12 , wherein each at least one temporal graph is represented as a stream of graphs<G 1 to G x >, where G i is a graph that records communication data and profile data for devices at time t i .

17. The system as recited in claim 12 , wherein nodes and edges of each at least one temporal graph are associated with attributes, where node attributes include all information only relevant to a node at time t i , and edge attributes include information relevant to a corresponding communication.

18. A computer program product for predicting performance of a plurality of devices, the computer program product comprising a non-transitory computer readable storage medium having program instructions embodied therewith, the program instructions executable by a computing device to cause the computing device to perform the method comprising:

representing device failure related data associated with the plurality of devices from a predetermined domain by at least one temporal graph for each of the plurality of devices;

extracting vector representations based on temporal graph features from the at least one temporal graph that capture both temporal and structural correlation in the device failure related data;

predicting, based on the vector representations and at least one performance metric in the predetermined domain, at least one of the plurality of devices that is expected to fail within a predetermined time; and

replacing the at least one of the plurality of devices prior to an impending failure based on the failure metric,

wherein representing the device failure related data further comprises:

performing, by the processor device, temporal graph construction using training data for at least one entity in a training phase to determine at least one first temporal graph; and

performing temporal graph feature extraction from the at least one first temporal graph in the training phase to derive at least one first feature vector.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2023
From: NEC LABORATORIES AMERICA, INC.
To: NEC CORPORATION
Reel/Frame 062403/0866 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2019
From: CHENG, WEI; TANG, LUAN; SONG, DONGJIN; ZONG, BO; CHEN, HAIFENG; NI, JINGCHAO; YU, WENCHAO
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 050197/0457 →
Continuity (2)
Provisional Application 62732624 · Sep 18, 2018
Related Publication 20200090025A1 · Mar 19, 2020