Semiconductor device and memory system
According to one embodiment, in a first differential amplifier circuit of a semiconductor device, a first transistor receives an input signal at the gate. A second transistor forms a differential pair with the first transistor. The second transistor receives a reference signal at the gate. A third transistor is connected in series with the first transistor. A fourth transistor is connected in series with the second transistor. A fifth transistor is disposed on the output side. The fifth transistor forms a first current mirror circuit with the fourth transistor. A sixth transistor is connected to the drain of the second transistor in parallel with the fourth transistor. The sixth transistor forms a second current mirror circuit with the fifth transistor. A first discharge circuit is connected to the source of the sixth transistor.
1. A semiconductor device comprising:
a first differential amplifier circuit including:
a first transistor configured to receive a first input signal at a gate of the first transistor;
a second transistor connected in parallel between a source and a drain of the first transistor and configured to receive a first reference signal at a gate of the second transistor;
a third transistor, forming a differential pair with the second transistor, configured to receive the first reference signal at a gate of the third transistor;
a fourth transistor connected in parallel between a source and a drain of the third transistor and configured to receive a second reference signal at a gate of the fourth transistor, the second reference signal lower than the first reference signal;
a fifth transistor having a source connected to a power supply voltage and a drain connected to the drain of the first transistor and the second transistor at a first node; and
a sixth transistor having a source connected to the power supply voltage and a drain connected to the drain of the third transistor, a drain of the fourth transistor, and a gate of the fifth transistor at a second node.
2. The semiconductor device according to claim 1 , further comprising:
a second differential amplifier circuit, which forms a differential pair with the first differential amplifier circuit, including:
a fifth transistor configured to receive a second input signal at a gate of the fifth transistor;
a sixth transistor connected in parallel between a source and a drain of the fifth transistor and configured to receive a third reference signal at a gate of the sixth transistor; and
a seventh transistor, forming a differential pair with the sixth transistor, configured to receive the third reference signal at a gate of the seventh transistor.
3. The semiconductor device according to claim 2 , wherein
the second differential amplifier circuit further includes an eighth transistor connected in parallel between a source and a drain of the seventh transistor and configured to receive the second reference signal at a gate of the eighth transistor.
4. The semiconductor device according to claim 2 , wherein
the first differential amplifier circuit further includes:
a ninth transistor connected in series with the second transistor;
a tenth transistor, disposed on an output side of the first differential amplifier circuit, configured as a first current mirror circuit with the ninth transistor;
an eleventh transistor, connected in parallel with the ninth transistor, configured as a second current mirror circuit with the tenth transistor; and
a first discharge circuit connected to a source of the eleventh transistor; and
the second differential amplifier circuit further includes:
a thirteenth transistor connected in series with the sixth transistor;
a fourteenth transistor, disposed on an output side of the second differential amplifier circuit, configured as a third current mirror circuit with the thirteenth transistor;
a fifteenth transistor, connected in parallel with the thirteenth transistor, configured as a fourth current mirror circuit with the fourteenth transistor; and
a second discharge circuit connected to a source of the fifteenth transistor.
5. The semiconductor device of claim 1 , wherein the semiconductor device is configured as a receiver of at least one of a semiconductor memory or a memory interface configured to receive a signal.
6. The semiconductor device of claim 4 , wherein the first discharge circuit is configured to discharge a charge at an intermediate node connected between the eleventh transistor and the first discharge circuit.
7. The semiconductor device of claim 4 , wherein the second discharge circuit is configured to discharge a charge at an intermediate node connected between the fifteenth transistor and the second discharge circuit.
8. The semiconductor device of claim 1 , wherein the second transistor and the third transistor at least form part of a discharge circuit configured to discharge charge on the first node to a ground by turning on the second transistor in a timing with which the first input signal transitions from a first level to a second level.
9. The semiconductor device of claim 8 , wherein the first transistor and the fourth transistor at least form part of a differential circuit in parallel with the discharge circuit.
10. The semiconductor device of claim 1 , wherein the power supply voltage, first reference voltage, and second reference voltage meet the following conditions:
the second reference voltage≈½×the power supply voltage; and
the first reference voltage=the second reference voltage+ΔV,
wherein 0<ΔV<½×the power supply voltage.
11. A memory controller comprising:
a host interface circuit configured to receive a command from a host;
a processing circuit configured to control the controller; and
a memory interface circuit configured to transmit the command to a semiconductor memory and receive data from the semiconductor memory, wherein the memory interface includes:
a first transistor configured to receive a first input signal at a gate of the first transistor;
a second transistor connected in parallel between a source and a drain of the first transistor and configured to receive a first reference signal at a gate of the second transistor;
a third transistor, forming a differential pair with the second transistor, configured to receive the first reference signal at a gate of the third transistor;
a fourth transistor connected in parallel between a source and a drain of the third transistor and configured to receive a second reference signal at a gate of the fourth transistor, the second reference signal lower than the first reference signal;
a fifth transistor having a source connected to a power supply voltage and a drain connected to the drain of the first transistor and the second transistor at a first node; and
a sixth transistor having a source connected to the power supply voltage and a drain connected to the drain of the third transistor, a drain of the fourth transistor, and a gate of the fifth transistor at a second node.
12. The memory controller of claim 11 , wherein the second transistor and the third transistor at least form part of a discharge circuit configured to discharge charge on the first node to a ground by turning on the second transistor in a timing with which the first input signal transitions from a first level to a second level.
13. The memory controller of claim 12 , wherein the first transistor and the fourth transistor at least form part of a differential circuit in parallel with the discharge circuit.
14. The memory controller of claim 11 , wherein the power supply voltage, first reference voltage, and second reference voltage meet the following conditions:
the second reference voltage≈½×the power supply voltage; and
the first reference voltage=the second reference voltage+ΔV,
wherein 0<ΔV<½×the power supply voltage.
15. A memory system comprising:
a controller; and
a semiconductor memory connected to the controller,
wherein the controller includes:
a host interface circuit configured to receive a command from a host;
a processing circuit configured to control the controller; and
a memory interface circuit configured to transmit the command to a semiconductor memory and receive data from the semiconductor memory, wherein the memory interface includes:
a first transistor configured to receive a first input signal at a gate of the first transistor;
a second transistor connected in parallel between a source and a drain of the first transistor and configured to receive a first reference signal at a gate of the second transistor;
a third transistor, forming a differential pair with the second transistor, configured to receive the first reference signal at a gate of the third transistor;
a fourth transistor connected in parallel between a source and a drain of the third transistor and configured to receive a second reference signal at a gate of the fourth transistor, the second reference signal lower than the first reference signal;
a fifth transistor having a source connected to a power supply voltage and a drain connected to the drain of the first transistor and the second transistor at a first node; and
a sixth transistor having a source connected to the power supply voltage and a drain connected to the drain of the third transistor, a drain of the fourth transistor, and a gate of the fifth transistor at a second node.
16. The memory controller of claim 15 , wherein the second transistor and the third transistor at least form part of a discharge circuit configured to discharge charge on the first node to a ground by turning on the second transistor in a timing with which the first input signal transitions from a first level to a second level.
17. The memory controller of claim 16 , wherein the first transistor and the fourth transistor at least form part of a differential circuit in parallel with the discharge circuit.