Measurement apparatus

1. A measurement apparatus comprising:

a magnetic field generator that applies a predetermined magnetic field to a device under test;

a current source that supplies a current with a rectangular wave to the device under test in a direction crossing the magnetic field;

a voltage detector that measures a voltage difference generated in the device under test; and

one or more processors configured to:

demodulate the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;

remove harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test; and

measure the device under test based on the restored electromotive voltage.

2. The measurement apparatus according to claim 1 , further comprising:

first and second terminals that contact two electrodes of the device under test, respectively, and that supply the current from the current source to the device under test; and

third and fourth terminals that contact other two electrodes of the device under test, respectively, and that transfer the voltage difference to the voltage measurement section.

3. The measurement apparatus according to claim 1 , wherein

the one or more processors are configured to calculate a carrier polarity, a carrier concentration, and a carrier mobility of the device under test using the magnetic field from the magnetic field generation section, the current from the current source, and the restored electromotive voltage.

4. The measurement apparatus according to claim 1 , wherein

the one or more processors are configured to:

calculate a resistivity of the device under test based on a current value of the current source and the restored electromotive voltage,

calculate a Hall coefficient of the device under test based on the magnetic field from the magnetic field generation section, the current from the current source, and the restored electromotive voltage,

calculate a carrier concentration of the device under test based on the Hall coefficient, and

calculate a carrier mobility of the device under test based on the Hall coefficient and the resistivity.

5. The measurement apparatus according to claim 1 , wherein the frequency of the rectangular wave is represented by f, and wherein

the restored electromotive voltage is a voltage obtained by restoring low frequency components at frequencies f to 2f of the voltage difference.

6. The measurement apparatus according to claim 1 , wherein

the restored electromotive voltage is a voltage obtained by restoring low frequency components at 50 Hz to 100 Hz of the voltage difference.

7. The measurement apparatus according to claim 1 , wherein the frequency of the rectangular wave is represented by f, and wherein

a band from a frequency 0 to the frequency f of the voltage difference is shifted so that the band is equal to or lower than 0 by demodulating the voltage difference using the demodulated signal.

8. The measurement apparatus according to claim 7 , wherein

the restored electromotive voltage is a voltage corresponding to a band from the frequency 0 to the frequency f of the demodulated voltage difference.

9. The measurement apparatus according to claim 8 , wherein

the restored electromotive voltage is a voltage corresponding to a band from 0 Hz to 50 Hz of the demodulated voltage difference.

10. A method, comprising:

applying a predetermined magnetic field to a device under test;

supplying a current with a rectangular wave to the device under test in a direction crossing the magnetic field;

measuring a voltage difference generated in the device under test;

demodulating the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;

removing harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test; and

measuring the device under test based on the restored electromotive voltage.

11. The method of claim 10 , wherein the frequency of the rectangular wave is represented by f and further comprising:

restoring the electromotive voltage by restoring low frequency components at frequencies f to 2f of the voltage difference.

12. The method of claim 10 , wherein the frequency of the rectangular wave is represented by f, and demodulating the voltage difference further comprising:

shifting a band from a frequency 0 to the frequency f of the voltage difference so that the band is equal to or lower than 0.

13. The method of claim 12 , wherein

the restored electromotive voltage is a voltage corresponding to a band from the frequency 0 to the frequency f of the demodulated voltage difference.

14. A system comprising:

one or more hardware processors configured by machine-readable instructions to:

measure a voltage difference generated in a device under test, wherein the device under test is applied with a predetermined magnetic field and a current with a rectangular wave in a direction crossing the magnetic field;

demodulate the voltage difference using a demodulated signal having a substantially similar frequency to a frequency of the rectangular wave and synchronized with the rectangular wave;

remove harmonic components from the demodulated voltage difference to restore an electromotive voltage generated in the device under test; and

measure the device under test based on the restored electromotive voltage.