IP Library Granted Patent US 10,964,539
Granted Patent B2
US 10,964,539 · App. 16/557,787 · Granted Mar 30, 2021

Imprinting method and semiconductor device manufacturing method

Inventors: Kei Kobayashi (Yokohama Kanagawa, JP); Hirokazu Kato (Kariya Aichi, JP); Takayuki Nakamura (Machida Tokyo, JP)
Assignee: TOSHIBA MEMORY CORPORATION
H01L21/0337G03F7/0002H01L21/0271H01L21/31144
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Quick Facts
Patent No.
US 10,964,539
App. No.
16/557,787
Granted
Mar 30, 2021
Kind
B2
Abstract

According to one embodiment, an imprinting method comprises forming a carbon film on a substrate. The carbon film being oxygen in an amount of less than or equal to 15% by weight. A transfer material is dispensed over the carbon film. A patterned template is brought into contact with the transfer material. The transfer material is cured with light passing through the patterned template. The patterned template is then detached from the cured transfer material.

Claims (37)

1. An imprinting method, comprising:

forming a carbon film on a substrate, the carbon film comprising oxygen in an amount of less than or equal to 15% by weight;

dispensing a transfer material over the carbon film;

bringing a patterned template into contact with the transfer material;

curing the transfer material with light through the patterned template; and

detaching the patterned template from the cured transfer material, wherein a pure-water contact angle of the carbon film after formation is greater than or equal to 60 degrees.

2. The imprinting method according to claim 1 , wherein the carbon film is not treated prior to the dispensing of the transfer material.

3. The imprinting method according to claim 1 , wherein forming the carbon film includes making a surface of the carbon film hydrophilic.

4. The imprinting method according to claim 3 , wherein at least one of an oxygen plasma treatment, an ozone water treatment, or an ultraviolet treatment in a vacuum atmosphere is performed to make the surface of the carbon film hydrophilic.

5. The imprinting method according to claim 1 , further comprising:

forming a silicon oxide film on the carbon film.

6. The imprinting method according to claim 1 , wherein forming the carbon film comprises spin coating an organic film on the substrate.

7. The imprinting method according to claim 1 , wherein the carbon film comprises 10% or less oxygen by weight.

8. The imprinting method according to claim 1 , further comprising:

forming a spin-on-glass layer over the carbon film prior to dispensing the transfer material.

9. The imprinting method of claim 1 , wherein the transfer material is dispensed as droplets over the carbon film.

10. The imprinting method of claim 1 , further comprising:

etching the substrate using the cured transfer material as a mask.

11. A method of manufacturing a semiconductor device, the method comprising:

forming a first film on a semiconductor substrate;

forming a carbon film on the first film, the carbon film comprising oxygen in an amount of less than or equal to 15% by weight;

dispensing a transfer material over the carbon film;

bringing a patterned template into contact with the transfer material;

curing transfer material with light through the patterned template;

detaching the patterned template from the cured transfer material; and

processing first film using the cured transfer material as a mask, wherein

the carbon film has a pure-water contact angle after formation of greater than or equal to 60 degrees.

12. The method according to claim 11 , wherein forming the carbon film includes making a surface of the carbon film hydrophilic.

13. The method according to claim 11 , further comprising performing at least one of an oxygen plasma treatment, an ozone water treatment, or an ultraviolet treatment in a vacuum atmosphere on the carbon film before dispensing the transfer material.

14. The method according to claim 11 , further comprising:

forming a silicon oxide film on the carbon film.

15. The method according to claim 11 , wherein forming the carbon film comprises spin coating an organic film on the first film.

16. The method according to claim 11 , wherein the carbon film comprises 10% or less oxygen by weight.

17. The method according to claim 11 , further comprising:

forming a spin-on-glass layer over the carbon film prior to dispensing the transfer material.

18. The method of claim 11 , wherein the transfer material is dispensed as droplets over the carbon film.

19. The method of claim 11 , wherein processing the first film comprises etching the first film.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058905/0582 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2020
From: KOBAYASHI, KEI; KATO, HIROKAZU; NAKAMURA, TAKAYUKI
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051435/0524 →