IP Library Granted Patent US 10,943,632
Granted Patent B2
US 10,943,632 · App. 16/559,181 · Granted Mar 9, 2021

Magnetic storage device

Inventor: Hironobu Furuhashi (Kuwana Mie, JP)
Assignee: TOSHIBA MEMORY CORPORATION
G11C11/1675G11C11/02G11C11/161H01F10/329H01F10/3254H01F10/3286H01L27/224H01L43/02H01L45/1233H01L45/1253H01L45/141
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Quick Facts
Patent No.
US 10,943,632
App. No.
16/559,181
Granted
Mar 9, 2021
Kind
B2
Abstract

A magnetic storage device includes a memory cell with a magnetoresistive effect element and a switching element connected in series. The magnetoresistive effect element is configured to change from a first resistance state to a second resistance state that is lower in resistance than the first resistance state in response to a first write operation flowing current in a first direction through the memory cell and to change from the second resistance state to the first resistance state in response to a second write operation flowing current in a second direction through the memory cell. The switching element has a first voltage drop associated with current flows in the first direction and has a second voltage drop associated with current flows the second direction that is lower than the first voltage drop.

Claims (55)

1. A magnetic storage device, comprising:

a memory cell having a magnetoresistive effect element and a switching element connected in series, wherein

the magnetoresistive effect element is configured to:

change from a first resistance state to a second resistance state that is lower resistance than the first resistance state in response to a first write operation in which a current flows in a first direction through the memory cell; and

change from the second resistance state to the first resistance state in response to a second write operation in which a current flows in a second direction, opposite to the first direction, in the memory cell, and

the switching element has asymmetric characteristics with respect to polarity across the switching element such that a first voltage drop across the switching element for current flows in the first direction is different from a second voltage drop across the switching element for current flows in the second direction.

2. The magnetic storage device according to claim 1 , wherein the switching element includes:

a first electrode layer;

a second electrode layer of a different material than the first electrode layer; and

a switching layer between the first electrode layer and the second electrode layer.

3. The magnetic storage device according to claim 2 , wherein the first electrode layer and the second electrode layer each comprise at least one material selected from the group of carbon, carbon nitride, tungsten nitride, and titanium nitride.

4. The magnetic storage device according to claim 1 , wherein a magnitude of a first write voltage applied in the first write operation and a magnitude of a second write voltage applied in the second write operation are equal.

5. The magnetic storage device according to claim 1 , wherein the switching member comprises at least one chalcogen element selected from tellurium, selenium, and sulfur.

6. The magnetic storage device according to claim 5 , wherein the switching member further comprises at least one element selected from boron, aluminum, gallium, indium, carbon, silicon, germanium, tin, arsenic, phosphorus, antimony, titanium, and bismuth.

7. The magnetic storage device according to claim 1 , wherein the switching element has:

a first threshold voltage for a first voltage polarity corresponding to the first direction; and

a second threshold voltage for a second voltage polarity corresponding to the second direction.

8. The magnetic storage device according to claim 7 , wherein the first threshold voltage and the second threshold voltage are equal.

9. The magnetic storage device according to claim 7 , wherein the first threshold voltage and the second threshold voltage are different from each other.

10. The magnetic storage device according to claim 7 , wherein

the first threshold voltage has a magnitude greater than one-half a magnitude of a first write voltage in the first write operation, and

the second threshold voltage has a magnitude greater than one-half a magnitude of a second write voltage in the second write operation.

11. The magnetic storage device according to claim 1 , wherein the magnetoresistive effect element includes:

a first ferromagnetic layer;

a second ferromagnetic layer; and

a nonmagnetic layer between the first ferromagnetic body and the second ferromagnetic body.

12. A magnetic storage device, comprising:

a plurality of memory cells, each memory cell including a magnetoresistive effect element and a switching element connected in series between a word line and a bit line, wherein

the magnetoresistive effect elements are configured to:

change from a first resistance state to a second resistance state that is lower resistance than the first resistance state in a first write operation in which a current flows through the memory cell in a first direction from the word line to the bit line; and

change from the second resistance state to the first resistance state in a second write operation in which a current flows through the memory cell in a second direction opposite to the first direction, and

the switching element has asymmetric characteristics with respect to polarity across the switching element such that a first voltage drop across the switching element for current flows in the first direction is different from a second voltage drop across the switching element for current flows in the second direction.

13. The magnetic storage device according to claim 12 , wherein the switching element has:

a first threshold voltage for a first voltage polarity corresponding to the first direction; and

a second threshold voltage for a second voltage polarity corresponding to the second direction.

14. The magnetic storage device according to claim 13 , wherein the first threshold voltage and the second threshold voltage are equal.

15. The magnetic storage device according to claim 13 , wherein the first threshold voltage and the second threshold voltage are different from each other.

16. The magnetic storage device according to claim 13 , wherein

the first threshold voltage has a magnitude greater than one-half a magnitude of a first write voltage in the first write operation, and

the second threshold voltage has a magnitude greater than one-half a magnitude of a second write voltage in the second write operation.

17. The magnetic storage device according to claim 12 , wherein the magnetoresistive effect element includes:

a first ferromagnetic layer;

a second ferromagnetic layer; and

a nonmagnetic layer between the first ferromagnetic body and the second ferromagnetic body.

18. A magnetic storage device, comprising:

a plurality of bit lines and a plurality of word lines;

a plurality of memory cells, each memory cell having a magnetoresistive effect element and a switching element connected in series between a bit line and a word line, wherein

each magnetoresistive effect element is configured to:

change from a first resistance state to a second resistance state that is lower resistance than the first resistance state in response to a first current flow in a first direction through the memory cell; and

change from the second resistance state to the first resistance state in response to a second current flow in a second direction through the memory cell, the second direction being opposite of the first direction, and

the switching element has asymmetric characteristics with respect to polarity across the switching element such that a first voltage drop across the switching element for current flows in the first direction is different from a second voltage drop across the switching element for current flows in the second direction.

19. The magnetic storage device according to claim 18 , wherein the switching element has:

a first threshold voltage for a first voltage polarity corresponding to the first direction; and

a second threshold voltage for a second voltage polarity corresponding to the second direction, wherein

the first and second threshold voltages are different from each other.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Jan 31, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058905/0582 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2019
From: FURUHASHI, HIRONOBU
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051295/0737 →
Cited By (1)
US 12,238,936