Component with dielectric layer for embedding in component carrier

1. A method of manufacturing a component carrier, the method comprising:

forming a stack comprising at least one electrically conductive layer structure and/or at least one electrically insulating layer structure;

providing a component having one or more pads and at least one dielectric layer, such that the at least one dielectric layer is arranged on at least one main surface of the component and at least partially covering one or more pads of the component;

providing the stack with a cavity;

closing at least part of a bottom of the cavity by a temporary carrier;

after the step of providing a component, placing the component in the cavity so that the at least one dielectric layer is attached onto the temporary carrier;

at least partially filling a gap in the cavity between the component and the stack with a filling medium; and

thereafter removing the temporary carrier from the stack, the at least one dielectric layer and the filling medium.

2. The method according to claim 1 , comprising at least one of the following features:

wherein the method comprises forming the at least one electrically conductive contact without previously connecting at least one further electrically insulating layer structure to the at least one dielectric layer;

wherein the component is already provided with the at least one opening at the point of time of embedding the component, wherein the method in particular comprises at least partially filling the at least one opening with electrically conductive material after embedding the component;

wherein the method comprises forming the at least one opening by laser processing, in particular by laser drilling.

3. The method according to claim 1 , wherein filling the gap is carried out by at least one of the group consisting of applying a liquid filling medium into the gap, and laminating an at least partially uncured electrically insulating layer structure to the stack and the component.

4. The method according to claim 1 , comprising at least one of the following features:

wherein the at least one dielectric layer is in a fully cured state when arranged on the component;

wherein the at least one dielectric layer is in an at least partially uncured state when arranged on the component.

5. The method according to claim 1 , further comprising:

wherein the at least one dielectric layer is a continuous layer.

6. The method according to claim 5 , further comprising:

removing the temporary carrier;

forming at least one opening in the at least one dielectric layer that extends to the at least one pad.

7. The method according to claim 1 , further comprising:

connecting at least one further electrically insulating layer structure and/or at least one further electrically conductive layer structure to at least one of a top side and a bottom side of the stack.

8. The method according to claim 1 , further comprising:

providing the dielectric layer with an electrically insulating matrix and an additive comprising a metal compound;

selectively treating a surface portion of the dielectric layer to thereby locally remove material of the electrically insulating matrix while simultaneously locally activating the additive for promoting subsequent metal deposition;

selectively depositing metallic material on the locally activated additive.