IP Library Granted Patent US 11,537,903
Granted Patent B2
US 11,537,903 · App. 16/573,953 · Granted Dec 27, 2022

Systems and methods for reducing manufacturing failure rates

Inventors: William Seaton (New York, NY); Clemens Wiltsche (London, GB); Myles Novick (New York, NY); Rootul Patel (New York, NY)
Assignee: Palantir Technologies Inc.
G06N5/022G06Q10/06
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,537,903
App. No.
16/573,953
Granted
Dec 27, 2022
Kind
B2
Abstract

Systems and methods are provided for reducing failure rates of a manufactured products. Manufactured products may be clustered together according to similarities in their production data. Manufactured product clusters may be analyzed to determine mechanisms for failure rate reduction, including adjustments to test quality parameters, product formulas, and product processes. Recommended product adjustments may be provided.

Claims (71)

1. A system for reducing failure rates of a manufactured product comprising:

one or more processors; and

memory storing instructions that, when executed by the one or more processors, cause the system to perform:

receiving, from a database, a first product data set, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples;

receiving, from the database, a second product data set, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples;

clustering, by a machine learning technique, a product cluster including the first product data set and the second product data set according to the first product formula and the second product formula;

generating, based on the clustering, a correlation model according to an in-common ingredient in the first product formula and the second product formula and an in-common test result of the first test results and the second test results;

predicting, based on the correlation model, a test result of the first test results;

determining, based on the predicted test result and an actual test result of the first test results, a test failure mode; and

determining, based on the test failure mode, a failure rate reduction mechanism of at least a product of the product cluster.

2. The system of claim 1 , wherein the system is further caused to perform:

selecting one of a first product or a second product as a selected product for failure rate reduction according to a comparison between the first test results of the plurality of first product examples and the second test results of the plurality of second product examples; and

determining the failure rate reduction mechanism of the selected product.

3. The system of claim 2 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

determining a formula adjustment of the selected product.

4. The system of claim 1 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

receiving a plurality of additional product data sets including a plurality of additional product formulas;

scoring the first product formula according to a weight of ingredients of the first product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas;

scoring the second product formula according to a weight of ingredients of the second product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas; and

determining the failure rate reduction mechanism of the product cluster according to a comparison of the score of the first product and the score of the second product.

5. The system of claim 1 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

identifying a selected test, wherein at least one of the first test results and second test results includes a failing result for the selected test; and

modifying a passing quality parameter range of the selected test such that the failing result is within a modified passing quality parameter range of the selected test.

6. The system of claim 5 , wherein the system is further caused to perform:

receiving a plurality of additional product data sets including a plurality of additional test results; and

identifying the selected test according to a frequency of failing results for the selected test among the first test results, the second test results, and the plurality of additional test results.

7. A computer implemented method for reducing failure rates of a manufactured product, the method being performed on a computer system having one or more physical processors programmed with computer program instructions that, when executed by the one or more physical processors, cause the computer system to perform the method, the method comprising:

receiving, from a database, a first product data set, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples;

receiving, from the database, a second product data set, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples;

clustering, by a machine learning technique, a product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula;

generating, based on the clustering, a correlation model according to an in-common ingredient in the first product formula and the second product formula and an in-common test result of the first test results and the second test results;

predicting, based on the correlation model, a test result of the first test results;

determining, based on the predicted test result and an actual test result of the first test results, a test failure mode; and

determining, based on the test failure mode, a failure rate reduction mechanism of at least a product of the product cluster.

8. The computer implemented method of claim 7 , wherein the system is further caused to perform:

selecting one of a first product or a second product as a selected product for failure rate reduction according to a comparison between the first test results of the plurality of first product examples and the second test results of the plurality of second product examples; and

determining the failure rate reduction mechanism of the selected product.

9. The computer implemented method of claim 8 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

determining a formula adjustment of the selected product.

10. The computer implemented method of claim 7 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

receiving a plurality of additional product data sets including a plurality of additional product formulas;

scoring the first product formula according to a weight of ingredients of the first product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas;

scoring the second product formula according to a weight of ingredients of the second product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas; and

determining the failure rate reduction mechanism of the product cluster according to a comparison of the score of the first product and the score of the second product.

11. The computer implemented method of claim 7 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the system to perform:

identifying a selected test, wherein at least one of the first test results and second test results includes a failing result for the selected test; and

modifying a passing quality parameter range of the selected test such that the failing result is within a modified passing quality parameter range of the selected test.

12. The computer implemented method of claim 11 , wherein the system is further caused to perform:

receiving a plurality of additional product data sets including a plurality of additional test results; and

identifying the selected test according to a frequency of failing results for the selected test among the first test results, the second test results, and the plurality of additional test results.

13. A non-transitory computer readable medium comprising instructions that, when executed, cause one or more processors to perform:

receiving, from a database, a first product data set, the first product data set including a first product formula, a plurality of first product examples, and first test results of the plurality of first product examples;

receiving, from the database, a second product data set, the second product data set including a second product formula, a plurality of second product examples, and second test results of the plurality of second product examples;

clustering, by a machine learning technique, a product cluster including the first product data set and the second product data set according to a comparison between the first product formula and the second product formula; and

generating, based on the clustering, a correlation model according to an in-common ingredient in the first product formula and the second product formula and an in-common test result of the first test results and the second test results;

predicting, based on the correlation model, a test result of the first test results;

determining, based on the predicted test result and an actual test result of the first test results, a test failure mode; and

determining, based on the test failure mode, a failure rate reduction mechanism of at least a product of the product cluster.

14. The non-transitory computer readable medium of claim 13 , wherein the non-transitory computer readable medium is further caused to perform:

selecting one of a first product or a second product as a selected product for failure rate reduction according to a comparison between the first test results of the plurality of first product examples and the second test results of the plurality of second product examples; and

determining the failure rate reduction mechanism of the selected product.

15. The non-transitory computer readable medium of claim 14 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the non-transitory computer readable medium to perform:

determining a formula adjustment of the selected product.

16. The non-transitory computer readable medium of claim 14 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the non-transitory computer readable medium to perform:

receiving a plurality of additional product data sets including a plurality of additional product formulas;

scoring the first product formula according to a weight of ingredients of the first product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas;

scoring the second product formula according to a weight of ingredients of the second product formula and a frequency of ingredients of the first product formula, the second product formula, and the plurality of additional product formulas; and

determining the failure rate reduction mechanism of the product cluster according to a comparison of the score of the first product and the score of the second product.

17. The non-transitory computer readable medium of claim 14 , wherein the determining of the failure rate reduction mechanism of the product cluster further causes the non-transitory computer readable medium to perform:

identifying a selected test, wherein at least one of the first test results and second test results includes a failing result for the selected test; and

modifying a passing quality parameter range of the selected test such that the failing result is within a modified passing quality parameter range of the selected test.

Assignments (8)
ASSIGNMENT OF INTELLECTUAL PROPERTY SECURITY AGREEMENTS Recorded Jul 3, 2022
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: WELLS FARGO BANK, N.A.
Reel/Frame 060572/0640 →
SECURITY INTEREST Recorded Jul 3, 2022
From: PALANTIR TECHNOLOGIES INC.
To: WELLS FARGO BANK, N.A.
Reel/Frame 060572/0506 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ERRONEOUSLY LISTED PATENT BY REMOVING APPLICATION NO. 16/832267 FROM THE RELEASE OF SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 052856 FRAME 0382. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Aug 26, 2021
From: ROYAL BANK OF CANADA
To: PALANTIR TECHNOLOGIES INC.
Reel/Frame 057335/0753 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2021
From: SEATON, WILLIAM; WILTSCHE, CLEMENS; NOVICK, MYLES; PATEL, ROOTUL
To: PALANTIR TECHNOLOGIES INC.
Reel/Frame 055501/0169 →
SECURITY INTEREST Recorded Jun 4, 2020
From: PALANTIR TECHNOLOGIES INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 052856/0817 →
RELEASE OF SECURITY INTEREST Recorded Jun 4, 2020
From: ROYAL BANK OF CANADA
To: PALANTIR TECHNOLOGIES INC.
Reel/Frame 052856/0382 →
SECURITY INTEREST Recorded Jan 27, 2020
From: PALANTIR TECHNOLOGIES INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS ADMINISTRATIVE AGENT
Reel/Frame 051713/0149 →
SECURITY INTEREST Recorded Jan 27, 2020
From: PALANTIR TECHNOLOGIES INC.
To: ROYAL BANK OF CANADA, AS ADMINISTRATIVE AGENT
Reel/Frame 051709/0471 →
Continuity (2)
Continuation 15590959 · May 9, 2017
Related Publication 20200012950A1 · Jan 9, 2020