Tunnel magnetoresistance (TMR) element having cobalt iron and tantalum layers

1. A tunnel magnetoresistance (TMR) element, comprising:

a cap layer;

a bias layer in direct contact with the cap layer, the bias layer comprises:

a first platinum manganese layer in direct with the cap layer;

a first cobalt iron layer in direct contact with the first PtMn layer; and

a first ruthenium layer in direct contact with the first CoFe layer;

a free layer in direct contact with the bias layer, the free layer comprising:

a nickel iron layer in direct contact with the first Ru layer;

a second CoFe layer in direct contact with the NiFe layer;

a first tantalum layer in direct contact with the second CoFe layer; and

a first cobalt iron boron in direct contact with the first Ta layer;

a magnesium oxide MgO layer in direct contact with the first CoFeB layer;

a reference layer in direct contact with the MgO layer, the reference comprising:

second CoFeB layer in direct contact with the MgO layer;

a third CoFe layer in direct contact with a second Ta layer;

the second Ta layer in direct contact with the second CoFeB layer and the third CoFe layer;

a second Ru layer in direct contact with the third CoFe layer;

a fourth CoFe layer in direct contact with the second Ru layer; and

a second PtMn layer in direct contact with the fourth CoFe layer; and

a seed layer in direct contact with the second PtMn layer,

wherein the first PtMn layer pins the bias layer, and

wherein the second PtMn layer pins the fourth CoFe layer.

2. The TMR of claim 1 , wherein the first and second CoFeB layers are each 0.9 nanometers thick.

3. The TMR of claim 1 , wherein the first, second, third and fourth CoFe layers are each 0.9 nanometers thick.

4. The TMR of claim 1 , wherein the first and second tantalum layers are each 0.1 nanometers thick.

5. The TMR of claim 1 , wherein a thickness of the first and second tantalum layers are each between 0.05 nanometers and 0.3 nanometers.