Retroreflector with sensor

1. A reflector arrangement for position determination or marking target points, the reflector arrangement comprising:

at least one retroreflector, which

provides position determination for the reflector arrangement by means of parallel measurement beam reflection, and

provides a passage surface for at least a part of measurement radiation entering the retroreflector, and

at least one sensor arrangement, arranged downstream of the retroreflector in relation to a measurement beam incidence direction, the sensor arrangement having a sensor for recording measurement radiation passing through the passage surface, the sensor defining an optical axis oriented orthogonally with respect to its detection surface,

wherein:

the sensor arrangement includes a code element having a code pattern, and

the retroreflector, the code element, and the sensor being arranged such that:

the code element is arranged between the retroreflector and the sensor, and

an angle-dependent position with respect to the optical axis of a projection of the code pattern onto the detection surface can be determined by means of the sensor,

wherein the retroreflector is configured as a prism, and the prism comprises:

a light entry surface forming a triangle and,

as an aperture, the passage surface opposite the light entry surface,

wherein the reflector arrangement is configured as a 360° retroreflector having a multiplicity of retroreflector and sensor arrangement pairs, each having a retroreflector and a sensor arrangement as specified above, with

the multiplicity of retroreflectors being arranged next to one another and being configured as prisms,

the multiplicity of retroreflectors numerically corresponding to the number of sensor arrangements, and

each sensor arrangement being assigned to a retroreflector,

wherein:

the multiplicity of retroreflector and sensor arrangement pairs are arranged annularly, and

the 360° retroreflector defines an overall azimuth field of view of 360°, each of the retroreflector and sensor arrangement pairs covering a part of the overall field of view,

wherein:

a central axis A defined by the annular arrangement of the prisms extends orthogonally with respect to the optical axes of the sensors, and

the optical axes of at least two prisms have a common point of intersection with the central axis A, the position of an optical axis of a prism being defined by the respective midpoints of its light entry surface and of its passage surface.

2. The reflector arrangement according to claim 1 , wherein:

the code element is configured as a photomask and is connected to the passage surface of the retroreflector, and

the code pattern is provided by one or more light transmission regions provided by the photomask.

3. The reflector arrangement according to claim 2 , wherein the photomask comprises a multiplicity of randomly arranged light-transmitting gaps, and the code pattern is provided by said gaps.

4. The reflector arrangement according to claim 1 , wherein the sensor arrangement comprises a separating piece, which is arranged between the code element and the sensor or between the passage surface and the code element, the separating piece being configured as a bandpass filter or as a longpass filter.

5. The reflector arrangement according to claim 1 , wherein the reflector arrangement provides a field of view with an elevation recording angle of at least ±30° and up to ±60°.

6. The reflector arrangement according to claim 1 , wherein:

the sensor is configured to record an image of the projection of the code pattern onto the detection surface, and

the position of the code pattern projectable angle-dependently onto the detection surface can be determined by means of image processing of the image.

7. The reflector arrangement according to claim 1 , wherein the reflector arrangement comprises an evaluation unit, which is adapted to derive a spatial orientation of the reflector arrangement relative to a propagation axis of the radiation entering the retroreflector with respect to at least one degree of freedom with the aid of the position of the projection on the detection surface.

8. The reflector arrangement according to claim 1 , wherein:

the sensor is configured as a monochromatic BSI sensor, or

the sensor is configured as a polarization-resolving sensor, with

different sensor pixels being assigned differently polarization-sensitive matrix elements, and

the sensor providing a calculation of the Stokes vector with the aid of an intensity evaluation of the different sensor pixels.

9. The reflector arrangement according to claim 1 , wherein the reflector arrangement comprises a control unit having a recording functionality, the recording functionality being configured for position-resolved detection of the orientation measurement radiation by means of multiple readout of the sensor, at least a first readout being carried out with measurement information relating to orientation measurement radiation striking the detection surface and a second readout being carried out without this measurement information.

10. A measuring aid instrument having a reflector arrangement according to claim 1 , the measuring aid instrument being configured for contactless or tactile recording of a target point on an object with a defined position reference in relation to the reflector arrangement.

11. A reflector arrangement for position determination or marking target points, the reflector arrangement comprising:

at least one retroreflector, which

provides position determination for the reflector arrangement by means of parallel measurement beam reflection, and

provides a passage surface for at least a part of measurement radiation entering the retroreflector, and

at least one sensor arrangement, arranged downstream of the retroreflector in relation to a measurement beam incidence direction, the sensor arrangement having a sensor for recording measurement radiation passing through the passage surface, the sensor defining an optical axis oriented orthogonally with respect to its detection surface,

wherein:

the sensor arrangement includes a code element having a code pattern, and

the retroreflector, the code element, and the sensor being arranged such that:

the code element is arranged between the retroreflector and the sensor, and

an angle-dependent position with respect to the optical axis of a projection of the code pattern onto the detection surface can be determined by means of the sensor,

wherein the retroreflector is configured as a prism, and the prism comprises:

a light entry surface forming a triangle and,

as an aperture, the passage surface opposite the light entry surface,

wherein the reflector arrangement is configured as a 360° retroreflector having a multiplicity of retroreflector and sensor arrangement pairs, each having a retroreflector and a sensor arrangement as specified above, with

the multiplicity of retroreflectors being arranged next to one another and being configured as prisms,

the multiplicity of retroreflectors numerically corresponding to the number of sensor arrangements, and

each sensor arrangement being assigned to a retroreflector,

wherein

the midpoints of the passage surfaces of the prisms of a first prism group of three prisms lie in a first plane and the midpoints of the passage surfaces of the prisms of a second prism group of three prisms lie in a second plane, and

the first plane and the second plane are oriented parallel to one another.

12. A measuring aid instrument having a reflector arrangement according to claim 11 , the measuring aid instrument being configured for contactless or tactile recording of a target point on an object with a defined position reference in relation to the reflector arrangement.