PDE4 inhibitor (R)-4-(5-(4-methoxy-3-propoxyphenyl)pyridin-3-yl)-1,2-oxaborolan-2-ol
The present invention relates to PDE4 inhibitor (R)-4-(5-(4-methoxy-3-propoxyphenyl)pyridin-3-yl)-1,2-oxaborolan-2-ol including the crystalline monohydrate thereof.
1. A compound of the structure
or a pharmaceutically acceptable salt thereof.
2. A compound of the structure
3. A compound of the structure
wherein the compound is characterized by a powder X-ray diffraction pattern comprising diffraction peaks at angles (2θ) of 11.0° 0 0.2°, 22.9°±0.2°, and 25.1°±0.2°.
4. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2°, 18.8°±0.2°, and 26.4°±0.2°.
5. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4±0.2°, 13.2°±0.2°, 18.8°±0.2, 19.7°±0.2°, 21.3±0.2°, 2 and 26.4±0.2°.
6. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2, 13.2°±0.2°, 14.5°±0.2°, 15.1°±0.2°, 15.6°±0.2°, 18.8°±0.2°, 19.7°±0.2°, 21.3°±0.2°, and 26.4°±0.2°.
7. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2, 13.2°±0.2°, 14.5°±0.2°, 15.1°±0.2°, 15.6°±0.2°, 18.8°±0.2°, 19.4°±0.2°, 19.7°±0.2°, 21.3°±0.2°, 25.9°±0.2°, 26.4°±0.2°, and 27.5°±0.2°.
8. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2, 13.2°±0.2°, 14.5°±0.2°, 15.1°±0.2°, 15.6°±0.2°, 15.9°±0.2°, 17.7°±0.2°, 18.8°±0.2°, 19.4°±0.2°, 19.7°±0.2°, 20.5°±0.2°, 21.3°±0.2°, 25.9°±0.2°, 26.4°±0.2°, and 27.5°±0.2°.
9. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2°, 13.2°±0.2°, 14.5°±0.2°, 15.1°±0.2°, 15.6°±0.2°, 15.9°±0.2°, 17.7°±0.2°, 18.8°±0.2°, 19.4°±0.2°, 19.7°±0.2°, 20.5°±0.2°, 21.3°±0.2°, 22.0°±0.2°, 24.5°±0.2°, 25.9°±0.2°, 26.4°±0.2°, 27.5°±0.2°, and 28.4°±0.2°.
10. The compound of claim 3 , wherein the compound is further characterized by a powder X-ray diffraction pattern comprising additional diffraction peaks at angles (2θ) of 11.4°±0.2°, 13.2°±0.2°, 14.5°±0.2°, 15.1°±0.2°, 15.6°±0.2°, 15.9°±0.2°, 17.7°±0.2°, 18.8°±0.2°, 19.4°±0.2°, 19.7°±0.2°, 2.5°±0.2°, 21.3°±0.2°, 22.0°±0.2°, 23.8°±0.2°, 24.5°±0.2°, 25.6°±0.2°, 25.9°±0.2°, 26.4°±0.2°, 27.5°±0.2°, 28.4°±0.2°, 28.8°±0.2°, and 30.4°±0.2°.