Memory system and operating method thereof
A memory system includes: a memory device; a run-time bad block detector suitable for storing information of super memory blocks, each including a run-time bad block, in a bad list; a bit-map manager suitable for generating a bit-map representing integrity information of memory blocks in each of the super memory blocks; a short super block manager suitable for designating, among the super memory blocks, a super memory block having a number of run-time bad blocks less than or equal to a threshold as a short super memory block based on the bad list and the bit-map, whenever a logical unit configuration command is received from a host; and a processor suitable for controlling the memory device to simultaneously access normal blocks among the memory blocks forming the designated short super memory block and to perform a normal operation, based on the bit-map.
1. A memory system, comprising:
a memory device;
a run-time bad block detector suitable for storing information of super memory blocks, each including a run-time bad block, in a bad list;
a bit-map manager suitable for generating a bit-map representing integrity information of memory blocks in each of the super memory blocks;
a short super block manager suitable for designating, among the super memory blocks, a super memory block having a number of run-time bad blocks less than or equal to a threshold as a short super memory block based on the bad list and the bit-map, whenever a logical unit configuration command is received from a host; and
a processor suitable for controlling the memory device to simultaneously access normal blocks among the memory blocks forming the designated short super memory block and to perform a normal operation, based on the bit-map.
2. The memory system of claim 1 , further comprising:
a host interface suitable for receiving the logical unit configuration command from the host.
3. The memory system of claim 1 , wherein the run-time bad block is an abnormal memory block which occurs as a result of repeatedly performing a program operation or an erase operation.
4. The memory system of claim 1 , wherein the short super block manager updates the bit-map after designating the short super memory block.
5. The memory system of claim 1 , wherein, when a first memory block in the short super block is a normal block, the bit-map manager stores a first logic value in an element corresponding to the first memory block in the bit-map.
6. The memory system of claim 1 , wherein, when a second memory block in the short super block is a run-time bad block, the bit-map manager stores a second logic value in an element corresponding to the second memory block in the bit-map.
7. The memory system of claim 1 , wherein the normal operation includes a program operation or an erase operation.
8. The memory system of claim 1 , wherein the short super block manager is configured to retain, among the super memory blocks, a super memory block having a number of run time bad blocks greater than the threshold in the bad list.
9. The memory system of claim 1 , wherein the processor calculates an erase/write cycle based on a unit of a super memory block.
10. The memory system of claim 2 , wherein the host interface provides a trigger signal to the short super block manager whenever the logical unit configuration command is received.
11. A method for operating a memory system, comprising:
storing information of super memory blocks, each including a run-time bad block, in a bad list;
generating a bit-map representing integrity information of memory blocks in each of the super memory blocks;
designating, among the super memory blocks, a super memory block having a number of run-time bad blocks less than or equal to a threshold as a short super memory block based on the bad list and the bit-map, whenever a logical unit configuration command is received from a host; and
simultaneously accessing normal blocks among the memory blocks forming the designated short super memory block and performing a normal operation based on the bit-map.
12. The method of claim 11 , further comprising:
receiving the logical unit configuration command from the host.
13. The method of claim 12 , wherein the run-time bad block is an abnormal memory block which occurs as a result of repeatedly performing a program operation or an erase operation.
14. The method of claim 11 , further comprising:
updating the bit-map after designating the short super memory block.
15. The method of claim 11 , wherein the generating of the bit-map includes
storing a first logic value in an element corresponding to a first memory block in the bit-map when the first memory block in the short super block is a normal block.
16. The method of claim 11 , wherein the generating of the bit-map includes
storing a second logic value in an element corresponding to a second memory block in the bit-map when the second memory block in the short super block is a run-time bad block.
17. The method of claim 11 , wherein the normal operation includes a program operation or an erase operation.
18. The method of claim 11 , wherein the designating of the super memory block includes
retaining, among the super memory blocks, a super memory block having a number of run-time bad blocks greater than the threshold in the bad list.
19. The method of claim 11 , wherein the simultaneous accessing of the normal blocks among the memory blocks forming the designated short super memory block and the performing of the normal operation based on the bit-map includes
calculating an erase/write cycle based on a unit of a super memory block.
20. The method of claim 12 , wherein the receiving of the logical unit configuration command from the host includes
generating a trigger signal whenever the logical unit configuration command is received.