IP Library Granted Patent US 11,270,983
Granted Patent B2
US 11,270,983 · App. 16/601,150 · Granted Mar 8, 2022

System and method for providing mechanical isolation of assembled diodes

Inventors: David Francis Courtney (McAllen, TX); Angel Mario Cano Garza (Monterrey, MX)
Assignee: SEMTECH CORPORATION
H01L25/072H01L23/14
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Quick Facts
Patent No.
US 11,270,983
App. No.
16/601,150
Granted
Mar 8, 2022
Kind
B2
Abstract

A circuit, comprising a diode, a conductive upper support disposed on top of the diode and electrically coupled to the diode, a conductive lower support disposed underneath the diode and electrically coupled to the diode, a mechanical support disposed adjacent to the diode, the conductive upper support and the conductive lower support, an insulator disposed underneath the mechanical support, an upper terminal coupled to the mechanical support and electrically coupled to the conductive upper support and a lower terminal coupled to the insulator and electrically coupled to the conductive lower support.

Claims (34)

1. A circuit, comprising:

a diode;

a conductive upper support disposed on top of the diode and electrically coupled to the diode;

a conductive lower support disposed underneath the diode and electrically coupled to the diode;

a mechanical support disposed adjacent to the diode, the conductive upper support and the conductive lower support;

an insulator disposed underneath the mechanical support;

an upper terminal coupled to the mechanical support and electrically coupled to the conductive upper support;

a lower terminal coupled to the insulator and electrically coupled to the conductive lower support, and wherein the diode is sealed in a glass material.

2. The circuit of claim 1 further comprising a second diode disposed adjacent to the mechanical support.

3. The circuit of claim 2 further comprising a second conductive upper support disposed on top of the second diode and electrically coupled to the second diode.

4. The circuit of claim 3 further comprising a second conductive lower support disposed underneath the second diode and electrically coupled to the second diode.

5. The circuit of claim 4 wherein the upper terminal is electrically coupled to the second conductive upper support.

6. The circuit of claim 5 wherein the lower terminal is electrically coupled to the second conductive lower support.

7. The circuit of claim 1 further comprising a second mechanical support disposed adjacent to the diode, the conductive upper support and the conductive lower support.

8. The circuit of claim 7 further comprising a second insulator disposed underneath the second mechanical support.

9. The circuit of claim 7 wherein the upper terminal is coupled to the second mechanical support and electrically coupled to the conductive upper support.

10. The circuit of claim 8 wherein the lower terminal is coupled to the second insulator and electrically coupled to the conductive lower support.

11. The circuit of claim 1 wherein the diode is fabricated from silicon or germanium.

12. The circuit of claim 1 wherein the conductive upper support is fabricated from aluminum, magnesium, tungsten, titanium or beryllium.

13. The circuit of claim 1 wherein the conductive lower support is fabricated from aluminum, magnesium, tungsten, titanium or beryllium.

14. The circuit of claim 1 wherein the mechanical support is fabricated from C10100 copper or C10200 copper.

15. The circuit of claim 1 wherein the insulator is fabricated from aluminum nitride.

16. The circuit of claim 1 wherein the upper terminal coupled is fabricated from C10100 copper or C10200 copper and is silver plated with gold and nickel under plate.

17. The circuit of claim 1 wherein the lower terminal is fabricated from C10100 copper or C10200 copper and is silver plated with gold and nickel under plate.

18. The circuit of claim 1 wherein the diode is sealed in a borosilicate glass material.

19. The circuit of claim 1 wherein the diode is sealed in a zinc borosilicate glass material.

20. A circuit, comprising:

a diode;

a conductive upper support disposed on top of the diode and electrically coupled to the diode;

a conductive lower support disposed underneath the diode and electrically coupled to the diode;

a mechanical support disposed adjacent to the diode, the conductive upper support and the conductive lower support, wherein the mechanical support is fabricated from C10100 copper or C10200 copper;

an insulator disposed underneath the mechanical support;

an upper terminal coupled to the mechanical support and electrically coupled to the conductive upper support; and

a lower terminal coupled to the insulator and electrically coupled to the conductive lower support.

Assignments (6)
ASSIGNMENT OF PATENT SECURITY INTEREST PREVIOUSLY RECORDED AT REEL/FRAME (050923/0146) Recorded Feb 17, 2023
From: HSBC BANK USA, NATIONAL ASSOCIATION, AS RESIGNING AGENT
To: JPMORGAN CHASE BANK, N.A., AS SUCCESSOR AGENT
Reel/Frame 062784/0081 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2022
From: SEMTECH CORPORATION
To: SEMTECH CORPUS CHRISTI CORPORATION
Reel/Frame 060353/0868 →
CHANGE OF NAME Recorded Jun 29, 2022
From: SEMTECH CORPUS CHRISTI CORPORATION
To: MICROSS CORPUS CHRISTI CORPORATION
Reel/Frame 060936/0832 →
RELEASE OF SECURITY INTEREST Recorded May 4, 2022
From: HSBC BANK USA, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
To: SEMTECH CORPORATION
Reel/Frame 060542/0492 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2019
From: COURTNEY, DAVID FRANCIS; GARZA, ANGEL MARIO CANO
To: SEMTECH CORPORATION
Reel/Frame 051072/0840 →
SECURITY INTEREST Recorded Nov 5, 2019
From: SEMTECH CORPORATION; SEMTECH NEW YORK CORPORATION; SIERRA MONOLITHICS, INC.; SEMTECH EV, INC.; TRIUNE SYSTEMS, L.L.C.; TRIUNE IP, LLC
To: HSBC BANK USA, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 050923/0146 →