IP Library Granted Patent US 11,595,017
Granted Patent B2
US 11,595,017 · App. 16/636,789 · Granted Feb 28, 2023

High Q acoustic resonator with dielectric flaps

Inventors: Thomas Pollard (Longwood, FL); Alexandre Augusto Shirakawa (San Diego, CA)
Assignee: RF360 Europe GMBH
H03H9/02086H03H9/132H03H9/173H03H9/175
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,595,017
App. No.
16/636,789
Granted
Feb 28, 2023
Kind
B2
Abstract

A high Q acoustic BAW resonator with high coupling and improved spurious mode suppression is given. The BAW resonator comprises an active resonator region (AR) formed by an overlap of the three layers bottom electrode (BE), piezoelectric layer (PL) and top electrode layer (TE). An inner-flap (IF) is formed by a dielectric 3D structure sitting on a marginal region (MR) of the active resonator region (AR) or adjacent thereto, extending inwardly towards the center thereof and having a section that runs in parallel and distant to the top surface of the resonator keeping an inner gap (IG) thereto or an angle Θ.

Claims (68)

1. A bulk acoustic wave (BAW) resonator, comprising:

a substrate;

a bottom electrode disposed above the substrate;

a piezoelectric layer disposed above the bottom electrode;

a top electrode disposed above the piezoelectric layer and electrically terminated at one side edge by a top electrode connection;

an active resonator region formed by an overlap of the bottom electrode, the piezoelectric layer, and the top electrode;

an inner-flap formed by a dielectric 3D structure, wherein the inner-flap:

is disposed on a first marginal region of the active resonator region or adjacent to the first marginal region of the active resonator region,

extends inwardly towards a center of the active resonator region, and

has a section parallel to a top surface of the BAW resonator; and

an outer-flap disposed above the top electrode connection, wherein the outer-flap:

extends away from the active resonator region, and

has a projecting section parallel to the top surface of the top electrode connection such that an outer gap is maintained between the projecting section and the top surface of the top electrode.

2. The BAW resonator of claim 1 , wherein:

the outer-flap and the inner-flap form a common 3D structure, and

the common 3D structure of the inner-flap and the outer-flap is at least partly arranged above a dielectric layer.

3. The BAW resonator of claim 1 , wherein the outer-flap extends along a perimeter of the active resonator region such that an outer extending gap is maintained between the outer-flap and an underlying layer at all peripheral positions of the underlying layer.

4. The BAW resonator of the claim 3 , wherein the inner-flap extends inwardly such that an inner gap of constant height is maintained between the inner-flap and the underlying layer.

5. The BAW resonator of claim 1 , further comprising a second marginal region, wherein:

in the second marginal region the top electrode has a first thickness that is less than a second thickness of the top electrode in the active resonator region, and

the second marginal region forms a step to the center of the active resonator region.

6. The BAW resonator of claim 1 , wherein the top electrode comprises a third marginal region, wherein:

in the third marginal region, a first thickness of an overlying passivation layer is less than a second thickness of the overlying passivation layer in the active resonator region, and

a third thickness of the top electrode is the same in the third marginal region and the active resonator region.

7. The BAW resonator of claim 6 , wherein the inner-flap follows a topography of a surface of the top electrode in the third marginal region such that an inner gap with a constant height is maintained between the inner-flap and the surface of the top electrode.

8. The BAW resonator of claim 1 , wherein a passivation layer covers the BAW resonator at least in the active resonator region.

9. The BAW resonator of claim 1 , wherein the substrate comprises a recess below the active resonator region forming an air-filled cavity.

10. The BAW resonator of claim 1 , wherein the substrate comprises a bragg mirror arranged below the active resonator region.

11. A bulk acoustic wave (BAW) resonator, comprising:

a substrate;

a bottom electrode disposed above the substrate;

a piezoelectric layer disposed above the bottom electrode;

a top electrode disposed above the piezoelectric layer and electrically terminated at one side edge by a top electrode connection;

an active resonator region formed by an overlap of the bottom electrode, the piezoelectric layer, and the top electrode;

an outer-flap disposed above the top electrode connection; and

an inner-flap formed by a dielectric 3D structure, wherein:

the outer-flap and the inner-flap form a common 3D structure,

the common 3D structure of the inner-flap and the outer-flap is at least partly arranged above a dielectric layer, and

the inner-flap:

is disposed on a first marginal region of the active resonator region or adjacent to the first marginal region of the active resonator region,

extends inwardly towards a center of the active resonator region, and has a section parallel to a top surface of the BAW resonator.

12. The BAW resonator of the claim 11 , wherein the inner-flap extends inwardly such that an inner gap of constant height is maintained between the inner-flap and an underlying layer.

13. The BAW resonator of claim 11 , further comprising a second marginal region, wherein:

in the second marginal region the top electrode has a first thickness that is less than a second thickness of the top electrode in the active resonator region,

the second marginal region forms a step to the center of the active resonator region, and

the top electrode comprises a third marginal region, wherein:

in the third marginal region, a first thickness of an overlying passivation layer is less than a second thickness of the overlying passivation layer in the active resonator region, and

a third thickness of the top electrode is the same in the third marginal region and the active resonator region.

14. The BAW resonator of claim 13 , wherein the inner-flap follows a topography of a surface of the top electrode in the third marginal region such that an inner gap with a constant height is maintained between the inner-flap and the surface of the top electrode.

15. A bulk acoustic wave (BAW) resonator, comprising:

a substrate;

a bottom electrode disposed above the substrate;

a piezoelectric layer disposed above the bottom electrode;

a top electrode disposed above the piezoelectric layer and electrically terminated at one side edge by a top electrode connection;

an active resonator region formed by an overlap of the bottom electrode, the piezoelectric layer, and the top electrode;

an outer-flap disposed above the top electrode connection; and

an inner-flap formed by a dielectric 3D structure, wherein:

the outer-flap extends along a perimeter of the active resonator region such that an outer extending gap is maintained between the outer-flap and an underlying layer at all peripheral positions of the underlying layer, and

the inner-flap:

is disposed on a first marginal region of the active resonator region or adjacent to the first marginal region of the active resonator region,

extends inwardly towards a center of the active resonator region.

16. The BAW resonator of the claim 15 , wherein the inner-flap extends inwardly such that an inner gap of constant height is maintained between the inner-flap and an underlying layer.

17. The BAW resonator of claim 15 , further comprising a second marginal region, wherein:

in the second marginal region the top electrode has a first thickness that is less than a second thickness of the top electrode in the active resonator region,

the second marginal region forms a step to the center of the active resonator region, and the top electrode comprises a third marginal region, wherein:

in the third marginal region, a first thickness of an overlying passivation layer is less than a second thickness of the overlying passivation layer in the active resonator region, and

a third thickness of the top electrode is the same in the third marginal region and the active resonator region.

18. The BAW resonator of claim 17 , wherein the inner-flap follows a topography of a surface of the top electrode in the third marginal region such that an inner gap with a constant height is maintained between the inner-flap and the surface of the top electrode.

Assignments (5)
CHANGE OF OWNER'S ADDRESS Recorded Nov 22, 2024
From: RF360 SINGAPORE PTE. LTD.
To: RF360 SINGAPORE PTE. LTD.
Reel/Frame 069761/0931 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2023
From: RF360 EUROPE GMBH
To: RF360 SINGAPORE PTE. LTD.
Reel/Frame 063272/0475 →
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY DATA PREVIOUSLY RECORDED AT REEL: 053431 FRAME: 0768. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Aug 13, 2020
From: POLLARD, THOMAS; SHIRAKAWA, ALEXANDRE AUGUSTO
To: RF360 EUROPE GMBH
Reel/Frame 053485/0911 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2020
From: QUALCOMM INCORPORATED
To: RF360 EUROPE GMBH
Reel/Frame 053431/0768 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2020
From: POLLARD, THOMAS; SHIRAKAWA, ALEXANDRE AUGUSTO
To: QUALCOMM INCORPORATED
Reel/Frame 053100/0984 →
Priority Claims (1)
DE 10 2017 118 804.5 · Aug 17, 2017 · national
Continuity (1)
Related Publication 20200366266A1 · Nov 19, 2020
Cited By (2)
US 12,620,959 US 12,665,564