Atomic force microscope, atomic force microscopy, and controlling method of an atomic force microscopy

1. An atomic force microscope comprising;

a raster scan control mechanism configured to perform a raster scan between a cantilever having a probe at a free end and a sample relative to each other across an XY plane in a fluid;

an interaction control mechanism configured to vibrate the cantilever and to control an interaction generated between the probe and the sample; and

a sample information acquisition circuit configured to acquire sample information including inclination information of a sample surface with respect to the XY plane based on a control result of the interaction control mechanism,

the interaction control mechanism being configured to control the interaction generated between the probe and the sample in accordance with inclination of the sample surface with respect to the XY plane.

2. The atomic force microscope according to claim 1 , wherein

the interaction control mechanism is configured to control the interaction generated between the probe and the sample based on correction information for correcting change in influence of interaction between the cantilever and the fluid caused by the inclination of the sample surface with respect to the XY plane.

3. The atomic force microscope according to claim 1 , wherein

the interaction control mechanism comprises:

a vibration element configured to vibrate the cantilever;

a vibration signal generation circuit configured to generate a vibration signal for causing the vibration element to vibrate the cantilever in a predetermined vibration state, and to supply the vibration signal to the vibration element;

an interaction detection sensor configured to detect a vibration state of the cantilever, and to output the vibration state as interaction information including information on the interaction between the probe and the sample;

an interaction reference information setting circuit in which interaction reference information indicating a desired magnitude of the interaction between the probe and the sample is set;

a Z scanner configured to perform a scan between the cantilever and the sample relative to each other along a Z axis perpendicular to the XY plane;

a Z control circuit configured to control the Z scanner based on a deviation between the interaction information and the interaction reference information; and

an inclination correction circuit configured to change a magnitude of at least one of the vibration signal, a signal of the interaction information, and a signal of the interaction reference information, in accordance with the inclination of the sample surface with respect to the XY plane.

4. The atomic force microscope according to claim 3 , wherein

the inclination correction circuit comprises an inclination correction information generation circuit configured to generate inclination correction information based on the inclination information of the sample surface with respect to the XY plane, and an adjustment circuit configured to change a magnitude of at least one of the vibration signal, the signal of the interaction information, and the signal of the interaction reference information by operating at least one of the vibration signal, the interaction information, and the interaction reference information with the inclination correction information.

5. The atomic force microscope according to claim 4 , wherein

the inclination correction information is composed of X inclination correction information on an inclination of the sample surface along an X axis, and Y inclination correction information on an inclination of the sample surface along a Y axis.

6. The atomic force microscope according to claim 3 , wherein

the raster scan control mechanism comprises an X scanner configured to perform a scan between the cantilever and the sample relative to each other along an X axis, a Y scanner configured to perform a scan between the cantilever and the sample relative to each other along a Y axis, and an XY control circuit configured to generate an X scanning signal and a Y scanning signal, thereby respectively controlling the X scanner and the Y scanner, and

the inclination correction circuit comprises an adjustment circuit configured to change a magnitude of at least one of the vibration signal, the signal of the interaction information, and the signal of the interaction reference information by operating at least one of the vibration signal, the signal of the interaction information, and the signal of the interaction reference information with the X scanning signal and the Y scanning signal.

7. An atomic force microscopy comprising:

a sample table configured to hold a sample in a fluid;

a cantilever configured to move relative to the sample table; and

one or more circuits configured to:

scan the cantilever across an XY plane of the sample in the fluid while vibrating the cantilever;

detect a first interaction between the cantilever and the sample;

calculate an inclination on a surface of the sample based on the first interaction;

control an interaction between the cantilever and the sample based on the inclination.

8. The atomic force microscopy according to claim 7 ,

wherein the one or more circuits are configured to:

receive correction information based on the inclination, the correction information is relative to a second interaction between the cantilever and an external environment of the sample; and

control the interaction between the cantilever and the sample based on the inclination and the correction information.

9. The atomic force microscopy according to claim 7 ,

wherein the one or more circuits configured to:

receive correction information based on the inclination, the correction information is relative to a second interaction between the cantilever and an external environment of the cantilever; and

control the interaction between the cantilever and the sample based on the inclination and the correction information.

10. The atomic force microscopy according to claim 7 ,

wherein the one or more circuits configured to:

detect a vibration state of the cantilever;

detect the first interaction based on the vibration state;

generate a signal so as to vibrate the cantilever based on the inclination.

11. A controlling method of an atomic force microscopy, the controlling method comprising:

scanning a cantilever across an XY plane of a sample in a fluid while vibrating the cantilever;

detecting a first interaction between the cantilever and the sample;

calculating an inclination relative to the XY plane on a surface of the sample based on the first interaction;

controlling an interaction between the cantilever and the sample based on the inclination.

12. The controlling method according to claim 11 , further comprising:

receiving correction information based on the inclination; and

wherein the controlling method comprises controlling the interaction between the cantilever and the sample based on the inclination and the correction information,

wherein the correction information is relative to a second interaction between the cantilever and an external environment of the sample.

13. The controlling method according to claim 11 , further comprising:

receiving correction information based on the inclination; and

wherein the controlling method comprises controlling the interaction between the cantilever and the sample based on the inclination and the correction information,

wherein the correction information is relative to a second interaction between the cantilever and an external environment of the cantilever.

14. The controlling method according to claim 11 , further comprising:

detecting a vibration state of the cantilever;

detecting the first interaction based on the vibration state;

generating a signal so as to vibrate the cantilever based on the inclination.