Diagnostics for impedance matching network
In one embodiment, the present disclosure is directed to a method for performing diagnostics on a matching network that utilizes an electronically variable capacitor (EVC). According to the method, all the discrete capacitors of the EVC are switched out. At a first node, a parameter associated with a current flowing between a power supply and one or more of the switches of the discrete capacitors is measured. The method then switches in, one at a time, each discrete capacitor of the EVC. Upon the switching in of each discrete capacitor, the method remeasures the parameter at the first node and determines whether a change to the parameter at the first node is within a predetermined range to determine whether the corresponding switch, driver circuit, or filter of the discrete capacitor most recently switch in has failed.
1. A method for performing diagnostics on a matching network, the method comprising:
a) operably coupling a matching network between a radio frequency (RF) source and a plasma chamber, the matching network comprising an electronically variable capacitor (EVC), the EVC comprising a plurality of discrete capacitors, each discrete capacitor having a corresponding switch configured to switch in and switch out the discrete capacitor to alter a total capacitance of the EVC, each switch having a corresponding driver circuit and filter, and each driver circuit comprising a power supply;
b) switching out all the discrete capacitors of the plurality of discrete capacitors of the EVC;
c) upon performing step b), measuring at a first node a parameter associated with a current flowing between the power supply and the switches of the discrete capacitors;
d) switching in, one at a time, each discrete capacitor of the plurality of discrete capacitors using its corresponding switch;
e) upon the switching in of each discrete capacitor, re-measuring the parameter at the first node and determining whether a change to the parameter at the first node is within a predetermined range; and
f) upon determining that the change to the parameter is not within the predetermined range, providing an indication that the corresponding switch, driver circuit, or filter of the discrete capacitor most recently switch in has failed.
2. The method of claim 1 wherein the switch is a PIN diode.
3. The method of claim 1 wherein the parameter is a current value of the current flowing between the power supply and the switches of the discrete capacitors, or is a current value of a current flowing to the input of the power supply.
4. The method of claim 1 wherein the first node is at an input or an output of the power supply, is in the filter path between the driver circuit and the switch, or is at a terminal of the switch.
5. The method of claim 1 wherein:
the switch is a PIN diode;
the power supply is a low-voltage power supply for forward biasing the PIN diode to turn the PIN diode ON and thereby switch in the discrete capacitor; and
the driver circuit further comprises a high-voltage power supply for reverse-biasing the PIN diode to turn the PIN diode OFF and thereby switch out the discrete capacitor.
6. The method of claim 5 wherein:
steps a) to f) are performed while the high-voltage power supply is OFF and the low-voltage power supply is ON; and
subsequently, steps b) to f) are repeated while the high-voltage DC power supply is ON, except that the measuring and the re-measuring of the parameter is a measuring and a re-measuring of a parameter associated with a current flowing between the high-voltage power supply and the switches of the discrete capacitors.
7. The method of claim 1 wherein, before a new discrete capacitor is switched in, the other discrete capacitors of the plurality of discrete capacitors are switched out.
8. The method of claim 1 wherein, when a new discrete capacitor is switched in, the previously switched-in capacitors remain switched in.
9. A matching network comprising:
an RF input operably coupled to an RF source;
an RF output operably coupled to a plasma chamber;
an electronically variable capacitor (EVC) comprising a plurality of discrete capacitors, each discrete capacitor having a corresponding switch configured to switch in and switch out the discrete capacitor to alter a total capacitance of the EVC, each switch having a corresponding driver circuit and filter, and each driver circuit comprising a power supply;
a sensor; and
a control circuit configured to send control signals to carry out the steps of:
a) switching out all the discrete capacitors of the plurality of discrete capacitors of the EVC;
b) upon performing step a), measuring at a first node, via the sensor, a parameter associated with a current flowing between the power supply and the switches of the discrete capacitors;
c) switching in, one at a time, each discrete capacitor of the plurality of discrete capacitors using its corresponding switch;
d) upon the switching in of each discrete capacitor, re-measuring the parameter at the first node and determining whether a change to the parameter at the first node is within a predetermined range; and
e) upon determining that the change to the parameter is not within the predetermined range, providing an indication that the corresponding switch, the driver circuit, or the filter of the discrete capacitor most recently switch in has failed.
10. The matching network of claim 9 wherein the switch is a PIN diode.
11. The matching network of claim 9 wherein the parameter is a current value of the current flowing between the power supply and the switches of the discrete capacitors, or is a current value of a current flowing to the input of the power supply.
12. The matching network of claim 9 wherein the first node is at an input or an output of the power supply, is in the filter path between the driver circuit and the switch, or is at a terminal of the switch.
13. The matching network of claim 9 wherein:
the switch is a PIN diode;
the power supply is a low-voltage power supply for forward biasing the PIN diode to turn the PIN diode ON and thereby switch in the discrete capacitor; and
the driver circuit further comprises a high-voltage power supply for reverse-biasing the PIN diode to turn the PIN diode OFF and thereby switch out the discrete capacitor.
14. The matching network of claim 13 wherein:
steps a) to e) of the control circuit are performed while the high-voltage power supply is OFF and the low-voltage power supply is ON; and
subsequently, steps b) to e) are repeated while the high-voltage DC power supply is ON, except that the measuring and the re-measuring of the parameter is a measuring and a re-measuring of a parameter associated with a current flowing between the high-voltage power supply and the switches of the discrete capacitors.
15. The matching network of claim 9 wherein, before a new discrete capacitor is switched in, the other discrete capacitors of the plurality of discrete capacitors are switched out.
16. The matching network of claim 9 wherein, when a new discrete capacitor is switched in, the previously switched-in capacitors remain switched in.
17. A semiconductor processing tool comprising:
a plasma chamber configured to deposit a material onto a substrate or etch a material from the substrate; and
an impedance matching network operably coupled to the plasma chamber, the matching network comprising:
an RF input configured to operably couple to an RF source;
an RF output configured to operably couple to the plasma chamber;
an electronically variable capacitor (EVC) comprising a plurality of discrete capacitors, each discrete capacitor having a corresponding switch configured to switch in and switch out the discrete capacitor to alter a total capacitance of the EVC, each switch having a corresponding driver circuit and filter, and each driver circuit comprising a power supply;
a sensor; and
a control circuit configured to send control signals to carry out the steps of:
a) switching out all the discrete capacitors of the plurality of discrete capacitors of the EVC;
b) upon performing step a), measuring at a first node, via the sensor, a parameter associated with a current flowing between the power supply and the switches of the discrete capacitors;
c) switching in, one at a time, each discrete capacitor of the plurality of discrete capacitors using its corresponding switch;
d) upon the switching in of each discrete capacitor, re-measuring the parameter at the first node and determining whether a change to the parameter at the first node is within a predetermined range; and
e) upon determining that the change to the parameter is not within the predetermined range, providing an indication that the corresponding switch, the driver circuit, or the filter of the discrete capacitor most recently switch in has failed.