IP Library Granted Patent US 11,237,133
Granted Patent B2
US 11,237,133 · App. 16/690,639 · Granted Feb 1, 2022

Comolded non-destructive inspection standard functioning as a bond bump

Inventors: David R. Lyders (Glastonbury, CT); Andrew Pope (Glendale, NY); Christopher Avery (Malvern, PA); Daniel A. Rodrigues (Glastonbury, CT)
Assignee: Raytheon Technologies Corporation
G01N29/11G01N29/30G01N21/86G01N23/046G01N23/083G01N2021/869
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Quick Facts
Patent No.
US 11,237,133
App. No.
16/690,639
Granted
Feb 1, 2022
Kind
B2
Abstract

An inspection feature for an adhesive bond portion between parts of a component comprising the inspection feature extending from a surface of the part of the component a predetermined bond line thickness, the inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.

Claims (32)

1. An inspection feature for an adhesive bond portion between parts of a component comprising:

said inspection feature extending from a surface of the part of the component a predetermined bond line thickness, said inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.

2. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature defines the predetermined bond line thickness which is a minimum thickness of the bond line.

3. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature is co-molded with the part.

4. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature is adhered to the surface of the part.

5. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature comprises a density such that the shade in a non-destructive inspection scan image of the inspection feature is similar in shade to the image of the defect.

6. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature has a non-naturally occurring shape.

7. The inspection feature for an adhesive bond portion between parts of a component according to claim 1 , wherein said inspection feature comprises a density from about 0.0013 g/cm 3 to about 0.5 g/cm 3 .

8. A component having parts bonded together by an adhesive bond portion comprising:

a first part attachable to a second part;

a bond line thickness defined by the adhesive bond portion coupling said first part to said second part;

an inspection feature extending a predetermined bond line thickness from a surface of at least one of the first part and the second part, said inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.

9. The component having parts bonded together by an adhesive bond portion according to claim 8 , wherein said inspection feature is configured to produce an image produced from the non-destructive inspection scan having a shade that distinguishes from the shade of the adhesive bond portion.

10. The component having parts bonded together by an adhesive bond portion according to claim 8 , wherein said inspection feature is configured to produce an image produced from the non-destructive inspection scan having a shade of the defect.

11. The component having parts bonded together by an adhesive bond portion according to claim 8 , wherein said inspection feature is configured to produce an image from the non-destructive inspection scan having a non-naturally occurring shape.

12. The component having parts bonded together by an adhesive bond portion according to claim 8 , wherein said defect comprises at least one of a void, gap, and crack.

13. The component having parts bonded together by an adhesive bond portion according to claim 8 , wherein said inspection feature is configured to set a non-destructive examination standard configured to determine said defect being present in the adhesive bond portion.

14. A process for use of an inspection feature for an adhesive bond portion between a first part and a second part of a component comprising:

forming an inspection feature extending a predetermined bond line thickness from a surface of at least one of the first part and the second part,

forming the adhesive bond portion coupling said first part to said second part to form the component;

scanning said inspection feature and said adhesive bond portion with a non-destructive inspection scan; and

creating an image from the non-destructive inspection scan, wherein said inspection feature comprises a density configured to imitate a defect within the adhesive bond portion responsive to the non-destructive inspection scan.

15. The process of claim 14 , further comprising:

producing the image of the inspection feature from the non-destructive inspection scan having a shade of the defect.

16. The process of claim 14 , further comprising:

producing an image of the inspection feature from the non-destructive inspection scan having a non-naturally occurring shape.

17. The process of claim 14 , further comprising:

setting a non-destructive examination standard utilizing the inspection feature, said standard configured to determine the defect being present in the adhesive bond portion.

18. The process of claim 17 , further comprising

utilizing said non-destructive examination standard to form an image to compare with the image of the defect in the adhesive bond portion.

19. The process of claim 14 , wherein said inspection feature defines the predetermined bond line thickness which is a minimum thickness of the bond line.

20. The process of claim 14 , wherein said defect comprises at least one of a void, gap, and crack.

Assignments (4)
CHANGE OF NAME Recorded Jul 27, 2023
From: RAYTHEON TECHNOLOGIES CORPORATION
To: RTX CORPORATION
Reel/Frame 064714/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE SPELLING ON THE ADDRESS 10 FARM SPRINGD ROAD FARMINGTONCONNECTICUT 06032 PREVIOUSLY RECORDED ON REEL 057190 FRAME 0719. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT SPELLING OF THE ADDRESS 10 FARM SPRINGS ROAD FARMINGTON CONNECTICUT 06032. Recorded Aug 19, 2021
From: UNITED TECHNOLOGIES CORPORATION
To: RAYTHEON TECHNOLOGIES CORPORATION
Reel/Frame 057226/0390 →
CHANGE OF NAME Recorded Aug 16, 2021
From: UNITED TECHNOLOGIES CORPORATION
To: RAYTHEON TECHNOLOGIES CORPORATION
Reel/Frame 057190/0719 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2019
From: LYDERS, DAVID R.; POPE, ANDREW; AVERY, CHRISTOPHER; RODRIGUES, DANIEL A.
To: UNITED TECHNOLOGIES CORPORATION
Reel/Frame 051076/0777 →