Analysis of antimicrobial coatings using XRF
A method of quantifying an antimicrobial coatings using a handheld XRF analyzer is disclosed. The method provides an estimate of the expected level of antimicrobial efficacy for a thin film comprising silicon and/or titanium by obtaining a 14 Si or 22 Ti peak intensity using XRF spectroscopy and converting the obtained 14 Si or 22 Ti peak intensity to the expected level of efficacy using a calibration curve. A properly calibrated handheld XRF analyzer allows a user to assess the viability of antimicrobial coatings in the field, such as in a hospital where various fomites may be coated with silane and/or titanium compositions.
1. A method of estimating an expected level of residual antimicrobial efficacy for an antimicrobial coating comprising silicon and/or titanium, the method comprising:
obtaining 14 Si or 22 Ti photon counts from the antimicrobial coating using XRF spectroscopy; and
converting the obtained 14 Si or 22 Ti photon counts to the expected level of residual antimicrobial efficacy using a calibration curve.
2. The method of claim 1 , wherein the antimicrobial coating comprises a silane selected from the group consisting of 3-(trimethoxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-(trihydroxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-chloropropyltrimethoxysilane, 3-chloropropyltriethoxysilane, 3-chloropropyl silanetriol, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyl silanetriol, homopolymers therefrom, and mixtures thereof.
3. The method of claim 1 , wherein the antimicrobial coating comprises nanoparticulate TiO 2 .
4. The method of claim 1 , wherein the step of obtaining the 14 Si or 22 Ti photon counts comprises irradiation of the antimicrobial coating with X-rays emanating from a handheld XRF analyzer and detecting X-ray emissions from the coating.
5. The method of claim 1 , wherein the calibration curve comprises an x/y plot of the expected level of residual antimicrobial efficacy for a desired microorganism versus the 14 Si or 22 Ti photon counts.
6. A method of measuring a thickness of an antimicrobial coating comprising silicon and/or titanium on an environmental surface, the method comprising:
obtaining initial 14 Si or 22 Ti photon counts from the antimicrobial coating using XRF spectroscopy;
subjecting the antimicrobial coating to mechanical abrasion;
obtaining 14 Si or 22 Ti photon counts from the antimicrobial coating after mechanical abrasion using XRF spectroscopy; and
converting the obtained 14 Si or 22 Ti photon counts to the thickness of the antimicrobial coating after mechanical abrasion using a calibration curve,
wherein the mechanical abrasion correlates to handling of the environmental surface.
7. The method of claim 6 , wherein the antimicrobial coating comprises an organosilane selected from the group consisting of 3-(trimethoxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-(trihydroxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-chloropropyltrimethoxysilane, 3-chloropropyltriethoxysilane, 3-chloropropyl silanetriol, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyl silanetriol, homopolymers therefrom, and mixtures thereof.
8. The method of claim 6 , wherein the antimicrobial coating comprises nanoparticulate TiO 2 .
9. The method of claim 6 , wherein the step of obtaining the 14 Si or 22 Ti photon counts comprises irradiation of the antimicrobial coating with X-rays emanating from a handheld XRF analyzer and detecting X-ray emissions from the coating.
10. The method of claim 6 , wherein the calibration curve comprises an x/y plot of antimicrobial coating thickness versus 14 Si or 22 Ti photon counts.
11. A method of measuring a weight per unit of surface area of an antimicrobial coating comprising silicon and/or titanium on an environmental surface, the method comprising:
obtaining initial 14 Si or 22 Ti photon counts from the antimicrobial coating using XRF spectroscopy;
subjecting the antimicrobial coating to mechanical abrasion;
obtaining 14 Si or 22 Ti photon counts from the antimicrobial coating after mechanical abrasion using XRF spectroscopy; and
converting the obtained 14 Si or 22 Ti photon counts to the weight per unit of surface area of the antimicrobial coating after mechanical abrasion using a calibration curve,
wherein the mechanical abrasion correlates to handling of the environmental surface.
12. The method of claim 11 , wherein the antimicrobial coating comprises an organosilane selected from the group consisting of 3-(trimethoxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-(trihydroxysilyl) propyl dimethyl octadecyl ammonium chloride, 3-chloropropyltrimethoxysilane, 3-chloropropyltriethoxysilane, 3-chloropropylsilanetriol, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyl silanetriol, homopolymers therefrom, and mixtures thereof.
13. The method of claim 11 , wherein the antimicrobial coating comprises nanoparticulate TiO 2 .
14. The method of claim 11 , wherein the step of obtaining the 14 Si or 22 Ti photon counts comprises irradiation of the antimicrobial coating with X-rays emanating from a handheld XRF analyzer and detecting X-ray emissions from the coating.
15. The method of claim 11 , wherein the calibration curve comprises an x/y plot of weight per unit of surface area of the antimicrobial coating versus 14 Si or 22 Ti photon counts.