Optical sources for fluorescent lifetime analysis
Compact optical sources and methods for producing short and ultrashort optical pulses are described. A semiconductor laser or LED may be driven with a bipolar waveform to generate optical pulses with FWHM durations as short as approximately 85 ps having suppressed tail emission. The pulsed optical sources may be used for fluorescent lifetime analysis of biological samples and time-of-flight imaging, among other applications.
1. A pulsed optical source comprising:
a semiconductor diode configured to emit light;
a driving circuit that includes a transistor coupled to a terminal of the semiconductor diode, wherein the driving circuit is configured to receive a unipolar pulse and apply a bipolar electrical pulse to the semiconductor diode responsive to receiving the unipolar pulse; and
a pulse generator coupled to the driving circuit and configured to form the unipolar pulse and output the unipolar pulse to the driving circuit, the pulse generator comprising a first logic gate that forms the unipolar pulse from two differential clock signals.
2. The pulsed optical source of claim 1 , wherein the bipolar electrical pulse comprises a first pulse having a first magnitude and first polarity that is followed by a second pulse of opposite polarity having a second magnitude different from the first magnitude.
3. The pulsed optical source of claim 2 , wherein the second magnitude is between 25% and 90% of the first magnitude.
4. The pulsed optical source of claim 1 , further comprising multiple wire bonds connected to a terminal of the semiconductor diode.
5. The pulsed optical source of claim 1 , wherein a pulse length of the unipolar pulse is between 50 ps and 500 ps.
6. The pulsed optical source of claim 1 , wherein the pulse generator further comprises an adjustable delay element configured to vary a pulse length of the unipolar pulse in increments between 1 ps and 5 ps.
7. The pulsed optical source of claim 1 , wherein the transistor has current-carrying terminals connected between a cathode of the semiconductor diode and a reference potential and has a gate terminal coupled to the first logic gate.
8. The pulsed optical source of claim 7 , further comprising a capacitor connected between the gate terminal of the transistor and an output from the first logic gate.
9. The pulsed optical source of claim 7 , wherein the transistor comprises a high-electron-mobility field-effect transistor.
10. The pulsed optical source of claim 7 , wherein the transistor is configured to switch up to 4 amps through the semiconductor diode for a duration between 50 ps and 2 ns.
11. The pulsed optical source of claim 7 , further comprising a second logic gate connected in parallel with the first logic gate and arranged to form a second unipolar pulse from the two differential clock signals, wherein an output from the second logic gate is coupled to the gate terminal of the transistor.
12. The pulsed optical source of claim 7 , wherein a drain terminal of the transistor connects directly to a cathode of the semiconductor diode.
13. The pulsed optical source of claim 12 , further comprising a first capacitor and resistor connected in parallel to the drain terminal.
14. The pulsed optical source of claim 13 , further comprising a second capacitor connected between an anode of the semiconductor diode and a source terminal of the transistor.
15. The pulsed optical source of claim 1 , wherein an optical pulse having a full-width-half maximum duration between 50 ps and 500 ps is emitted from the semiconductor diode responsive to application of the bipolar electrical pulse.
16. The pulsed optical source of claim 15 , wherein the optical pulse has a characteristic wavelength selected from the following group: 270 nm, 280 nm, 325 nm, 340 nm, 370 nm, 380 nm, 400 nm, 405 nm, 410 nm, 450 nm, 465 nm, 470 nm, 490 nm, 515 nm, 640 nm, 665 nm, 808 nm, and 980 nm.
17. The pulsed optical source of claim 15 , wherein a tail of the optical pulse remains below at least 20 dB from the peak of the pulse after 250 ps from the peak of the pulse.
18. The pulsed optical source of claim 1 , further comprising a saturable absorber arranged to receive an optical pulse from the semiconductor diode.
19. The pulsed optical source of claim 1 , further comprising:
a photodetector array having a plurality of pixels that are each configured to discriminate photon arrival times into at least two time bins during a single charge-accumulation interval; and
an optical system arranged to form an image of an object, that is illuminated by the pulsed optical source, on the photodetector array.
20. A fluorescent lifetime analysis system comprising:
a driving circuit configured to apply a bipolar current pulse to a semiconductor diode to produce an optical pulse that is delivered to a sample; and
a photodetector configured to discriminate photon arrival times into at least two time bins during a single charge-accumulation interval of the photodetector.
21. The system of claim 20 , further comprising a pulse generator arranged to provide an electrical pulse to the driving circuit, wherein the driving circuit is configured to apply a bipolar pulse to the semiconductor diode responsive to receiving the electrical pulse.
22. The system of claim 21 , wherein the electrical pulse is a unipolar pulse having a duration between 50 ps and 2 ns.
23. The system of claim 21 , wherein the driving circuit comprises a transistor having a gate terminal coupled to an output from the pulse generator and having current-carrying terminals connected between a terminal of the semiconductor diode and a reference potential.
24. The system of claim 23 , further comprising:
a first resistor and a first capacitor connected in parallel between an anode and a cathode of the semiconductor diode; and
a second resistor and a second capacitor connected in parallel between the gate terminal of the transistor and the reference potential.
25. The system of claim 20 , further comprising multiple wire bonds connected to a terminal of the semiconductor diode.
26. The system of claim 20 , wherein the optical pulse has a full-width-half-maximum duration between 50 ps and 500 ps.
27. The system of claim 20 , wherein the optical pulse has a characteristic wavelength selected from the following group: 270 nm, 280 nm, 325 nm, 340 nm, 370 nm, 380 nm, 400 nm, 405 nm, 410 nm, 450 nm, 465 nm, 470 nm, 490 nm, 515 nm, 640 nm, 665 nm, 808 nm, and 980 nm.
28. The system of claim 20 , further comprising an array of photodetectors in which the photodetector is located, the array of photodetectors configured to time-bin fluorescence from the sample during a single charge-accumulation interval for the optical pulse.
29. The system of claim 28 , further comprising imaging optics located between the sample and the array of photodetectors, wherein the imaging optics are arranged to form an image at the array of photodetectors of a region of the sample illuminated by the optical pulse.
30. The system of claim 29 , wherein the image formed at the array of photodetectors is an image of a microscopic region of the sample.