IP Library Granted Patent US 11,828,849
Granted Patent B2
US 11,828,849 · App. 16/765,443 · Granted Nov 28, 2023

Illumination device, time of flight system and method

Inventor: Daniel Van Nieuwenhove (Hofstade, BE)
Assignee: Sony Semiconductor Solutions Corporation
G01S17/89F21V5/04G01S7/4815G01S17/894
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Quick Facts
Patent No.
US 11,828,849
App. No.
16/765,443
Granted
Nov 28, 2023
Kind
B2
Abstract

An illumination device for time-of-flight detection has a light emitting unit for emitting a light ray pattern for generating a light pattern, and a lens portion for focusing the emitted light ray pattern at a predefined focal point at a predefined distance to the lens portion for generating the light pattern.

Claims (24)

1. An illumination device for time-of-flight detection, comprising: a light emitting unit configured to emit a light ray pattern for generating a light pattern; and a lens portion configured to focus the emitted light ray pattern at a predefined focal point at a predefined distance to the lens portion for generating the light pattern,

wherein the light ray pattern includes dots;

wherein the lens portion is further configured to adjust the predefined focal point to an adjusted focal point in response to information received about a current distance;

wherein the light emitting unit is further configured to adjust an intensity of the light ray pattern in response to the information received about the current distance; and

wherein the current distance is determined based, at least in part, on detected reflected light from the light ray pattern.

2. The illumination device of claim 1 , wherein the light emitting unit includes at least one diffractive optical element for generating the light ray pattern.

3. The illumination device of claim 1 , wherein the light emitting unit includes at least one laser element.

4. The illumination device of claim 3 , wherein the at least one laser element includes a vertical-cavity surface emitting laser.

5. The illumination device of claim 3 , wherein the light emitting unit includes a plurality of laser elements, which are arranged in an array.

6. The illumination device of claim 1 , wherein the lens portion includes a lens system.

7. The illumination device of claim 1 , wherein the lens portion includes at least one liquid lens.

8. The illumination device of claim 1 , wherein the lens portion is configured to adapt a light ray direction.

9. A time-of-flight system, comprising: an illumination device for time-of-flight detection, including: a light emitting unit configured to emit a light ray pattern for generating a light pattern; and a lens configured to focus the emitted light ray pattern at a predefined focal point distant to the lens; and a time-of-flight sensor for detecting reflected light originating from the emitted light ray pattern,

wherein the light ray pattern includes dots; and

wherein the illumination device is configured to adjust one or more of: an intensity of the emitted light ray pattern, a direction of the emitted light ray pattern, or a focal distance of the system in response to information about the reflected light from the time-of-flight sensor.

10. The time-of-flight system of claim 9 , wherein the focal distance of the emitted light ray pattern is configured based on input parameters or a measured depth.

11. The time-of-flight system of claim 9 , further comprising a circuitry configured to analyze the reflected light detected by the time-of-flight sensor.

12. A method for time-of-flight detection, comprising: emitting a light ray pattern through a lens portion, thereby generating a light pattern at a predefined focal point at a predefined distance to the lens portion; detecting reflected light originating from the emitted light ray pattern, wherein the light ray pattern includes dots; adjusting the predefined focal point to an updated focal point in response to at least one attribute of the detected reflected light; and adjusting an intensity of the light ray pattern in response to at least one attribute of the detected reflected light.

13. The method of claim 12 , further comprising analyzing the reflected light.

14. The method of claim 13 , wherein analyzing the reflected light includes determining a light pattern or valleys in the reflected light.

15. The method of claim 14 , wherein the light pattern and valleys are detected, based on a threshold value.

16. The method of claim 12 , wherein the intensity is adjusted together with the light ray direction.

17. The method of claim 16 , further comprising calculating a depth, based on the detected reflected light.

18. The method of claim 17 , wherein the at least one attribute of the detected reflected light comprises the calculated depth.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2021
From: VAN NIEUWENHOVE, DANIEL
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 055221/0726 →
Priority Claims (1)
EP 17204232 · Nov 28, 2017 · regional
Continuity (1)
Related Publication 20200319309A1 · Oct 8, 2020