IP Library Granted Patent US 11,455,052
Granted Patent B2
US 11,455,052 · App. 16/768,262 · Granted Sep 27, 2022

Detection apparatus

Inventor: Themistoklis Afentakis (Camas, WA)
Assignee: PERATECH HOLDCO LIMITED
G06F3/0414G06F3/045H03K17/9647
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,455,052
App. No.
16/768,262
Granted
Sep 27, 2022
Kind
B2
Abstract

An apparatus for detecting a mechanical interaction has a plurality of scan lines and a plurality of output lines. An intersection between each scan line and output line provides a connection to a plurality of sensing elements. Each of the sensing elements comprises a variable resistance element and a voltage amplifier. The apparatus includes an output processor which determines a voltage output in parallel at each output line from the plurality of sensing elements on activation of one of the scan lines from a driving processor.

Claims (24)

1. Apparatus for detecting a mechanical interaction, comprising:

a plurality of scan lines and a plurality of output lines;

each output line of said plurality of output lines intersecting with at least one scan line of said plurality of scan lines to form an intersection, each said intersection providing a connection to a sensing element;

each said sensing element comprising a variable resistance element responsive to said mechanical interaction, a first transistor, and a second transistor; and

an output processor configured to determine a voltage output in parallel at each said output line from said plurality of sensing elements on activation of one said scan line from a driving processor; wherein:

said first transistor is arranged in series with said second transistor to act as a voltage amplifier and said first transistor and said second transistor are both arranged in series with said variable resistance element to allow a flow of current through said variable resistance element to be blocked such that an output voltage from an activated sensing element is amplified; and

said driving processor is configured to activate each said scan line sequentially.

2. Apparatus according to claim 1 , wherein said first transistor has a width to length ratio which is the same as a width to length ratio of said second transistor.

3. Apparatus according to claim 1 , wherein said first transistor and said second transistor are both n-type transistors or said first transistor and said second transistor are both p-type transistors, and further wherein, said first transistor has a width to length ratio which is larger than a width to length ratio of said second transistor.

4. Apparatus according to claim 1 , wherein said first transistor is arranged such that a source of said first transistor is connected to a drain of said second transistor via said variable resistance element.

5. Apparatus according to claim 1 , wherein a gate of said first transistor and a gate of said second transistor are configured to receive an input voltage applied to a corresponding scan line of said plurality of scan lines.

6. Apparatus according to claim 5 , wherein said input voltage is configured to activate said first transistor, said second transistor, and said variable resistance element.

7. Apparatus according to claim 1 , wherein said variable resistance element comprises a pressure sensitive material which, under an applied pressure, the resistance in said pressure sensitive material varies.

8. Apparatus according to claim 7 , wherein said pressure sensitive material is a quantum tunneling material.

9. Apparatus according to claim 1 , wherein said plurality of sensing elements comprises a first plurality of sensing elements having a first sensitivity and a second plurality of sensing elements having a second sensitivity.

10. A method of detecting a mechanical interaction in a sensing array, comprising the steps of:

activating a scan line in said sensing array comprising a plurality of scan lines, a plurality of output lines, and a plurality of sensing elements comprising a variable resistance element responsive to said mechanical interaction, a first transistor, and a second transistor;

applying an input voltage to said plurality of scan lines;

determining an output voltage in parallel at each output line of said plurality of output lines from said plurality of sensing elements;

blocking a flow of current though each said variable resistive element by means of said first transistor and said second transistor, said first transistor arranged in series with said second transistor and said first transistor and said second transistor both arranged in series with said variable resistive element, when said corresponding scan line is inactivated such that an output voltage from an activated sensing element is amplified; and

activating said scan line sequentially when activating said plurality of scan lines.

11. A method according to claim 10 , wherein said step of applying an input voltage comprises activating at least one said first transistor or said second transistor to provide said output voltage.

12. A method according to claim 10 , wherein said step of applying an input voltage activates said first transistor, said second transistor, and said variable resistance element of the activated scan line.

13. A method according to claim 10 , wherein said output voltage is provided from at least one sensing element of said plurality of sensing elements by means of said mechanical interaction in said sensing array.

Assignments (4)
LIEN Recorded Oct 28, 2024
From: PERATECH IP LTD.; PERATECH HOLDCO LTD.
To: DARK MATTER LEND CO LTD.
Reel/Frame 069272/0745 →
LICENSE Recorded Oct 28, 2024
From: PERATECH IP LTD.
To: PERATECH HOLDCO LTD.
Reel/Frame 069444/0115 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 5, 2024
From: PERATECH HOLDCO LTD.
To: PERATECH IP LTD
Reel/Frame 068840/0351 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 29, 2020
From: AFENTAKIS, THEMISTOKLIS
To: PERATECH HOLDCO LIMITED
Reel/Frame 052787/0991 →
Priority Claims (1)
GB 1719836 · Nov 29, 2017 · national
Continuity (1)
Related Publication 20200371633A1 · Nov 26, 2020