Method for gauging surfaces with classification of measurements as valid or non-valid

1. A method for measuring a surface, the method comprising:

generating a laser beam;

emitting the laser beam onto the surface;

receiving at least a part of the laser beam, reflected by a respective point of the surface;

generating an interferogram by superposition of the received laser beam with a reference laser beam for measuring a distance to a respective point based on a respective interferogram; and

classifying the respective interferogram or a measured distance derived therefrom as non-valid or valid based on an evaluation of a phase change or an amplitude change of the respective interferogram.

2. The method according to claim 1 , wherein the measured distance is classified as non-valid if the result of the evaluation is above one or more defined thresholds.

3. The method according to claim 1 , wherein the evaluation comprises searching for a disturbance of the phase or the amplitude of the respective interferogram.

4. The method according to claim 1 , wherein the evaluation comprises determining a degree of fluctuation of the phase or amplitude of the respective interferogram.

5. The method according to claim 1 , wherein the evaluation comprises comparing a phase chart or amplitude chart of the interferogram with an ideal phase chart or amplitude chart.

6. The method according to claim 1 , wherein the evaluation comprises:

calculating the phase of the respective interferogram,

fitting a linear function through the phase,

subtracting the linear function from the phase,

calculating a Standard Deviation of a result of the subtracting the linear function from the phase,

classifying the measured distance based on the Standard Deviation.

7. The method according to claim 1 , wherein the evaluation comprises detecting if the amplitude of the respective interferogram is temporarily below an amplitude threshold.

8. The method according to claim 7 , wherein the measured distance is classified as non-valid if an interferogram fraction with an amplitude below the amplitude threshold is above a fraction threshold.

9. The method according to claim 1 , further comprising:

calculating the distance to the point by applying an amplitude based weighting factor for phase information of the respective interferogram which has been classified as valid.

10. The method according to claim 9 , wherein the weighting factor:

is directly dependent on the amplitude, or

is set as zero if the amplitude is below an amplitude threshold.

11. The method according to claim 9 , wherein the measured distance which has been classified as non-valid is tagged and stored as non-valid or deleted in real-time during the classification.

12. The method according to claim 1 , wherein the classification serves for sorting out or tagging of measurements disturbed by occurrence of laser light speckles.

13. The method according to claim 1 , further comprising:

generating a profile of the measured surface wherein a non-valid interferogram:

is excluded from the profile, or

are graphically marked.

14. A non-transitory computer program product, comprising program code which is stored on a machine-readable medium of an interferometric measuring device and carries out the method of claim 1 .

15. An interferometric measuring device designed for measuring a surface, the device comprising:

a laser for generating a laser beam;

a drive for guiding a laser beam emitting measurement head above the surface such that the laser beam scans the surface point-by-point;

a receiver for receiving at least part of the laser beam reflected by a respective point of the surface;

an interferometer for generating an interferogram by superposition of the received laser beam with a reference laser beam;

a signal processor for measuring a distance to a respective point based on a respective interferogram and classifying the respective interferogram or the measured distance derived therefrom as non-valid or valid based on an evaluation of a phase change or an amplitude change of the respective interferogram.