IP Library Patent Application 16794573
Patent Application
App. No. 16/794,573

EVENT SENSORS WITH FLICKER ANALYSIS CIRCUITRY

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Quick Facts
Patent No.
US None
App. No.
16/794,573
Abstract

An imaging system may include an event sensor with event sensor pixels. The event sensor pixels may be configured to trigger an “event” if the intensity of light at a pixel changes. Pulse-width modulated light-emitting diode (LED) lighting can cause the image from an event sensor to undulate frame to frame. This may result in false positives when detecting events (because the LED flickering triggers events for the event sensor even though the scene is unchanging to a human viewer). Therefore, the imaging system may include flicker analysis circuitry that is configured to receive light intensity signals from an event sensor pixel. Based on the light intensity signals and the times associated with changes in the light intensity signals, the flicker analysis circuitry may determine an average brightness associated with the LED.

Claims (35)

1 . A system comprising:

an event sensor pixel that is exposed to flickering light from a light-emitting diode, wherein the event sensor pixel is configured to output a light intensity signal; and

flicker analysis circuitry that is configured to receive the light intensity signal from the event sensor pixel and output an average brightness value that removes light intensity undulations caused by the flickering light from the light-emitting diode.

2 . The system defined in claim 1 , further comprising:

event detection circuitry that is configured to identify events based on the light intensity signal from the event sensor pixel.

3 . The system defined in claim 2 , wherein the event detection circuitry is configured to provide light intensity magnitudes associated with the events and time stamps associated with the events to the flicker analysis circuitry.

4 . The system defined in claim 2 , wherein the event detection circuitry is configured to provide light intensity magnitudes associated with the events and time stamps associated with the events to a buffer and wherein the flicker analysis circuitry is configured to receive the light intensity magnitudes and the time stamps from the buffer.

5 . The system defined in claim 1 , wherein the event sensor pixel includes a photodiode and wherein the light intensity signal is a photocurrent magnitude associated with the photodiode.

6 . The system defined in claim 1 , wherein the flicker analysis circuitry is configured to determine the average brightness value using time-averaging of the light intensity signal over one cycle of the light-emitting diode.

7 . The system defined in claim 1 , wherein the flicker analysis circuitry is integrated in the event sensor pixel.

8 . The system defined in claim 1 , wherein the flicker analysis circuitry is formed separately from the event sensor pixel.

9 . The system defined in claim 1 , wherein the event sensor pixel is part of an event sensor that includes an array of event sensor pixels and wherein each event sensor pixel has respective flicker analysis circuitry.

10 . The system defined in claim 9 , further comprising:

a frame-based image sensor formed separately from the event sensor.

11 . The system defined in claim 10 , wherein the frame-based image sensor has a higher resolution than the event sensor.

12 . The system defined in claim 11 , further comprising:

control circuitry configured to correct image data from the frame-based image sensor based on the average brightness value determined by the flicker analysis circuitry.

13 . The system defined in claim 12 , further comprising:

a display configured to display the corrected image data from the frame-based image sensor.

14 . A system that is exposed to flickering light, comprising:

an event sensor comprising a plurality of event sensor pixels that generate first image data;

a frame-based image sensor comprising a plurality of imaging pixels that generate second image data;

flicker mitigation circuitry configured to identify a pattern of the flickering light based on the first image data; and

control circuitry configured to modify the second image data to remove undulations caused by the flickering light based on the pattern of flickering light from the flicker mitigation circuitry.

15 . The system defined in claim 14 , wherein each imaging pixel of the plurality of imaging pixels accumulates charge over an integration time.

16 . The system defined in claim 14 , wherein the first image data includes light intensity signals and corresponding time stamps.

17 . The system defined in claim 14 , further comprising:

a display that is configured to display the modified second image data.

18 . A method of operating a system that includes an event sensor and flicker analysis circuitry, the method comprising:

obtaining image data using the event sensor;

detecting a flickering pattern in the image data using the flicker analysis circuitry; and

based on the detected flickering pattern, correcting the image data to produce undulation-free output.

19 . The method defined in claim 18 , wherein correcting the image data to produce undulation-free output comprises time-averaging a light intensity over the length of time of one flicker cycle.

20 . The method defined in claim 18 , wherein the system comprises an additional image sensor formed separately from the event sensor, the method comprising:

correcting additional image data from the additional image sensor based on the detected flickering pattern.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 052656, FRAME 0842 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064080/0149 →
SECURITY INTEREST Recorded May 13, 2020
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 052656/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 19, 2020
From: TORNES, JAMES
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 051857/0897 →