IP Library Patent Application 16798747
Patent Application
App. No. 16/798,747

IMAGING SENSOR PIXELS HAVING BUILT-IN GRATING

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Quick Facts
Patent No.
US None
App. No.
16/798,747
Abstract

An image sensor may include an array of image pixels that generate charge in response to light. To determine the color of the light, each image pixel may have a built-in diffusion grating and underlying photodiodes. The diffusion grating may diffract light in a wavelength-dependent manner, and the underlying photodiodes may detect a pattern of the diffracted light. Processing circuitry may store patterns corresponding to known colors. The processing circuitry may compare the detected pattern of the diffracted light to the patterns of light of the known colors, and thereby determine the color of the light through a process such as interpolating between the known patterns. This may eliminate the need for color filters in each pixel and increase the amount of detected light within each pixel. Image sensors having pixels with diffractive gratings may be used in cameras, microscopes, Raman spectrometers, and medical devices.

Claims (37)

1 . An image sensor comprising:

an array of image pixels that generate charge in response to incident light, each of the image pixels comprising:

a plurality of photodiodes,

a microlens that focuses the incident light on the plurality of photodiodes, and

a diffraction grating interposed between the plurality of photodiodes and the microlens; and

processing circuitry coupled to the array of image pixels.

2 . The image sensor defined in claim 1 wherein the diffraction grating comprises diffractive lines having a width of less than 400 nm and wherein the diffraction grating is configured to diffract the incident light in patterns that are wavelength-dependent

3 . The image sensor defined in claim 2 wherein the plurality of photodiodes comprises at least four photodiodes and wherein the at least four photodiodes are configured to detect the patterns of light diffracted by the diffraction grating.

4 . The image sensor defined in claim 3 wherein the processing circuitry comprises storage with pre-determined color diffraction patterns and wherein the processing circuitry is configured to compare the patterns of light diffracted by the diffraction grating to the pre-determined color diffraction patterns to determine a color of the incident light.

5 . The image sensor defined in claim 4 further comprising:

an antireflective coating on the microlens, wherein the antireflective coating is formed from silicon oxide and wherein the microlens has a convex shape to focus the incident light on the at least four photodiodes.

6 . The image sensor defined in claim 1 wherein the diffraction grating comprises a two-dimensional array of diffractive lines and wherein the diffractive lines are formed from silicon nitride.

7 . The image sensor defined in claim 6 wherein the plurality of diffractive lines have a density of less than 1000 lines/mm and wherein each of the diffractive lines has a width of less than 300 nm.

8 . The image sensor defined in claim 1 wherein the diffraction grating comprises a three-dimensional array of three-dimensional objects, and wherein the spacing of the three-dimensional objects is varied across the three-dimensional array in both horizontal and vertical directions.

9 . The image sensor defined in claim 1 wherein the diffraction grating has openings that are spaced apart to diffract light of different wavelengths at different angles.

10 . The image sensor defined in claim 9 wherein the diffraction grating comprises diffraction structures selected from the group of structures consisting of: wires and three-dimensional objects.

11 . The image sensor defined in claim 9 wherein the diffraction grating is configured to diffract blue light at a greater angle than red light and green light.

12 . A method of operating an image sensor having pixels with diffusion gratings and photodiode arrays, the method comprising:

applying light of one or more known colors to the pixels;

determining a diffraction pattern of the light of each of the one or more known colors using processing circuitry;

storing the diffraction pattern for each color in the processing circuitry;

exposing the image sensor to light of unknown colors;

determining a diffraction pattern of the light of the unknown colors using the processing circuitry;

comparing the diffraction pattern of the light of the unknown colors to the diffraction pattern of the light of the one or more known colors; and

determining the unknown colors of the light.

13 . The method defined in claim 12 wherein applying the light of the one or more known colors comprises applying colors selected from the group consisting of: red, green, blue, cyan, magenta, yellow, and white.

14 . The method defined in claim 13 wherein determining the unknown colors of the light comprises interpolating between the patterns of the light of the one or more known colors.

15 . The method defined in claim 14 wherein comparing the diffraction pattern of the light of the unknown colors to diffraction pattern of the light of the one or more known colors comprises comparing the patterns at multiple locations across the photodiode arrays.

16 . The method defined in claim 14 wherein comparing the diffraction pattern of the light of the unknown colors to diffraction pattern of the light of the one or more known colors comprises comparing sums of the diffraction patterns.

17 . An imaging apparatus comprising:

an array of image pixels that generate charge in response to incident light, each of the image pixels comprising:

a diffractive grating that is configured to diffract the incident light in a wavelength-dependent manner, and

a plurality of photodiodes that are configured to detect a pattern of the diffracted light; and

processing circuitry coupled to the array of image pixels that is configured to compare the pattern of the diffracted light to stored patterns of known light to determine the color of the diffracted light.

18 . The imaging apparatus defined in claim 17 wherein the apparatus is a Raman spectrometer and the incident light comprises laser light that illuminates a sample prior to the incident light reaching the array of image pixels.

19 . The imaging apparatus defined in claim 17 wherein the apparatus is a hyperspectral microscope and wherein the diffractive grating is formed from metal lines having a density of more than 1000 lines/mm and a width of less than 300 nm.

20 . The imaging apparatus defined in claim 19 wherein the incident light is configured to illuminate a sample on a cover glass prior to reaching the array of pixels and wherein the diffractive grating is configured to polarize the incident light.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 052656, FRAME 0842 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064080/0149 →
SECURITY INTEREST Recorded May 13, 2020
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 052656/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2020
From: LENCHENKOV, VICTOR
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 051900/0854 →