High refractive index gratings for waveguide displays manufactured by self-aligned stacked process
A manufacturing system for fabricating self-aligned grating elements with a variable refractive index includes a patterning system, a deposition system, and an etching system. The manufacturing system performs a lithographic patterning of one or more photoresists to create a stack over a substrate. The manufacturing system performs a conformal deposition of a protective coating on the stack. The manufacturing system performs a deposition of a first photoresist of a first refractive index on the protective coating. The manufacturing system performs a removal of the first photoresist to achieve a threshold value of first thickness. The manufacturing system performs a deposition of a second photoresist of a second refractive index on the first photoresist. The second refractive index is greater than the first refractive index. The manufacturing system performs a removal of the second photoresist to achieve a threshold value of second thickness to form a portion of an optical grating.
1. A manufacturing system, comprising:
a patterning system configured to perform a lithographic patterning of one or more photoresists to create a stack over a substrate;
a first deposition system configured to perform a conformal deposition of a protective coating on the stack;
a second deposition system configured to perform a deposition of a first photoresist of a first refractive index on the protective coating; and
an etching system configured to perform a removal of the first photoresist to achieve a threshold value of first thickness, wherein
the second deposition system is further configured to perform a deposition of a second photoresist of a second refractive index on the first photoresist, the second refractive index greater than the first refractive index, and
the etching system is further configured to perform a removal of the second photoresist to achieve a threshold value of second thickness to form a portion of an optical grating from the stack created over the substrate.
2. The manufacturing system of claim 1 , wherein the stack comprises a first material and a second material deposited over the first material, the second material with a refractive index greater than the first material by a threshold value.
3. The manufacturing system of claim 1 , wherein the stack comprises a hard mask deposited over the one or more photoresists.
4. The manufacturing system of claim 1 , wherein the optical grating is a sub-wavelength 3D structure created using a single lithographic exposure.
5. The manufacturing system of claim 1 , wherein:
the second deposition system is further configured to perform a deposition of a third photoresist of a third refractive index on the second photoresist, the third refractive index different from the first refractive index and the second refractive index; and
the etching system is further configured to perform a removal of the third photoresist to achieve a threshold value of third thickness to form the optical grating.
6. The manufacturing system of claim 1 , wherein the etching system is further configured to perform a selective removal of a volatile photoresist in the stack.
7. The manufacturing system of claim 6 , wherein the etching system is further configured to perform the selective removal of the volatile photoresist based on a thermal decomposition process.
8. The manufacturing system of claim 6 , wherein the etching system is further configured to perform the selective removal of the volatile photoresist by using a photolytic decomposition process.