IP Library Patent Application 16825726
Patent Application
App. No. 16/825,726

SENSOR FOR PHYSICAL STRUCTURE MONITORING

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Quick Facts
Patent No.
US None
App. No.
16/825,726
Abstract

A sensor capable of monitoring the condition of a physical structure is provided. The sensor may be comprised of a plurality of flexible conductive segments arranged in a geometric pattern. The sensor also includes nodes within the geometric pattern. The sensor monitors the condition of a physical structure by monitoring the electrical resistance within the flexible conductive segments. Additional secondary sensors may also be included within the geometric pattern of the sensor. A processor may use the information from the flexible conductive segments and any secondary sensors to assess the condition of the physical structure.

Claims (31)

1 . A system, comprising:

an electrically insulating substrate;

a conductive circuit coupled to the substrate, wherein the conductive circuit comprises a pattern of conductive sections coupled between nodes on the substrate; and

a processor that executes instructions to perform operations, the operations comprising: assessing electrical signals in the conductive sections of the conductive circuit.

2 . The system of claim 1 , wherein the substrate comprises flexible non-conductive material.

3 . The system of claim 1 , further comprising at least one wireless transmitter coupled to the processor.

4 . The system of claim 1 , wherein the substrate is configured to be attached to a physical structure.

5 . The system of claim 1 , wherein the conductive sections comprise a conductive polymer.

6 . The system of claim 1 , wherein the conductive circuit comprises a first conductive section and a second conductive section, wherein the first conductive section is oriented in a different direction from the second conductive section.

7 . The system of claim 1 , further comprising a battery coupled to the processor.

8 . The system of claim 1 , wherein the operations further comprise assessing one or more physical properties of a physical structure based on the electrical signals assessed in the conductive sections of the conductive circuit.

9 . The system of claim 8 , wherein the physical structure is a pipeline.

10 . The system of claim 8 , wherein the physical structure is a bridge component.

11 . The system of claim 1 , further comprising a sensor located within the conductive circuit.

12 . A sensor comprising:

a plurality of flexible conductive segments, wherein the plurality of flexible conductive segments are arranged in a geometric pattern;

a plurality of nodes disposed upon the plurality of flexible conductive segments; and

a processor configured to assess an electrical resistance within the plurality of flexible conductive segments.

13 . The sensor of claim 12 , further comprising a secondary sensor disposed within the plurality of flexible conductive segments, wherein the processor is configured to monitor the secondary sensor.

14 . The sensor of claim 13 , wherein the processor is configured to assess a condition of a physical structure using the electrical resistance assessed within the plurality of conductive segments and a monitored condition of the secondary sensor.

15 . The sensor of claim 12 , further comprising a substrate, wherein the substrate is non-conductive.

16 . The sensor of claim 12 , further comprising a protective layer, wherein the protective layer is non-conductive and configured to protect the sensor from an environment.

17 . The sensor of claim 14 , wherein the physical structure is a pipeline.

18 . The sensor of claim 14 , wherein the physical structure is a bridge component.

19 . A method of monitoring a physical structure, the method comprising:

disposing a sensor upon a physical structure, wherein the sensor comprises a plurality of flexible conductive segments arranged in a geometric pattern;

monitoring, by utilizing a processor, an electrical resistance in the plurality of conductive segments to assess a condition of the physical structure; and

reporting the condition of the physical structure using the processor.

20 . The method of claim 19 , further comprising:

disposing a secondary sensor within the plurality of flexible conductive segments arranged in the geometric pattern, wherein the secondary sensor has an output; and

further monitoring, by utilizing the processor, the condition of the physical structure based on the output of the secondary sensor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2024
From: CIPHER SKIN, INC.
To: CIPHERRX, INC.
Reel/Frame 068386/0494 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2020
From: BOGDANOVICH, PHILLIP; WELLER, CRAIG; BAHADU, SHAKA JOAQUIN DOYLE
To: CIPHER SKIN
Reel/Frame 052181/0150 →